Abstract: Provided is a grain-oriented electrical steel sheet including a base steel sheet, an intermediate layer which is disposed in contact with the base steel sheet and mainly includes silicon oxide, and an insulation coating which is disposed in contact with the intermediate layer and mainly includes phosphate and colloidal silica, in which the base steel sheet contains predetermined chemical composition, BN having an average particle size of 50 to 300 nm is present, when an emission intensity of B is measured using glow discharge emission analysis, predetermined conditions are satisfied, and a ratio of a major axis to a minor axis of BN is 1.5 or less.

Abstract: A heat exchanger includes: refrigerant channels that extend in a first direction, are disposed along a second direction intersecting with the first direction, and are disposed along a third direction intersecting with the first direction and the second direction; and heat transfer tubes defining the refrigerant channels. One or both of a size of an outer edge and a size of an inner edge of the heat transfer tubes are different between a first position and a second position in the first direction. Outer surfaces of the heat transfer tubes each include a protrusion that protrudes in a direction intersecting with the first direction, and is in contact with an outer surface of one of the heat transfer tubes adjacent thereto in the second direction. The protrusion includes a concave portion extending along the third direction.

Abstract: A bird's eye view image is displayed to be recognized by an operator intuitively and precisely, irrespective of the displayed direction of the bird's eye view image. The display device has a plurality of cameras having optical axis directed obliquely downward to take images around a self-propelled industrial machine. A view point converting section converts the camera images to an upper view point to create bird's eye images, and an image composing section creates a composite bird's eye view image by composing respective bird's eye images around a symbol image of a dump truck. A direction superposing section superposes a forward direction indicator to indicate the forward direction of the dump truck on the composite bird's eye view image, and a monitor mounted in a cab of the dump truck displays the composite bird's eye image in an arbitral direction which is composited with the forward direction indicator.

Abstract: A bird's eye view image is displayed to be recognized by an operator intuitively and precisely, irrespective of the displayed direction of the bird's eye view image. The display device has a plurality of cameras having optical axis directed obliquely downward to take images around a self-propelled industrial machine. A view point converting section converts the camera images to an upper view point to create bird's eye images, and an image composing section creates a composite bird's eye view image by composing respective bird's eye images around a symbol image of a dump truck. A direction superposing section superposes a forward direction indicator to indicate the forward direction of the dump truck on the composite bird's eye view image, and a monitor mounted in a cab of the dump truck displays the composite bird's eye image in an arbitral direction which is composited with the forward direction indicator.

Abstract: The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

Abstract: A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

Abstract: A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe (20), and a measurement unit for measuring a physical quantity between the probe and sample. The scanning probe microscope is provided with a cantilever mount (22), a cantilever cassette (30), an XY stage (14) and Z stage (15) for moving the cantilever cassette, and an optical microscope (18). In a first step, a cantilever is selected from the cantilever cassette and is mounted on the cantilever mount. In a second step, an optical microscope is moved and the mounted cantilever is set in a prescribed position in the field of view after the cantilever is mounted in the scanning probe microscope. In the second step, a step is provided for moving the optical microscope side or the cantilever side and performing positional adjustment.

Abstract: A method an apparatus for measuring the depths of many fine holes formed in the surface of a sample by etching. Positional information on a plurality of hole patterns is acquired by scanning, with a stylus, the surface of the sample in which the hole patterns are formed by etching. The depths of the plurality of hole patterns are measured by scanning, with the stylus, bottom faces of the plurality of hole patterns and the surface of the sample in the respective vicinities of the hole patterns on the basis of the positional information that has been acquired. Information on distribution of the depths of the plurality of hole patterns is displayed on a screen on the basis of information on the measured depths of the plurality of hole patterns and the positional information on each of the hole patterns.

Abstract: The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

Abstract: The invention relates to a method and an apparatus for measuring the depths of many fine holes formed in the surface of a sample by etching. Positional information on a plurality of hole patterns is acquired by scanning with a stylus the surface of the sample in which the hole patterns are formed by etching, the depths of the plurality of hole patterns are measured by scanning with the stylus bottom faces of the plurality of hole patterns and the surface of the sample in the respective vicinities of the hole patterns on the basis of the positional information, and information on distribution of the depths of the plurality of hole patterns is displayed on a screen on the basis of information on the measured depths of the plurality of hole patterns and the positional information on each of the hole patterns.

Abstract: A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

Abstract: An automatically operated shovel, which includes a power shovel and an automatic operation controller 50 for making the power shovel reproduce a series of taught operations ranging from digging to dumping, is characterized in that the automatic operation controller is provided with a positioning determinator for determining whether or not the power shovel has reached within a taught position range predetermined based on corresponding one of positioning accuracies set for individual taught positions of said power shovel, and, when the power shovel is determined to have reached within the predetermined taught position range, the automatic operation controller outputs a next taught position as a target position.

Abstract: An automatically operated shovel, which includes a power shovel and an automatic operation controller 50 for making the power shovel reproduce a series of taught operations ranging from digging to dumping, is characterized in that the automatic operation controller is provided with a positioning determination means 511 for determining whether or not the power shovel has reached within a taught position range predetermined based on corresponding one of positioning accuracies set for individual taught positions of said power shovel, and, when the power shovel is determined to have reached within the predetermined taught position range, the automatic operation controller outputs a next taught position as a target position.

Abstract: An automatically operated shovel, which includes a power shovel and an automatic operation controller 50 for making the power shovel reproduce a series of taught operations ranging from digging to dumping, is characterized in that the automatic operation controller is provided with a positioning determination means 511 for determining whether or not the power shovel has reached within a taught position range predetermined based on corresponding one of positioning accuracies set for individual taught positions of said power shovel, and, when the power shovel is determined to have reached within the predetermined taught position range, the automatic operation controller outputs a next taught position as a target position.

Abstract: An automatically operated shovel has a shovel and an automatic operation controller arranged on the shovel to store by a teaching operation plural working positions of the shovel, which comprises at least a digging position, and also to cause by a reproduction operation the shovel to repeatedly perform a series of reproduction operations on the basis of the stored plural working positions. The automatic operation controller is provided with servo control means for outputting, as a servo control quantity, a sum of a compliance control quantity and a pressure control quantity. The compliance control quantity is obtained by multiplying with a stiffness gain a difference between a target position of each operational element of the shovel, the target position comprising angle information indicative of an operational target of the operational element, and a current position of the operational element, the current position comprising current angle information on the operational element.