Patents by Inventor Yosuke OKAZAKI

Yosuke OKAZAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device, semiconductor system, and control method of semiconductor device
    Patent number: 10884035
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: January 5, 2021
    Assignee: Renesas Electronics Corporation
    Inventors: Kazuki Fukuoka, Toshifumi Uemura, Yuko Kitaji, Yosuke Okazaki, Akira Murayama
  • SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF SEMICONDUCTOR DEVICE
    Publication number: 20200041547
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Application
    Filed: October 8, 2019
    Publication date: February 6, 2020
    Inventors: Kazuki FUKUOKA, Toshifumi UEMURA, Yuko KITAJI, Yosuke OKAZAKI, Akira MURAYAMA
  • Semiconductor device, semiconductor system, and control method of semiconductor device to monitor a power supply voltage
    Patent number: 10481185
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: November 19, 2019
    Assignee: RENESAS ELECTRONICS CORPORATION
    Inventors: Kazuki Fukuoka, Toshifumi Uemura, Yuko Kitaji, Yosuke Okazaki, Akira Murayama
  • SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF SEMICONDUCTOR DEVICE
    Publication number: 20180095115
    Abstract: An object of the present invention is to provide a semiconductor device, a semiconductor system, and a control method of a semiconductor device capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Application
    Filed: September 14, 2017
    Publication date: April 5, 2018
    Inventors: Kazuki FUKUOKA, Toshifumi UEMURA, Yuko KITAJI, Yosuke OKAZAKI, Akira MURAYAMA