Patents by Inventor Yosuke Okitsu

Yosuke Okitsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7362148
    Abstract: A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor element is electrically separated from a power source or a ground by turning off another semiconductor element. Therefore, no electric current flows from the power source to the control terminal or from the control terminal to the ground. Therefore, the leak current of the load drive semiconductor element can be easily measured, even after the load drive semiconductor element is electrically connected to the control device for fabricating one-packaged IC.
    Type: Grant
    Filed: November 17, 2005
    Date of Patent: April 22, 2008
    Assignee: DENSO CORPORATION
    Inventor: Yosuke Okitsu
  • Patent number: 7173350
    Abstract: In a load drive control system containing a control apparatus and a drive apparatus which drives a load in accordance with a drive control signal supplied from the control apparatus, a single signal produced from the control apparatus serves both as the drive control signal and as a power supply enabling control signal for the drive apparatus, without the need to provide an internal DC power supply in the drive apparatus. A switching element in the drive apparatus is controlled to apply a supply voltage from a drive power source to circuits in the drive apparatus only while the drive control signal is being supplied from the control apparatus.
    Type: Grant
    Filed: June 27, 2003
    Date of Patent: February 6, 2007
    Assignee: Denso Corporation
    Inventors: Yosuke Okitsu, Junji Sugiura
  • Publication number: 20060109034
    Abstract: A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor element is electrically separated from a power source or a ground by turning off another semiconductor element. Therefore, no electric current flows from the power source to the control terminal or from the control terminal to the ground. Therefore, the leak current of the load drive semiconductor element can be easily measured, even after the load drive semiconductor element is electrically connected to the control device for fabricating one-packaged IC.
    Type: Application
    Filed: November 17, 2005
    Publication date: May 25, 2006
    Applicant: DENSO CORPORATION
    Inventor: Yosuke Okitsu
  • Publication number: 20040001301
    Abstract: In a load drive control system containing a control apparatus and a drive apparatus which drives a load in accordance with a drive control signal supplied from the control apparatus, a single signal produced from the control apparatus serves both as the drive control signal and as a power supply enabling control signal for the drive apparatus, without the need to provide an internal DC power supply in the drive apparatus. A switching element in the drive apparatus is controlled to apply a supply voltage from a drive power source to circuits in the drive apparatus only while the drive control signal is being supplied from the control apparatus.
    Type: Application
    Filed: June 27, 2003
    Publication date: January 1, 2004
    Inventors: Yosuke Okitsu, Junji Sugiura