Patents by Inventor Yosuke Tajika

Yosuke Tajika has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11782420
    Abstract: Provided is a product manufacturing system including: a manufacture control apparatus configured to hold manufacturing data on a product; a virtual manufacturing apparatus configured to virtually manufacture the product by simulation, based on the manufacturing data on the product in the manufacture control apparatus; a physical manufacturing apparatus configured to physically manufacture the product based on the manufacturing data in the manufacture control apparatus; an abnormality determination unit configured to determine whether there is an abnormality in the virtual manufacture of the product by the virtual manufacturing apparatus. When it is determined there is no abnormality from the virtual manufacture of the product, the physical manufacturing apparatus physically manufactures the product.
    Type: Grant
    Filed: December 8, 2021
    Date of Patent: October 10, 2023
    Assignee: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Hiroshi Amano, Yosuke Tajika
  • Patent number: 11698630
    Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold valu
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: July 11, 2023
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroshi Amano, Narumi Atsuta, Noriaki Hamada, Yosuke Tajika, Nobutaka Kawaguchi, Yuichi Higuchi, Taichi Shimizu
  • Publication number: 20230083876
    Abstract: A data analysis device, for analyzing efficiency of an assembly line operation including processes, includes: an input interface configured to acquire log data indicating a history of the processes respectively performed for each time of the assembly line operation; and a control circuit configured to generate analysis information indicating an analysis result of the history indicated by the log data, based on information generated by a probability model to calculate probability distribution for the assembly line operation.
    Type: Application
    Filed: November 19, 2022
    Publication date: March 16, 2023
    Inventors: Yoshiyuki OKIMOTO, Daijiroh ICHIMURA, Akira MINEGISHI, Yosuke TAJIKA
  • Patent number: 11526158
    Abstract: A display device that displays productivity of a manufacturing facility that performs processes to manufacture products, wherein the manufacturing facility includes constituent element groups, each including constituent elements, constituent elements selected from the constituent element groups perform a corresponding one of the processes. The display device includes: an obtainer that obtains manufacturing log information from the manufacturing facility; a calculator that calculates an indicator showing productivity of each combination of a first constituent element and a second constituent element, based on the manufacturing log information; and a display that displays the indicator showing the productivity of each combination at a position of an intersection point corresponding to the combination on a productivity indicator map including a vertical axis along which first constituent elements are arranged and a horizontal axis along which second constituent elements are arranged.
    Type: Grant
    Filed: July 10, 2018
    Date of Patent: December 13, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yuichi Higuchi, Hiroshi Amano, Yosuke Tajika, Taichi Shimizu
  • Publication number: 20220300883
    Abstract: A quality estimation device for generating information on quality with which a plurality of unit products are obtained by using a plurality of facilities to pass at least one step, includes: a memory that stores quality control data associating the facilities passed for each of the unit products in the step when the unit products are obtained, with quality for the obtained unit products; and a circuit that controls calculation processing based on the quality control data stored in the memory. The circuit extracts a plurality of pass records from the quality control data, the plurality of pass records each indicating a series of facilities passed by a unit product in the plurality of unit products and quality for the unit product, and generates facility quality information indicating quality with respect to a facility in the plurality of facilities by the calculation processing, based on the extracted pass records.
    Type: Application
    Filed: June 12, 2022
    Publication date: September 22, 2022
    Inventors: Daijiroh ICHIMURA, Yoshiyuki OKIMOTO, Hidehiko SHIN, Akira MINEGISHI, Yosuke TAJIKA
  • Patent number: 11448570
    Abstract: One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: September 20, 2022
    Assignees: Palo Alto Research Center Incorporated, Panasonic Holdings Corporation
    Inventors: Deokwoo Jung, Fangzhou Cheng, Ajay Raghavan, Yukinori Sasaki, Akira Minegishi, Tetsuyoshi Ogura, Yosuke Tajika
  • Patent number: 11431173
    Abstract: Power demand control is performed without a decrease in productivity. A device for performing electric power demand control includes: a processor; and a storage medium including an instruction for causing the processor to obtain a sum of energy consumption of a plurality of manufacturing devices, obtain a production capacity from production information on each manufacturing device, and perform electric power demand control on a manufacturing system based on the production capacity and the sum of energy consumption. To perform electric power control includes determining that electric power demand control is necessary if the sum of energy consumption reaches a predetermined threshold and excluding one of the manufacturing devices having a smallest production capacity from a target of electric power demand control.
    Type: Grant
    Filed: June 25, 2018
    Date of Patent: August 30, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yuichi Higuchi, Hiroshi Amano, Yosuke Tajika, Taichi Shimizu
  • Patent number: 11307567
    Abstract: A management device for managing a component mounter that mounts components onto a substrate using some of constituent elements each selected from one of constituent element groups each including the constituent elements. One group is a nozzle group including nozzles. The device includes: a true displacement amount calculator that calculates, for each target component which is the component, a true amount of displacement which is a sum of (i) an amount of pickup displacement being an amount of displacement between the target component and a target nozzle being one of the nozzles and picks up the target component and (ii) an amount of correction being an amount of offset of a position of the target nozzle when picking up the target component; and a statistical processor that performs parameter estimation for a predetermined statistical model using the true amount to calculate a degree of malfunction of each constituent element.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: April 19, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Taichi Shimizu, Yosuke Tajika, Hiroshi Amano, Yuichi Higuchi
  • Publication number: 20220100179
    Abstract: Provided is a product manufacturing system including: a manufacture control apparatus configured to hold manufacturing data on a product; a virtual manufacturing apparatus configured to virtually manufacture the product by simulation, based on the manufacturing data on the product in the manufacture control apparatus; a physical manufacturing apparatus configured to physically manufacture the product based on the manufacturing data in the manufacture control apparatus; an abnormality determination unit configured to determine whether there is an abnormality in the virtual manufacture of the product by the virtual manufacturing apparatus. When it is determined there is no abnormality from the virtual manufacture of the product, the physical manufacturing apparatus physically manufactures the product.
    Type: Application
    Filed: December 8, 2021
    Publication date: March 31, 2022
    Inventors: Hiroshi AMANO, Yosuke TAJIKA
  • Patent number: 11252179
    Abstract: A risk analyzer analyzing risk of a system including N (natural number greater than or equal to 2) elements connected includes: an inputter receiving, as inputs, a cost of each N element for increasing a safety degree against a threat to security, a connection relationship of at least part of the N elements, an entry point being an element serving as an entry to the system, and a defense target being an element protected in the system; an identifier identifying, based on the cost of each N element and the connection relationship, a target element of one or more elements requiring a minimum total cost necessary for cutting off a target path from the entry point to the defense target by increasing a safety degree of one or more elements on the target path to a threshold value or more; and an outputter outputting element information indicating the target element.
    Type: Grant
    Filed: September 3, 2021
    Date of Patent: February 15, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroshi Amano, Yusuke Nemoto, Minehisa Nagata, Yosuke Tajika
  • Patent number: 11226612
    Abstract: Provided is a product manufacturing system including: a manufacture control apparatus configured to hold manufacturing data on a product; a virtual manufacturing apparatus configured to virtually manufacture the product by simulation, based on the manufacturing data on the product in the manufacture control apparatus; a physical manufacturing apparatus configured to physically manufacture the product based on the manufacturing data in the manufacture control apparatus; an abnormality determination unit configured to determine whether there is an abnormality in the virtual manufacture of the product by the virtual manufacturing apparatus. When it is determined there is no abnormality from the virtual manufacture of the product, the physical manufacturing apparatus physically manufactures the product.
    Type: Grant
    Filed: October 20, 2017
    Date of Patent: January 18, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroshi Amano, Yosuke Tajika
  • Publication number: 20210397702
    Abstract: A risk analyzer analyzing a risk of a system including N (natural number greater than or equal to 2) elements connected includes: an inputter receiving, as inputs, a degree of safety of each N element against a threat to security, a connection relationship of the N elements, an entry point being an element serving as an entry to the system, and a defense target being an element protected in the system; an identifier identifying, among one or more paths from the entry point to the defense target, based on the degrees of safety and the connection relationship of the N elements, a target path in which a total sum of the degrees of safety of elements passed while the target path extends from the entry point to the defense target is lower than a threshold value; and an outputter outputting path information on the target path.
    Type: Application
    Filed: September 3, 2021
    Publication date: December 23, 2021
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Hiroshi AMANO, Yusuke NEMOTO, Minehisa NAGATA, Yosuke TAJIKA
  • Publication number: 20210400079
    Abstract: A risk analyzer analyzing risk of a system including N (natural number greater than or equal to 2) elements connected includes: an inputter receiving, as inputs, a cost of each N element for increasing a safety degree against a threat to security, a connection relationship of at least part of the N elements, an entry point being an element serving as an entry to the system, and a defense target being an element protected in the system; an identifier identifying, based on the cost of each N element and the connection relationship, a target element of one or more elements requiring a minimum total cost necessary for cutting off a target path from the entry point to the defense target by increasing a safety degree of one or more elements on the target path to a threshold value or more; and an outputter outputting element information indicating the target element.
    Type: Application
    Filed: September 3, 2021
    Publication date: December 23, 2021
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Hiroshi AMANO, Yusuke NEMOTO, Minehisa NAGATA, Yosuke TAJIKA
  • Publication number: 20210264026
    Abstract: An unauthorized communication detection device that detects unauthorized communication in a manufacturing system that manufactures products includes: an obtainer that obtains operation information of the manufacturing system; a storage that stores element information indicating one or more target elements among a plurality of elements related to manufacturing of the products; a specifier that specifies, for each of a plurality of communications performed in the manufacturing system, an element corresponding to the communication, based on the operation information; a calculator that calculates an abnormal degree of each of one or more communications, which satisfy that the element specified by the specifier is included in the one or more target elements indicated by the element information, among the plurality of communications; and a determiner that determines that, when an abnormal degree calculated by the calculator is larger than a threshold value, a communication corresponding to the abnormal degree is th
    Type: Application
    Filed: June 7, 2019
    Publication date: August 26, 2021
    Inventors: Hiroshi AMANO, Narumi ATSUTA, Noriaki HAMADA, Yosuke TAJIKA, Nobutaka KAWAGUCHI, Yuichi HIGUCHI, Taichi SHIMIZU
  • Patent number: 11061915
    Abstract: One embodiment provides a system for facilitating anomaly detection and characterization. During operation, the system determines, by a computing device, a first set of testing data which includes a plurality of data points, wherein the first set includes a data series for a first variable and one or more second variables. The system identifies anomalies by dividing the first set into a number of groups and performing an inter-quartile range analysis on data in each respective group. The system obtains, from the first set, a second set of testing data which includes a data series from a recent time period occurring before a current time, and which further includes a first data point from the identified anomalies. The system classifies the first data point as a first type of anomaly based on whether a magnitude of a derivative of the second set is greater than a first predetermined threshold.
    Type: Grant
    Filed: October 25, 2018
    Date of Patent: July 13, 2021
    Assignees: Palo Alto Research Center Incorporated, Panasonic Corporation
    Inventors: Jungho Park, Ajay Raghavan, Ryan A. Rossi, Yosuke Tajika, Akira Minegishi, Tetsuyoshi Ogura
  • Publication number: 20210208578
    Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold valu
    Type: Application
    Filed: June 7, 2019
    Publication date: July 8, 2021
    Inventors: Hiroshi AMANO, Narumi ATSUTA, Noriaki HAMADA, Yosuke TAJIKA, Nobutaka KAWAGUCHI, Yuichi HIGUCHI, Taichi SHIMIZU
  • Patent number: 10986115
    Abstract: An abnormality in a manufacturing system is detected without extensive modification to the existing manufacturing systems. The data analysis device includes: a receiver configured to receive a packet transmitted between a manufacture control device and a manufacturing device; an analyzer configured to obtain the type of data included in a payload of the received packet from an IP address and a port number included in a header of the packet; a selector configured to select, based on the type of the data obtained by the analyzer, a syntax or rule corresponding to the type of the data; and a determiner configured to determine that the manufacturing system has an abnormality if the data included in the payload does not follow the syntax or rule corresponding to the type of the data.
    Type: Grant
    Filed: September 24, 2019
    Date of Patent: April 20, 2021
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroshi Amano, Yosuke Tajika, Yuichi Higuchi
  • Publication number: 20200401122
    Abstract: A management device for managing a component mounter that mounts components onto a substrate using some of constituent elements each selected from one of constituent element groups each including the constituent elements. One group is a nozzle group including nozzles. The device includes: a true displacement amount calculator that calculates, for each target component which is the component, a true amount of displacement which is a sum of (i) an amount of pickup displacement being an amount of displacement between the target component and a target nozzle being one of the nozzles and picks up the target component and (ii) an amount of correction being an amount of offset of a position of the target nozzle when picking up the target component; and a statistical processor that performs parameter estimation for a predetermined statistical model using the true amount to calculate a degree of malfunction of each constituent element.
    Type: Application
    Filed: February 22, 2019
    Publication date: December 24, 2020
    Inventors: Taichi SHIMIZU, Yosuke TAJIKA, Hiroshi AMANO, Yuichi HIGUCHI
  • Publication number: 20200386656
    Abstract: One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.
    Type: Application
    Filed: June 4, 2019
    Publication date: December 10, 2020
    Applicants: Palo Alto Research Center Incorporated, Panasonic Corporation
    Inventors: Deokwoo Jung, Fangzhou Cheng, Ajay Raghavan, Yukinori Sasaki, Akira Minegishi, Tetsuyoshi Ogura, Yosuke Tajika
  • Publication number: 20200192339
    Abstract: A display device that displays productivity of a manufacturing facility that performs processes to manufacture products, wherein the manufacturing facility includes constituent element groups, each including constituent elements, constituent elements selected from the constituent element groups perform a corresponding one of the processes. The display device includes: an obtainer that obtains manufacturing log information from the manufacturing facility; a calculator that calculates an indicator showing productivity of each combination of a first constituent element and a second constituent element, based on the manufacturing log information; and a display that displays the indicator showing the productivity of each combination at a position of an intersection point corresponding to the combination on a productivity indicator map including a vertical axis along which first constituent elements are arranged and a horizontal axis along which second constituent elements are arranged.
    Type: Application
    Filed: July 10, 2018
    Publication date: June 18, 2020
    Inventors: Yuichi HIGUCHI, Hiroshi AMANO, Yosuke TAJIKA, Taichi SHIMIZU