Patents by Inventor Youbi KATSU

Youbi KATSU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
    Patent number: 9785542
    Abstract: A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.
    Type: Grant
    Filed: April 16, 2013
    Date of Patent: October 10, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Leon Chen, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu
  • IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENVIRONMENT USED TO COMPILE TEST PLANS FOR AUTOMATED SEMICONDUCTOR DEVICE TESTING
    Publication number: 20140310693
    Abstract: A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.
    Type: Application
    Filed: April 16, 2013
    Publication date: October 16, 2014
    Applicant: Advantest Corporation
    Inventors: Mark ELSTON, Leon CHEN, Harsanjeet SINGH, Hironori MAEDA, Ankan PRAMANICK, Youbi KATSU