Patents by Inventor Youichi Deguchi

Youichi Deguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5665166
    Abstract: Disclosed is a plasma processing apparatus, comprising a first electrode on which an object to be processed is to be disposed, a second electrode arranged to face the first electrode, a high frequency power supply for supplying a high frequency power between the first and second electrodes, a processing gas supplying mechanism for forming a plasma into a region between the first and second electrodes, and a bias potential detecting mechanism for detecting the bias potential of the first electrode. The bias detecting mechanism has a detecting terminal positioned in the vicinity of the object to be processed.
    Type: Grant
    Filed: October 23, 1996
    Date of Patent: September 9, 1997
    Assignee: Tokyo Electron Limited
    Inventors: Youichi Deguchi, Satoru Kawakami, Yoichi Ueda, Mitsuaki Komino
  • Patent number: 5591269
    Abstract: A vacuum processing apparatus includes: a processing chamber for performing a film formation process to a semiconductor wafer in a vacuum; a mounting member provided in the processing chamber and having a mounting surface for mounting a target object; an electrostatic chuck, provided to the mounting surface of the mounting member, for chucking the semiconductor wafer; a heating mechanism for heating the semiconductor wafer; and a processing gas supply mechanism for supplying a processing gas for performing the film formation process to the semiconductor wafer into the processing chamber.
    Type: Grant
    Filed: June 23, 1994
    Date of Patent: January 7, 1997
    Assignees: Tokyo Electron Limited, Tokyo Electron Tohoku Limited
    Inventors: Junichi Arami, Kenji Ishikawa, Youichi Deguchi, Hironori Yagi, Nobuo Kawada, Isao Yanagisawa
  • Patent number: 5478429
    Abstract: The present invention provides a plasma process apparatus wherein RF power is applied to a process gas, thereby to convert the gas into plasma for processing an object, the apparatus having a process chamber, an upper electrode located in the process chamber and having a gas-supplying section for supplying a process gas, a lower electrode located in the process chamber, having a cooling means, and opposing the upper electrode, for supporting an object, and RF power supplying means electrically connected to the lower electrode, protruding from the process chamber and connected to a RF power supply, for supplying RF power between the upper and lower electrodes, wherein the RF power supplying means includes, an outer conductive pipe surrounding the inner conductive rod and spaced therefrom, and a fixing member inserted between the inner conductive rod and the outer conductive pipe and having concaves and convexes, the inner conductive rod and the outer conductive pipe being electrically connected to an RF power
    Type: Grant
    Filed: January 19, 1994
    Date of Patent: December 26, 1995
    Assignee: Tokyo Electron Limited
    Inventors: Mitsuaki Komino, Yoichi Ueda, Youichi Deguchi, Satoru Kawakami