Patents by Inventor Young Cheul Lee

Young Cheul Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200199261
    Abstract: Provided is an oxime ester phenylcarbazole compound useful as a photoinitiator for photocrosslinking. Specifically, the carbon atom forming a double bond with the nitrogen atom in the oxime ester moiety of the oxime ester phenylcarbazole compound is bonded to the phenylcarbazole group and is directly bonded to a (C1-C20)alkyl or (C6-C20)aryl group. Also provided is a photopolymerizable composition including the oxime ester phenylcarbazole compound. The oxime ester phenylcarbazole compound and the photopolymerizable composition have improved solubilities, are highly photosensitive, and exhibit excellent physical properties in terms of residual film ratio, pattern stability, resist adhesiveness. Due to these advantages, the oxime ester phenylcarbazole compound and the photopolymerizable composition are suitable for use in black resists, color resists, overcoats, column spacers, and organic insulating films of LCDs.
    Type: Application
    Filed: July 5, 2017
    Publication date: June 25, 2020
    Applicants: Korea Research Institute of Chemical Technology, TAKOMA TECHNOLOGY CO., LTD.
    Inventors: Chang Jin LEE, Jae Min LEE, Shahid AMEEN, Song Yun CHO, Sung Cheol YOON, Young Cheul LEE, Mi Sun RYU, Bok Joo SONG, Keun Soo KIM, So Youn NAM
  • Patent number: 8805567
    Abstract: A method of controlling process distribution of a semiconductor process includes receiving process distribution data representing the process distribution of the semiconductor process, receiving a parameter related to the process distribution, generating a virtual metrology model corresponding to the process distribution based on a relationship between the process distribution data and the parameter, and modifying a process variable affecting the process distribution based on the virtual metrology model.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: August 12, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ho-ki Lee, Kye-hyun Baek, Young-cheul Lee, Gyung-jin Min
  • Publication number: 20080069668
    Abstract: A semiconductor manufacturing apparatus includes a chamber having a plurality of stages, on each of which a wafer is placed, separately arranged therein, a common pumping line coupled to the chamber and connected to an area of each of the stages and forming a common passage of air that is pumped out from the areas of the stages, and a divider coupled to at least one of the chamber and the common pumping line and dividing the air being pumped to allow the air to be independently pumped from the respective areas of the stages. Thus, the generation of a process error because the RF reflected power is not stable due to the imbalance in pressure between a plurality of stages in a single chamber can be prevented.
    Type: Application
    Filed: June 21, 2007
    Publication date: March 20, 2008
    Applicant: Samsung Electronics, Co., Ltd.
    Inventor: Young Cheul Lee