Patents by Inventor Young-Dong Nam

Young-Dong Nam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for testing semiconductor test system and method thereof
    Patent number: 7479793
    Abstract: A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to be defective.
    Type: Grant
    Filed: December 7, 2006
    Date of Patent: January 20, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Byung-Wook Park, Byeong-Hwan Cho, Young-Dong Nam, Bo-Yeon Kim
  • Filter characteristic measuring method and system
    Patent number: 7424406
    Abstract: Described are a filter characteristic measuring method and system capable of measuring a gain of an analog filter adapted in a DUT (Device Under Test) and a frequency response at a high speed, wherein the filter characteristic measuring method includes the steps of generating an impulse signal; applying the impulse signal to the DUT having an analog filter through a digital channel; and measuring a gain of the analog filter in the DUT and a frequency characteristic by using an output of the analog filter.
    Type: Grant
    Filed: December 15, 2003
    Date of Patent: September 9, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Young-Dong Nam
  • Apparatus for testing semiconductor test system and method thereof
    Publication number: 20070170939
    Abstract: A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to be defective.
    Type: Application
    Filed: December 7, 2006
    Publication date: July 26, 2007
    Inventors: Byung-Wook Park, Byeong-Hwan Cho, Young-Dong Nam, Bo-Yeon Kim
  • Filter characteristic measuring method and system
    Publication number: 20040143422
    Abstract: Described are a filter characteristic measuring method and system capable of measuring a gain of an analog filter adapted in a DUT (Device Under Test) and a frequency response at a high speed, wherein the filter characteristic measuring method includes the steps of generating an impulse signal; applying the impulse signal to the DUT having an analog filter through a digital channel; and measuring a gain of the analog filter in the DUT and a frequency characteristic by using an output of the analog filter.
    Type: Application
    Filed: December 15, 2003
    Publication date: July 22, 2004
    Applicant: Samsung Electronics Co. Ltd.
    Inventor: Young-Dong Nam