Patents by Inventor Young-Gil Bae

Young-Gil Bae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7456641
    Abstract: Provided are a probe card, a test apparatus having the probe card, and a test method using the test apparatus. The probe card includes a probe substrate having a signal line, a probe needle connected to the signal line and fixed to the probe substrate, and a cooling unit for cooling the temperature of the probe needle. Therefore, the probe needles contacting each chip can be maintained at a certain low temperature without increasing the temperature. As a result, it is possible to pervent deformation of the probe needles and minimize an amount of impurities stuck to the probe needles.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: November 25, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Young-Gil Bae, Soon-Jong Park, In-Su Kim
  • Publication number: 20070018664
    Abstract: Provided are a probe card, a test apparatus having the probe card, and a test method using the test apparatus. The probe card includes a probe substrate having a signal line, a probe needle connected to the signal line and fixed to the probe substrate, and a cooling unit for cooling the temperature of the probe needle. Therefore, the probe needles contacting each chip can be maintained at a certain low temperature without increasing the temperature. As a result, it is possible to pervent deformation of the probe needles and minimize an amount of impurities stuck to the probe needles.
    Type: Application
    Filed: May 15, 2006
    Publication date: January 25, 2007
    Inventors: Young-Gil Bae, Soon-Jong Park, In-Su Kim