Abstract: A sample inspection apparatus is provided. A sample inspection apparatus according to an exemplary embodiment of the present invention includes a base; a loading portion installed on the base so that a sample is placed thereon; a first light source radiating light on the sample, the sample being placed on the loading portion; a first light receiving portion located at a first position and receiving light reflected and scattered by the sample; and a support portion positioned on the loading portion so that the first light source and the first light receiving portion are movably installed on the support portion.

Abstract: An inspection system includes: an automated optical inspection device detecting a defect of an inspection object by using a light; a scanning electron microscope device for inspecting the defect of the inspection object by using an electron beam and including a vacuum chamber; a stage positioned below and spaced from the scanning electron microscope device and supporting the inspection object; and a transferring device connected to the scanning electron microscope chamber and the automated optical inspection and transferring the scanning electron microscope device and the automated optical inspection device to positions over the stage. Air is in a gap between the chamber and the inspection object. Accordingly, an inspection object of a large size may be inspected for analysis without damage to the inspection object.

Abstract: A repairing apparatus of a display device that includes: a stage where a display device is mounted; a lighting device applying a lighting signal to the display device; and a detector disposed at a distance from the display device and detecting a photon or heat generated from a defect part in a pixel of the display device. The optical microscopic, the detector, and the laser repairing device are provided in the light blocking box so that a defect part that cannot be detected by the optical microscopic can be detected using the detector, and the pixel can be repaired to a normal pixel using the laser repairing device, and accordingly the yield can be improved.

Abstract: An inspection system using a scanning electron microscope includes a scanning electron microscope chamber inspecting an object to be inspected by using an electron beam and maintaining a vacuum condition, a stage positioned below the scanning electron microscope chamber to be separated therefrom and mounted with the object to be inspected, and a transverse guide transferring the scanning electron microscope chamber on the stage. Atmospheric conditions are maintained between the scanning electron microscope chamber and the object to be inspected. Accordingly, object to be inspected a large size of an object to be inspected may be inspected without damage to the object to be inspected such that a cost reduction and a yield improvement may be realized.

Abstract: An organic light emitting diode (OLED) includes an anode, a cathode, and an organic multi-layer structure disposed between the anode and the cathode. The inner potential distribution of the organic multi-layer structure has a non-linear profile.

Abstract: An organic light emitting diode (OLED) includes an anode, a cathode, and an organic multi-layer structure disposed between the anode and the cathode. The inner potential distribution of the organic multi-layer structure has a non-linear profile.

Abstract: The present invention relates to a catalyst for a fuel cell, a method of preparing the same, and a membrane-electrode assembly for a fuel cell including the same. The catalyst includes a platinum (Pt) nanowire and a carbon-based material supporting the Pt nanowire.