Abstract: Provided is a method of forming reference information for defining a fault pattern of equipment, and monitoring equipment. One example embodiment method may include performing an angle spectrum analysis by re-classifying fault points distributed on a plane, the plane including a first component axis and a second component axis, and the re-classifying fault points including calculating an angle for each of the fault points with reference to any one of the first component axis and the second component axis of the plane, and forming a reference fault pattern for defining a fault pattern of the re-classified fault points.

Abstract: An in-plane switching liquid crystal display device includes a gate line and a data line on a substrate, the gate and data lines crossing each other to define a pixel region, a thin film transistor electrically connected to the gate and data lines, a pixel electrode connected to the thin film transistor, and a common electrode alternately arranged with the pixel electrode to form n blocks in the pixel region. Widths of some of the blocks are different than widths of other of the blocks.