Patents by Inventor Young Heon BAE

Young Heon BAE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Item inspecting device
    Patent number: 10713775
    Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: July 14, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Young Heon Bae, Seung Jun Lee, Jeong Yeob Kim, Deok Hwa Hong, Moon Young Jeon, Joon Koo Kang, Joongki Jeong, Jae Yoon Jung, Jong Hui Lee
  • ITEM INSPECTING DEVICE
    Publication number: 20190035066
    Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.
    Type: Application
    Filed: June 30, 2016
    Publication date: January 31, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Young Heon BAE, Seung Jun LEE, Jeong Yeob KIM, Deok Hwa HONG, Moon Young JEON, Joon Koo KANG, Joongki JEONG, Jae Yoon JUNG, Jong Hui LEE