Patents by Inventor Young-Jae Jung

Young-Jae Jung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150112088
    Abstract: The present invention relates to a method for preparing high purity anhydrosugar alcohols using hydrogenated sugar, and more specifically, to a method for preparing high purity anhydrosugar alcohols (particularly, isosorbide, isomannide, isoidide, and the like) with a purity of 97.5% or higher (more preferably, 98.5% or higher) and a pH of a distillate of 3.7 or higher (more preferably, 4.0 or higher) in a distillation yield of 87% or higher (more preferably, 90% or higher) by adding an acid to hexitol so as to convert the same into anhydrosugar alcohols, and single-stage distilling the converted product by using an internal condenser type thin film evaporator.
    Type: Application
    Filed: May 9, 2013
    Publication date: April 23, 2015
    Applicant: SAMYANG GENEX CORPORATION
    Inventors: Do Hyun Kyung, Young Jae Jung, Jin Kyung Kim, Hoon Ryu
  • Patent number: 9015459
    Abstract: Provided is a method of initializing operation of a memory system. The method includes receiving an initialization signal, performing a first initializing operation that uses initialization data in response to the receiving of the initialization signal, setting a forced reset mode when an operation standby signal is not enabled by the first initializing operation, and performing a second initializing operation that does not use the initialization data in response to the setting of the forced reset mode.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: April 21, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Young-Jae Jung
  • Patent number: 9000789
    Abstract: A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
    Type: Grant
    Filed: September 22, 2011
    Date of Patent: April 7, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Eun-sik Kim, Kil-yeon Kim, Yun-bo Yang, Kui-hyun Ro, Heon-gwon Lee, Young-jae Jung
  • Publication number: 20150094477
    Abstract: The present invention relates to a production method for an anhydro sugar alcohol having a markedly reduced ion content and improved colour characteristics, and, more specifically, relates to a method for producing an anhydrous sugar alcohol having a markedly reduced ion content, markedly lowered electrical conductivity and improved colour characteristics, which is obtained by subjecting hydrogenated sugar (sugar alcohol) to a dehydration reaction and thereby converting same to an anhydrous sugar alcohol and then subjecting distilled water, which has been isolated through a distillation step, to a decolourizing process using activated carbon, and subsequently bringing the resulting decolourized substance into contact with an ion exchange resin.
    Type: Application
    Filed: May 9, 2013
    Publication date: April 2, 2015
    Applicant: SAMYANG GENEX CORPORATION
    Inventors: Young Jae Jung, Jin Kyung Kim, Do Hyun Kyung, Hoon Ryu
  • Publication number: 20140281765
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Application
    Filed: May 28, 2014
    Publication date: September 18, 2014
    Inventors: Yun-Bo Yang, Young-Jae Jung, Kui-Hyun Ro, Sung-Eun Yun
  • Publication number: 20140209782
    Abstract: A method of monitoring a manufacturing process includes generating a measurement data by analyzing emission intensity of plasma emission light using a measurement device, the plasma emission light being generated when a plasma gas of a manufacturing process device is changed from an energy level corresponding to a high energy state to an energy level corresponding to a low energy state, generating a compensated value based on the measurement data, the compensated value being generated by offsetting a sensitivity change that is caused due to pollution of the manufacturing process device and the measurement device or measurement locations of the measurement device, and monitoring the manufacturing process based on the compensated value.
    Type: Application
    Filed: August 31, 2013
    Publication date: July 31, 2014
    Applicant: SAMSUNG DISPLAY CO., LTD.
    Inventor: Young-Jae JUNG
  • Patent number: 8769353
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Grant
    Filed: September 7, 2011
    Date of Patent: July 1, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Yun-Bo Yang, Young-Jae Jung, Kui-Hyun Ro, Sung-Eun Yun
  • Publication number: 20140088315
    Abstract: Disclosed is a method for the preparation of an anhydrosugar alcohol using a starch-derived hexitol such as sorbitol or mannitol Anhydrosugar alcohol is in the form of a diol having two hydroxyl groups in the molecule thereof and has a very high utility value as a physical property modifier which can be used primarily in plastics. Representative examples of anhydrosugar alcohols include isosorbide and isomannide. These anhydrosugar alcohols are capable of increasing a glass transition temperature of and improving strength of PET, polyesters, polycarbonates, etc., and are therefore highly valuable as biodegradable environmentally-friendly bioplastics.
    Type: Application
    Filed: June 2, 2011
    Publication date: March 27, 2014
    Applicant: SAMYANG GENEX CORPORATION
    Inventors: Hoon Ryu, Young Jae Jung, Young Seok Kim
  • Publication number: 20130042095
    Abstract: Provided is a method of initializing operation of a memory system. The method includes receiving an initialization signal, performing a first initializing operation that uses initialization data in response to the receiving of the initialization signal, setting a forced reset mode when an operation standby signal is not enabled by the first initializing operation, and performing a second initializing operation that does not use the initialization data in response to the setting of the forced reset mode.
    Type: Application
    Filed: July 27, 2012
    Publication date: February 14, 2013
    Inventor: Young-Jae Jung
  • Publication number: 20120146673
    Abstract: A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
    Type: Application
    Filed: September 22, 2011
    Publication date: June 14, 2012
    Inventors: Eun-Sik Kim, Kil-yeon Kim, Yun-bo Yang, Kui-hyun Ro, Heon-gwon Lee, Young-jae Jung
  • Publication number: 20120117430
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Application
    Filed: September 7, 2011
    Publication date: May 10, 2012
    Inventors: Yun-Bo YANG, Young-Jae JUNG, Kui-Hyun RO, Sung-Eun YUN
  • Publication number: 20110174805
    Abstract: The present invention relates a weaving torch device for auto welding that can maintain necessary molten metal for desired welding such as welding by a person and provide the best welding beads, by locking a hinge pin and a conveying pin, which are provided to both sides of a weaving torch of a torch device connected to a welding machine, to a locking protrusion and a locking step of a hinge support member of a lower case in order to prevent left/right conveying while the weaving torch is automatically reciprocated up/down by operation of an electromagnet and a conveying spring.
    Type: Application
    Filed: November 6, 2008
    Publication date: July 21, 2011
    Applicant: SM T & D Co., Ltd.
    Inventor: Young Jae Jung
  • Patent number: 7576662
    Abstract: Disclosed herein is a keypad of a portable terminal including an array of a plurality of alpha-numeric key buttons for the input of alphabetic letters of a language, for example, English. The vowel input portion includes a plurality of key buttons, which are allotted with vowels of English alphabet showing a high frequency of use, and some consonants of English alphabet. The key buttons of the vowel input portion are grouped and arranged at a selected position to achieve a high accessibility of the user's. The consonant input portion includes the remaining key buttons, allotted with the remaining consonants of English alphabet.
    Type: Grant
    Filed: March 8, 2006
    Date of Patent: August 18, 2009
    Inventors: Young-Jae Jung, Hong-Jae Jung
  • Patent number: 7309655
    Abstract: Disclosed is an etching method for semiconductor processing by which a pattern loading phenomenon is reduced. First, plasma is generated while setting a bias power applied to a wafer to zero and applying a source power. After a predetermined time period, an etching process is implemented onto a predetermined layer formed on the wafer by setting the bias power to a predetermined value. Since by-products generated during preceding etching processes can be readily removed during an etching using plasma, an etching process change due to a difference of pattern densities can be reduced. In addition, a progressive pattern loading generated as the number of processed wafers increase, can be prevented.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: December 18, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Young-Jae Jung
  • Publication number: 20070222644
    Abstract: Disclosed herein is a keypad of a portable terminal including an array of a plurality of alpha-numeric key buttons for the input of alphabetic letters of a language, for example, English. The vowel input portion includes a plurality of key buttons, which are allotted with vowels of English alphabet showing a high frequency of use, and some consonants of English alphabet. The key buttons of the vowel input portion are grouped and arranged at a selected position to achieve a high accessibility of the user's. The consonant input portion includes the remaining key buttons, allotted with the remaining consonants of English alphabet.
    Type: Application
    Filed: March 8, 2006
    Publication date: September 27, 2007
    Inventors: Young-Jae Jung, Hong-Jae Jung
  • Patent number: 7176139
    Abstract: Disclosed is an etching method for semiconductor processing by which a pattern loading phenomenon is reduced. First, plasma is generated while setting a bias power applied to a wafer to zero and applying a source power. After a predetermined time period, an etching process is implemented onto a predetermined layer formed on the wafer by setting the bias power to a predetermined value. Since by-products generated during preceding etching processes can be readily removed during an etching using plasma, an etching process change due to a difference of pattern densities can be reduced. In addition, a progressive pattern loading generated as the number of processed wafers increase, can be prevented.
    Type: Grant
    Filed: April 30, 2003
    Date of Patent: February 13, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Young-Jae Jung
  • Publication number: 20070023916
    Abstract: The semiconductor structure includes an etch target layer to be pattemed, a multiple bottom anti-reflective coating (BARC) layer, and a photoresist (PR) pattern. The multiple BARC layer includes a first mask layer formed on the etch target layer and containing carbon, and a second mask layer formed on the first mask layer and containing silicon. A PR layer formed on the multiple BARC layer undergoes photolithography to form the PR pattern on the multiple BARC layer. The multiple BARC layer has a reflectance of 2% or less, and an interface angle between the PR pattern and the multiple BARC layer is 80° to 90°.
    Type: Application
    Filed: July 28, 2006
    Publication date: February 1, 2007
    Inventors: Jung-hwan Hah, Yun-sook Chae, Han-ku Cho, Chang-jin Kang, Sang-gyun Woo, Man-hyoung Ryoo, Young-jae Jung
  • Publication number: 20070000869
    Abstract: Disclosed is an etching method for semiconductor processing by which a pattern loading phenomenon is reduced. First, plasma is generated while setting a bias power applied to a wafer to zero and applying a source power. After a predetermined time period, an etching process is implemented onto a predetermined layer formed on the wafer by setting the bias power to a predetermined value. Since by-products generated during preceding etching processes can be readily removed during an etching using plasma, an etching process change due to a difference of pattern densities can be reduced. In addition, a progressive pattern loading generated as the number of processed wafers increase, can be prevented.
    Type: Application
    Filed: September 8, 2006
    Publication date: January 4, 2007
    Inventor: Young-Jae Jung
  • Publication number: 20070000610
    Abstract: Disclosed is an etching method for semiconductor processing by which a pattern loading phenomenon is reduced. First, plasma is generated while setting a bias power applied to a wafer to zero and applying a source power. After a predetermined time period, an etching process is implemented onto a predetermined layer formed on the wafer by setting the bias power to a predetermined value. Since by-products generated during preceding etching processes can be readily removed during an etching using plasma, an etching process change due to a difference of pattern densities can be reduced. In addition, a progressive pattern loading generated as the number of processed wafers increase, can be prevented.
    Type: Application
    Filed: September 8, 2006
    Publication date: January 4, 2007
    Inventor: Young-Jae Jung
  • Publication number: 20040047713
    Abstract: Disclosed is a screwed nail including a nail body having a shank, and a head formed at one end of the shank, the shank having a tip at the other end thereof, wherein the shank has threaded portions respectively formed at opposite sides of a middle portion of the shank, the threaded portions having threads with opposite angles of threading, respectively. It is possible to achieve easy driving of the screwed nail while providing a high fastening force by forming the threaded portions to have opposite angles of threading, and appropriately adjusting those angles of threading, and respective diameters of the threaded portions.
    Type: Application
    Filed: September 9, 2002
    Publication date: March 11, 2004
    Inventor: Young Jae Jung