Abstract: Disclosed herein are an apparatus and method for a multi-cloud service platform. The apparatus includes one or more processors and executable memory for storing at least one program executed by the one or more processors. The at least one program may receive a service request from a user client device, generate a multi-cloud infrastructure service using multiple clouds in response to the service request, make the multiple clouds interoperate with mufti-cloud infrastructure in order to provide the multi-cloud infrastructure service, and generate a multi-cloud application runtime environment corresponding to the multi-cloud infrastructure service.

Abstract: A memory device includes sections arranged between a global bit line and a complementary global bit line, and having a section control unit disposed between first and second memory cell groups and connected between the global bit line and the complementary global bit line to provide a first read signal and a second read signal. A signal converter receives the first and second read signals and generates a stable controlled read signal indicative of a data value stored in the memory cell. A latch unit receives and latches the controlled read signal provided by the signal converter to generate a latched read signal.

Abstract: A test device for a system-on-chip includes a sequential logic circuit and a test circuit. The sequential logic circuit generates a test input signal by converting a serial input signal into a parallel format in response to a serial clock signal and a serial enable signal and generates a serial output signal by converting a test output signal into a serial format in response to the serial clock signal and the serial enable signal. The test circuit includes at least one delay unit that is separated from a logic circuit performing original functions of the system-on-chip, performs a delay test on the at least one delay unit using the test input signal in response to a system clock signal and a test enable signal, and provides the test output signal to the sequential logic circuit, where the test output signal representing a result of the delay test.

Abstract: A memory device includes sections arranged between a global bit line and a complementary global bit line, and having a section control unit disposed between first and second memory cell groups and connected between the global bit line and the complementary global bit line to provide a first read signal and a second read signal. A signal converter receives the first and second read signals and generates a stable controlled read signal indicative of a data value stored in the memory cell. A latch unit receives and latches the controlled read signal provided by the signal converter to generate a latched read signal.

Abstract: A test device for a system-on-chip includes a sequential logic circuit and a test circuit. The sequential logic circuit generates a test input signal by converting a serial input signal into a parallel format in response to a serial clock signal and a serial enable signal and generates a serial output signal by converting a test output signal into a serial format in response to the serial clock signal and the serial enable signal. The test circuit includes at least one delay unit that is separated from a logic circuit performing original functions of the system-on-chip, performs a delay test on the at least one delay unit using the test input signal in response to a system clock signal and a test enable signal, and provides the test output signal to the sequential logic circuit, where the test output signal representing a result of the delay test.

Abstract: Circuits and methods that enable screening for defective or weak memory cells in a semiconductor memory device. In one aspect, a semiconductor memory device comprises first and second drivers for a SRAM cell. The first driver is connected between a power supply voltage and the cell, which supplies the power supply voltage into the cell in response to a cell power control signal. The second driver is connected between the power supply signal and the cell, which supplies a voltage lower than the power supply voltage into the cell in response to the cell power down signal.

Abstract: Circuits and methods that enable screening for defective or weak memory cells in a semiconductor memory device. In one aspect, a semiconductor memory device comprises first and second drivers for a SRAM cell. The first driver is connected between a power supply voltage and the cell, which supplies the power supply voltage into the cell in response to a cell power control signal. The second driver is connected between the power supply signal and the cell, which supplies a voltage lower than the power supply voltage into the cell in response to the cell power down signal.