Abstract: Discussed is a method for inspecting and separating batteries, the method including: determining which of a predetermined number of the batteries is a good battery, when not all of the predetermined number of the batteries are determined to be good batteries, receiving another good battery temporarily stored in a good battery storage by a transfer when it is possible to form a good battery group including only good batteries by receiving the another good battery temporarily stored in the good battery storage by the transfer, and temporarily storing the good battery among the predetermined number of the batteries by transferring the good battery to the good battery storage when it is not possible to form the good battery group including only good batteries even by receiving the another good battery temporarily stored in the good battery storage by the transfer.

Abstract: Disclosed is a method for removing nitrogen and phosphorus from sewage and wastewater through a combination of a biological nitrogen and phosphorus removal process using nitrite nitrogen and an anaerobic ammonium oxidation process. An objective of an embodiment of the present invention is to provide an apparatus for removing nitrogen and phosphorus in which, by inducing a denitritation- and nitritation-based biological nitrogen and phosphorus removal process in a bioreactor and applying an anaerobic ammonium oxidation process, nitrogen and phosphorus can be economically and effectively removed without separately injecting organic materials.

Abstract: Disclosed are an aerosol generating article and an aerosol generating device, wherein the aerosol generating article includes a tobacco rod and a cooling segment configured to cool aerosols generated from the tobacco rod through a tobacco composition.

Abstract: A semiconductor device includes a semiconductor substrate having an etch target layer provided on the surface thereof, and a hard mask layer formed over the etch target layer and including silicon, wherein the hard mask layer includes a dual structure including a first area and a second area having a larger etch rate than the first area, in order to increase an etching selectivity of the hard mask layer.

Abstract: A semiconductor device includes a pipe channel layer formed over a substrate, a first vertical channel layer formed over the pipe channel layer to couple the pipe channel layer to a bit line, a second vertical channel layer formed over the pipe channel layer to couple the pipe channel layer to a source line, a multi-layer comprising a charge trap layer and formed to surround the first vertical channel layer, the second vertical channel layer, and the pipe channel layer, an insulating barrier layer formed to surround the multi-layer, a plurality of first conductive layers formed between the pipe channel layer and the bit line, wherein the first vertical channel layer passes through the first conductive layers, and a plurality of second conductive layers formed between the pipe channel layer and the source line, wherein the second vertical layer passes through the second conductive layers.

Abstract: A semiconductor device includes a semiconductor substrate having an etch target layer provided on the surface thereof, and a hard mask layer formed over the etch target layer and including silicon, wherein the hard mask layer includes a dual structure including a first area and a second area having a larger etch rate than the first area, in order to increase an etching selectivity of the hard mask layer.

Abstract: A method for fabricating a semiconductor device includes forming buried bit lines separated from each other by a trench in a substrate, forming a plurality of first pillar holes that expose a top surface of the substrate, forming first active pillars buried in the first pillar holes, forming a gate conductive layer over entire surface of a resultant structure including the first active pillars, forming a gate electrode by etching the gate conducting layer to cover the first active pillars, forming a plurality of second pillar holes that expose the first active pillars by partially etching the gate electrode, and forming second active pillars buried in the second pillar holes and connected to the first active pillars.

Abstract: A method for forming fine pattern includes sequentially forming a first thin film and a second thin film over a target layer for patterning, forming a partition over the second thin film, removing the partition after forming spacers on sidewalls of the partition, forming first pattern of the second thin film by etching the second thin film of a first region and the second thin film of a second region while exposing the spacers, forming second pattern of the second thin film by using the spacers as masks and etching the first pattern of the second thin film in the first region, forming first thin film pattern by using the first and second patterns of the second thin film as masks in the first and second regions and etching the first thin film, and etching the pattern target layer.

Abstract: A method of manufacturing a 3-Dimensional (3-D) non-volatile memory device includes forming first material layers and second material layers alternately, forming at least one first trench by etching the first material layers and the second material layers, forming floating gate regions by recessing the second material layers, exposed to the first trench, forming a first charge blocking layer on surfaces of the first trench and the floating gate regions, forming a first conductive layer on the first charge blocking layer, etching the first conductive layer on the upper side of the first trench, forming a second charge blocking layer on the first charge blocking layer exposed by etching the first conductive layer, and forming floating gates in the respective floating gate regions by etching the first conductive layer.

Abstract: A method for fabricating a vertical channel type non-volatile memory device including a plurality of memory cells stacked along channels protruding from a substrate includes: alternately forming a plurality of first material layers and a plurality of second material layers over the substrate; forming a buffer layer over the substrate with the plurality of the first material layers and the plurality of the second material layers formed thereon; forming trenches by etching the buffer layer, the plurality of the second material layers, and the plurality of the first material layers; forming a material layer for channels over the substrate to fill the trenches; and forming the channels by performing a planarization process until a surface of the buffer layer is exposed.

Abstract: In a method of fabricating a semiconductor device on a substrate which includes a plurality of pillar patterns, an impurity region between adjacent pillar patterns, a gate electrode on each pillar pattern, a first capping layer covering the gate electrode, and a separation layer covering the first capping layer between the gate electrodes of adjacent pillar patterns, the first capping layer is removed except for a portion contacting the separation layer, a sacrificial layer is formed to cover the gate electrode, a second capping layer is formed on sidewalls of each pillar pattern, the sacrificial layer is removed and a word line connecting the gate electrodes of the adjacent pillar patterns is formed. In the manufactured device, the first capping layer isolates the impurity region from the word line and the second capping region prevents the sidewalls of the respective pillar pattern from being exposed.

Abstract: A method for forming fine pattern includes sequentially forming a first thin film and a second thin film over a target layer for patterning, forming a partition over the second thin film, removing the partition after forming spacers on sidewalls of the partition, forming first pattern of the second thin film by etching the second thin film of a first region and the second thin film of a second region while exposing the spacers, forming second pattern of the second thin film by using the spacers as masks and etching the first pattern of the second thin film in the first region, forming first thin film pattern by using the first and second patterns of the second thin film as masks in the first and second regions and etching the first thin film, and etching the pattern target layer.

Abstract: A semiconductor device includes a pipe channel layer formed over a substrate, a first vertical channel layer formed over the pipe channel layer to couple the pipe channel layer to a bit line, a second vertical channel layer formed over the pipe channel layer to couple the pipe channel layer to a source line, a multi-layer comprising a charge trap layer and formed to surround the first vertical channel layer, the second vertical channel layer, and the pipe channel layer, an insulating barrier layer formed to surround the multi-layer, a plurality of first conductive layers formed between the pipe channel layer and the bit line, wherein the first vertical channel layer passes through the first conductive layers, and a plurality of second conductive layers formed between the pipe channel layer and the source line, wherein the second vertical layer passes through the second conductive layers.

Abstract: In a method of fabricating a semiconductor device on a substrate having a pillar pattern, a gate electrode is formed on the pillar pattern without etching the latter. A conductive pattern is filled between adjacent pillar patterns, a spacer is formed above the conductive pattern and surrounding sidewalls of each pillar pattern, and the gate electrode is formed by etching the conductive pattern using the spacer as an etch barrier.

Abstract: A method for fabricating a semiconductor device includes forming buried bit lines separated from each other by a trench in a substrate, forming a plurality of first pillar holes that expose a top surface of the substrate, forming first active pillars buried in the first pillar holes, forming a gate conductive layer over entire surface of a resultant structure including the first active pillars, forming a gate electrode by etching the gate conducting layer to cover the first active pillars, forming a plurality of second pillar holes that expose the first active pillars by partially etching the gate electrode, and forming second active pillars buried in the second pillar holes and connected to the first active pillars.

Abstract: In a method of fabricating a semiconductor device on a substrate which includes a plurality of pillar patterns, an impurity region between adjacent pillar patterns, a gate electrode on each pillar pattern, a first capping layer covering the gate electrode, and a separation layer covering the first capping layer between the gate electrodes of adjacent pillar patterns, the first capping layer is removed except for a portion contacting the separation layer, a sacrificial layer is formed to cover the gate electrode, a second capping layer is formed on sidewalls of each pillar pattern, the sacrificial layer is removed and a word line connecting the gate electrodes of the adjacent pillar patterns is formed. In the manufactured device, the first capping layer isolates the impurity region from the word line and the second capping region prevents the sidewalls of the respective pillar pattern from being exposed.

Abstract: A method for fabricating a semiconductor device includes forming buried bit lines separated from each other by a trench in a substrate, forming a plurality of first pillar holes that expose a top surface of the substrate, forming first active pillars buried in the first pillar holes, forming a gate conductive layer over entire surface of a resultant structure including the first active pillars, forming a gate electrode by etching the gate conducting layer to cover the first active pillars, forming a plurality of second pillar holes that expose the first active pillars by partially etching the gate electrode, and forming second active pillars buried in the second pillar holes and connected to the first active pillars.

Abstract: In a method of fabricating a semiconductor device on a substrate which includes a plurality of pillar patterns, an impurity region between adjacent pillar patterns, a gate electrode on each pillar pattern, a first capping layer covering the gate electrode, and a separation layer covering the first capping layer between the gate electrodes of adjacent pillar patterns, the first capping layer is removed except for a portion contacting the separation layer, a sacrificial layer is formed to cover the gate electrode, a second capping layer is formed on sidewalls of each pillar pattern, the sacrificial layer is removed and a word line connecting the gate electrodes of the adjacent pillar patterns is formed. In the manufactured device, the first capping layer isolates the impurity region from the word line and the second capping region prevents the sidewalls of the respective pillar pattern from being exposed.

Abstract: A method for fabricating a semiconductor device includes: forming a stack structure including pillar regions whose upper portion has a wider width than a lower portion over a substrate, the lower portion including at least a conductive layer; forming a gate insulation layer on sidewalls of the pillar regions; forming active pillars to gap-fill the pillar regions; and forming vertical gates that serve as both gate electrode and word lines by selectively etching the conductive layer.

Abstract: A method for fabricating a vertical channel type non-volatile memory device includes repeatedly forming stacks of conductive layers and inter-layer insulation layers over a substrate, and performing an etch process using an etch gas which etches both the conductive layers and the inter-layer insulation layers to form a contact hole exposing the substrate, wherein the etch gas maintains a selectivity between the inter-layer insulation layers and the conductive layers with a ratio of different etching rates ranging from approximately 0.1 to approximately 2.