Abstract: The present specification provides a tissue pathology reading support device and a method therefor, which, with respect to an artificial intelligence model, divide, into a plurality of patches, a slide tissue image for learning that indicates a lesion site if a lesion is present, infer the classification of each of the plurality of patches so as to learn patch classification results, integrate the plurality of patches and the patch classification results so as to infer the classification of the reconstructed slide tissue image, thereby learning slide tissue image classification results, use the trained artificial intelligence model so as to infer the classification of each of the plurality of patches, thereby generating patch classification results, and integrate the plurality of patches and the patch classification results so as to infer the classification of the reconstructed slide tissue image, thereby generating slide tissue image classification results.

Abstract: The present specification discloses an image diagnosis apparatus using a deep learning model and a method therefor, wherein tissue included in an input medical image is classified as being one of normal and abnormal for a disease by using the trained deep learning model using a weighted loss function in which different weights are assigned to a probability distribution of determining that a picture extracted from the input medical image is abnormal even though it is normal and a probability distribution of determining that the picture is normal even though it is abnormal.

Abstract: The present specification discloses an image diagnosis apparatus using a deep learning model and a method therefor, wherein tissue included in an input medical image is classified as being one of normal and abnormal for a disease by using the trained deep learning model using a weighted loss function in which different weights are assigned to a probability distribution of determining that a picture extracted from the input medical image is abnormal even though it is normal and a probability distribution of determining that the picture is normal even though it is abnormal.

Abstract: A structure for impedance signal lines of a transistor outline (TO)-can type semiconductor package is disclosed. The TO-can type semiconductor package may include a header including a semiconductor laser diode disposed on one side thereof; a signal line penetrating the header and including a one end protruding from the one side of the header; and an edge-coupled microstrip (ECM) portion connected to the signal line. The ECM portion is configured to include a dielectric and ECM lines are formed as conductive patterns having predetermined widths and leaving a predetermined space therebetween on a first side of the dielectric, and respectively connected to the signal lines.