Abstract: A method and device for predicting an anomaly in a manufacturing process. The method includes receiving time-series equipment data including one or both of sensor data and specification data, converting the time-series equipment data into an image, dividing the image into a plurality of patch images, outputting a probability for each class associated with a sign of an anomaly in the time-series equipment data by inputting the plurality of patch images to a pretrained artificial neural network (ANN), and predicting the sign of the anomaly in the time-series equipment data by adjusting a probability weight for each class based on a preset standard.

Abstract: A processor-implemented method with image analysis includes: receiving a test image; generating a plurality of augmented images by augmenting the test image; determining classification prediction values for the augmented images using a classifier; determining a detection score based on the classification prediction values; and determining whether the test image corresponds to anomaly data based on the detection score and a threshold.