Patents by Inventor Youssef Wakil
Youssef Wakil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7370964Abstract: An apparatus and method for measuring refractive characteristics of human eyes with an objective refraction measuring device for measuring refraction in at least one eye, the objective refraction measuring system having a proximal end and a distal end, the objective refraction measuring system suitable for looking in the proximal end and seeing out the distal end; an open field visual target. An open viewing lane is provided between the eye and the open field visual target, the viewing lane has sufficient length to allow for focusing the eye at infinity and for natural accommodation at true distance targets, such near distances such as reading distances. The objective refraction measuring device can be positioned in the viewing lane to measure the eye while the eye is focused on the open field visual target.Type: GrantFiled: July 29, 2002Date of Patent: May 13, 2008Assignee: Tracey Technologies, LLCInventors: Youssef Wakil, Ioannis Pallikaris, Vasyl Molebny
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Patent number: 7311400Abstract: Eye refraction is measured to achieve desired quality via a selected vision characteristics. A characteristic of vision is selected to correlate to the desired quality of vision from a group of vision characteristics comprising acuity, Strehl ratio, contrast sensitivity, night vision, day vision, and depth of focus, dynamic refraction over a period of time during focus accommodation, and dynamic refraction over a period of time during pupil constriction and dilation. Wavefront aberration measurements are used to objectively measure the state of the eye refraction that defines the desired vision characteristic. The measured state of refraction is expressed with a mathematical function enabling correction of the pre-selected vision characteristic to achieve the desired quality of vision. The mathematical expression function may be a Zernike polynomial having both second order and higher order terms or a function determined by spline mathematical calculations.Type: GrantFiled: April 16, 2002Date of Patent: December 25, 2007Assignee: Tracey Technologies, LLCInventors: Youssef Wakil, Vasyl V. Molebny, Sergiy Molebny, Ioannis Pallikaris
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Patent number: 6932475Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.Type: GrantFiled: May 1, 2002Date of Patent: August 23, 2005Assignee: Tracey Technologies, L.L.C.Inventors: Vasyl V. Molebny, Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil
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Publication number: 20050057723Abstract: A method of measuring eye refraction to achieve desired quality according to a selected vision characteristics comprising the steps of selecting a characteristic of vision to correlate to the desired quality of vision from a group of vision characteristics comprising acuity, Strehl ratio, contrast sensitivity, night vision, day vision, and depth of focus, dynamic refraction over a period of time during focus accommodation, and dynamic refraction over a period of time during pupil constriction and dilation; using wavefront aberration measurements to objectively measure the state of the eye refraction that defines the desired vision characteristic; and expressing the measured state of refraction with a mathematical function to enable correction of the pre-selected vision characteristic to achieve the desired quality of vision. The mathematical function of expression may be a Zernike polynomial having both second order and higher order terms or a function determined by spline mathematical calculations.Type: ApplicationFiled: April 16, 2002Publication date: March 17, 2005Inventors: Youssef Wakil, Vasyi Molebny, Sergiy Molebny, Ioannis Pallikaris
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Publication number: 20050007551Abstract: A method and an instrument is provided for measuring aberration refraction of an eye with a first device for measuring the total aberration refraction of the eye and a second device for measuring the aberration refraction of the cornea of the eye. The component of aberration refraction caused by the lens caused by the lens is calculated using the measured total eye aberration refraction and the measured component of aberration refraction of the cornea mapped over the optical surfaces of the eye. Each component portion of the aberration refraction provides information usable for making appropriate corrective actions at the cornea, at the lens, or both as indicated by the mapped measurements and calculations.Type: ApplicationFiled: November 14, 2003Publication date: January 13, 2005Applicant: Tracey Technologies, LLCInventors: Youssef Wakil, Vasyl Molebny, Ioannis Pallikaris, Sergiy Molebny, Tom Padrick
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Publication number: 20040218142Abstract: An apparatus and method for measuring refractive characteristics of human eyes with an objective refraction measuring device for measuring refraction in at least one eye, the objective refraction measuring system having a proximal end and a distal end, the objective refraction measuring system suitable for looking in the proximal end and seeing out the distal end; an open field visual target. An open viewing lane is provided between the eye and the open field visual target, the viewing lane has sufficient length to allow for focusing the eye at infinity and for natural accommodation at true distance targets, such near distances such as reading distances. The objective refraction measuring device can be positioned in the viewing lane to measure the eye while the eye is focused on the open field visual target.Type: ApplicationFiled: January 27, 2004Publication date: November 4, 2004Inventors: Youssef Wakil, Ioannis Pallikaris, Vasyl Molebny
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Publication number: 20030011745Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.Type: ApplicationFiled: May 1, 2002Publication date: January 16, 2003Applicant: Tracey Technologies, LLCInventors: Vasyl V. Molebny, Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil
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Patent number: 6409345Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A first photodetector measures the position of a first portion of the probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations. A second photodetector synchronously measures the position of a second portion of the probing beam light reflected back from the cornea of the eye.Type: GrantFiled: August 8, 2000Date of Patent: June 25, 2002Assignee: Tracey Technologies, LLCInventors: Vasyl V. Molebny, Ioannis Pallikaris, Youssef Wakil, Sergiy Molebny
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Patent number: RE42782Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A first photodetector measures the position of a first portion of the probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations. A second photodetector synchronously measures the position of a second portion of the probing beam light reflected back from the cornea of the eye.Type: GrantFiled: June 23, 2004Date of Patent: October 4, 2011Assignee: Tracey Technologies, LLCInventors: Vasyl Molebny, Ioannis Pallikaris, Youssef Wakil, Sergiy Molebny