Abstract: A system and method for performing operating state analysis of an integrated circuit (IC) design is disclosed. The method includes simulating a switching operation from a first operating state to a second operating state for one or more cells of the IC design using a plurality of vectors corresponding to one or more user-specified constraints. The method include generating a time-based waveform for each cell of the one or more cells changing an operating state from the first operating state to the second operating state, and based on the generated time-based waveform, identifying one or more operating state changes corresponding to the operating state analysis and associated timing window and cell information. The method includes verifying the one or more operating state changes by the each cell of the one or more cells of the IC design meet the one or more user-specified constraints for generating an analysis report.

Abstract: A system is disclosed that includes a memory and a processor to perform operations, including analyzing rail voltage drop for a full-chip to identify an IR drop violation in a block design of the full-chip. The operations include performing a block-level rail voltage drop analysis for the block design and generating a revised block design corresponding to the block design in which the IR drop violation is identified. The operations include performing a block-level rail voltage drop analysis on the revised block design to verify that the IR drop violation is fixed and integrating the revised block design into the full-chip to replace the block design upon verifying that the IR drop violation is fixed. The operations include performing the rail voltage drop analysis for the full-chip comprising the revised block design.