Patents by Inventor Yu-chen Ko
Yu-chen Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 12272600Abstract: A method includes forming a dielectric layer over an epitaxial source/drain region. An opening is formed in the dielectric layer. The opening exposes a portion of the epitaxial source/drain region. A barrier layer is formed on a sidewall and a bottom of the opening. An oxidation process is performing on the sidewall and the bottom of the opening. The oxidation process transforms a portion of the barrier layer into an oxidized barrier layer and transforms a portion of the dielectric layer adjacent to the oxidized barrier layer into a liner layer. The oxidized barrier layer is removed. The opening is filled with a conductive material in a bottom-up manner. The conductive material is in physical contact with the liner layer.Type: GrantFiled: May 13, 2022Date of Patent: April 8, 2025Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Pin-Wen Chen, Chang-Ting Chung, Yi-Hsiang Chao, Yu-Ting Wen, Kai-Chieh Yang, Yu-Chen Ko, Peng-Hao Hsu, Ya-Yi Cheng, Min-Hsiu Hung, Chun-Hsien Huang, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai
-
Patent number: 12237218Abstract: A method of fabricating a contact structure includes the following steps. An opening is formed in a dielectric layer. A conductive material layer is formed within the opening and on the dielectric layer, wherein the conductive material layer includes a bottom section having a first thickness and a top section having a second thickness, the second thickness is greater than the first thickness. A first treatment is performed on the conductive material layer to form a first oxide layer on the bottom section and on the top section of the conductive material layer. A second treatment is performed to remove at least portions of the first oxide layer and at least portions of the conductive material layer, wherein after performing the second treatment, the bottom section and the top section of the conductive material layer have substantially equal thickness.Type: GrantFiled: May 6, 2022Date of Patent: February 25, 2025Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chang-Ting Chung, Shih-Wei Yeh, Kai-Chieh Yang, Yu-Ting Wen, Yu-Chen Ko, Ya-Yi Cheng, Min-Hsiu Hung, Chun-Hsien Huang, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai
-
Publication number: 20240387265Abstract: A method includes forming a dielectric layer over an epitaxial source/drain region. An opening is formed in the dielectric layer. The opening exposes a portion of the epitaxial source/drain region. A barrier layer is formed on a sidewall and a bottom of the opening. An oxidation process is performing on the sidewall and the bottom of the opening. The oxidation process transforms a portion of the barrier layer into an oxidized barrier layer and transforms a portion of the dielectric layer adjacent to the oxidized barrier layer into a liner layer. The oxidized barrier layer is removed. The opening is filled with a conductive material in a bottom-up manner. The conductive material is in physical contact with the liner layer.Type: ApplicationFiled: July 28, 2024Publication date: November 21, 2024Inventors: Pin-Wen Chen, Chang-Ting Chung, Yi-Hsiang Chao, Yu-Ting Wen, Kai-Chieh Yang, Yu-Chen Ko, Peng-Hao Hsu, Ya-Yi Cheng, Min-Hsiu Hung, Chun-Hsien Huang, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai
-
Publication number: 20240363353Abstract: A method of forming a semiconductor device includes: forming a gate structure over a fin that protrudes above a substrate; forming a source/drain region over the fin adjacent to the gate structure; forming an interlayer dielectric (ILD) layer over the source/drain region around the gate structure; forming an opening in the ILD layer to expose the source/drain region; forming a silicide region and a barrier layer successively in the openings over the source/drain region, where the barrier layer includes silicon nitride; reducing a concentration of silicon nitride in a surface portion of the barrier layer exposed to the opening; after the reducing, forming a seed layer on the barrier layer; and forming an electrically conductive material on the seed layer to fill the opening.Type: ApplicationFiled: August 14, 2023Publication date: October 31, 2024Inventors: Pin-Wen Chen, Yu-Chen Ko, Chi-Yuan Chen, Ya-Yi Cheng, Chun-I Tsai, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai, Syun-Ming Jang, Wei-Jen Lo
-
Publication number: 20230395426Abstract: Provided is a conductive structure and a method for forming such a structure. The method includes forming a treatable layer by depositing a layer comprising a metal over a structure; performing a directional treatment process on a targeted portion of the treatable layer to convert the targeted portion to a material different from a non-targeted portion of the treatable layer, wherein the directional treatment process is selected from the group consisting of nitridation, oxidation, chlorination, carbonization; and selectively removing the non-targeted portion from the structure, wherein the targeted portion remains over the structure.Type: ApplicationFiled: June 1, 2022Publication date: December 7, 2023Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Yi-Hsiang Chao, Shu-Lan Chang, Ching-Yi Chen, Shih-Wei Yeh, Pei Shan Chang, Ya-Yi Cheng, Yu-Chen Ko, Yu-Shiuan Wang, Chun-Hsien Huang, Hung-Chang Hsu, Chih-Wei Chang, Ming-Hsing Tsai, Wei-Jung Lin
-
Publication number: 20230386914Abstract: Methods of forming a semiconductor device structure are described. In some embodiments, the method includes forming a contact opening in an interlayer dielectric (ILD) layer disposed over an epitaxy source/drain region and forming a metal layer in the contact opening. The metal layer includes top portions, side portions, and a bottom portion, and a space is defined between the top portions of the metal layer. The method further includes performing a gradient metal removal process on the metal layer to enlarge the space, forming a sacrificial layer in the contact opening, recessing the sacrificial layer in the contact opening to expose a portion of the sidewall portions, removing the top portions and the exposed portion of the sidewall portions, removing the sacrificial layer, and forming a bulk metal layer on the bottom portion of the metal layer.Type: ApplicationFiled: May 26, 2022Publication date: November 30, 2023Inventors: Yu-Chen KO, Kai-Chieh YANG, Yu-Ting WEN, Ya-Yi CHENG, Min-Hsiu HUNG, Wei-Jung LIN, Chih-Wei CHANG, Ming-Hsing TSAI
-
Publication number: 20230360969Abstract: A method of fabricating a contact structure includes the following steps. An opening is formed in a dielectric layer. A conductive material layer is formed within the opening and on the dielectric layer, wherein the conductive material layer includes a bottom section having a first thickness and a top section having a second thickness, the second thickness is greater than the first thickness. A first treatment is performed on the conductive material layer to form a first oxide layer on the bottom section and on the top section of the conductive material layer. A second treatment is performed to remove at least portions of the first oxide layer and at least portions of the conductive material layer, wherein after performing the second treatment, the bottom section and the top section of the conductive material layer have substantially equal thickness.Type: ApplicationFiled: May 6, 2022Publication date: November 9, 2023Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chang-Ting Chung, Shih-Wei Yeh, Kai-Chieh Yang, Yu-Ting Wen, Yu-Chen Ko, Ya-Yi Cheng, Min-Hsiu Hung, Chun-Hsien Huang, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai
-
Publication number: 20230223302Abstract: A method includes forming a dielectric layer over an epitaxial source/drain region. An opening is formed in the dielectric layer. The opening exposes a portion of the epitaxial source/drain region. A barrier layer is formed on a sidewall and a bottom of the opening. An oxidation process is performing on the sidewall and the bottom of the opening. The oxidation process transforms a portion of the barrier layer into an oxidized barrier layer and transforms a portion of the dielectric layer adjacent to the oxidized barrier layer into a liner layer. The oxidized barrier layer is removed. The opening is filled with a conductive material in a bottom-up manner. The conductive material is in physical contact with the liner layer.Type: ApplicationFiled: May 13, 2022Publication date: July 13, 2023Inventors: Pin-Wen Chen, Chang-Ting Chung, Yi-Hsiang Chao, Yu-Ting Wen, Kai-Chieh Yang, Yu-Chen Ko, Peng-Hao Hsu, Ya-Yi Cheng, Min-Hsiu Hung, Chun-Hsien Huang, Wei-Jung Lin, Chih-Wei Chang, Ming-Hsing Tsai
-
Patent number: 6952232Abstract: The invention provides a digital camera having a viewfinder with an adjustable length. The digital camera includes a first viewfinder member, a second viewfinder member, a first resilient member, a first engagement member, and a second engagement member. In this invention, the first viewfinder member is mounted in the digital camera. The second viewfinder member is mounted in the first viewfinder member and is capable of sliding relative to the first viewfinder member. The first resilient member is connected to the second viewfinder member and capable of pushing the second viewfinder member from a ready position to an ejected position. The first engagement member is mounted on the second viewfinder member.Type: GrantFiled: April 26, 2002Date of Patent: October 4, 2005Assignee: Inventec Multimedia & Telecom Corp.Inventors: Yu-chen Ko, Weng-tiang Tang
-
Patent number: 6519812Abstract: A hinge structure for use in an electronic device such as a digital camera for connecting two elements and making the two elements turn against each other. A gear unit is provided, which has two gears engaging with each other and turning in opposite directions. The two gears connect respectively with the two elements. When one element is turned in one direction, through the transmission of the gear unit, another element will be driven to turn in the opposite direction, to thereby change the angle between the two elements and enhance picture taking flexibility.Type: GrantFiled: June 29, 2001Date of Patent: February 18, 2003Assignee: Inventec Multimedia & Telecom CorporationInventors: Yu-Chen Ko, Heem-Hoe Chee
-
Publication number: 20030020823Abstract: The invention provides a digital camera having a viewfinder with an adjustable length. The digital camera includes a first viewfinder member, a second viewfinder member, a first resilient member, a first engagement member, and a second engagement member. In this invention, the first viewfinder member is mounted in the digital camera. The second viewfinder member is mounted in the first viewfinder member and is capable of sliding relative to the first viewfinder member. The first resilient member is connected to the second viewfinder member and capable of pushing the second viewfinder member from a ready position to an ejected position. The first engagement member is mounted on the second viewfinder member.Type: ApplicationFiled: April 26, 2002Publication date: January 30, 2003Inventors: Yu-Chen Ko, Weng-Tiang Tang
-
Publication number: 20020038493Abstract: A hinge structure for use in an electronic device such as a digital camera for connecting two elements and making the two elements turn against each other. A gear unit is provided, which has two gears engaging with each other and turning in opposite directions. The two gears connect respectively with the two elements. When one element is turned in one direction, through the transmission of the gear unit, another element will be driven to turn in the opposite direction, to thereby change the angle between the two elements and enhance picture taking flexibility.Type: ApplicationFiled: June 29, 2001Publication date: April 4, 2002Inventors: Yu-Chen Ko, Heem-Hoe Chee