Abstract: An optical frequency manipulation using an optical subsystem configured to provide a modulated laser beam for interaction with an atomic sample. The optical system may include: an optical subsystem for producing a light beam, the optical subsystem having a laser source and an IQ modulator, wherein the IQ modulator is operable to modulate light from the laser source at a carrier frequency to produce modulated light having a single sideband at a sideband frequency; and a chamber for containing an atomic sample, wherein the optical subsystem is arranged to direct the light beam towards the chamber to interact with an atomic sample contained therein.

Abstract: An optical frequency manipulation using an optical subsystem configured to provide a modulated laser beam for interaction with an atomic sample. The optical system may include: an optical subsystem for producing a light beam, the optical subsystem having a laser source and an IQ modulator, wherein the IQ modulator is operable to modulate light from the laser source at a carrier frequency to produce modulated light having a single sideband at a sideband frequency; and a chamber for containing an atomic sample, wherein the optical subsystem is arranged to direct the light beam towards the chamber to interact with an atomic sample contained therein.

Abstract: A method for continuously bending a flexible device is suitable in use for inspecting a physical property of a flexible device in different curvatures fast. The method includes bending the flexible device to make a part of it be in an intended curvature. And it is at an inspection position. Further, the flexible device is moved, so as to make at least a portion of the flexible panel to pass the inspection position with the intended curvature. Further, the invention also provides an apparatus implemented with the foregoing method. The flexible device can be an inspected device itself or an inspected device held by a flexible carrier.