Abstract: A computer enclosure includes a computer case and a power supply tray. The computer case includes a side plate and a rear plate adjacent to the side plate. A clamping portion is located on the rear plate, and an opening is defined between the side plate and the rear plate. The power supply tray is attached to the opening and includes a clipping member. The clipping member includes a securing portion extending from the power supply tray and a clipping portion rotatably attached to the securing portion. The clipping portion is engaged with the clamping portion to secure the power supply tray to the computer case, and the clipping portion is rotatable relative to the rear plate to disengage the clipping portion from the clamping portion.

Abstract: A mounting apparatus includes a chassis; a mounting piece, a securing member, a mounting member, and a clipping member. The mounting piece is attached to a first end of an expansion card and secured to the chassis. The securing member is rotatably attached to the chassis and abutting the mounting piece. The mounting member is secured to the chassis and includes a securing rail and a resilient portion. The clipping member is attached to a second end of the expansion card and engaged with the securing rail. The resilient portion abuts the clipping member to prevent the clipping member from disengaging from the securing rail.

Abstract: An output adjustment circuit includes a rectifier and filter circuit, a voltage drop circuit, a voltage output circuit, a PWM regulator, and a feedback circuit. The rectifier and filter circuit receives an AC voltage and converts it into a square wave signal. The voltage drop circuit includes a primary coil and a secondary coil. The primary coil is connected to the rectifier and filter circuit. The primary coil receives the square wave signal. The voltage output circuit is connected to the secondary coil. The PWM regulator is connected to the primary coil. The PWM regulator generates a pulse signal to turn on and turn off the primary coil periodically. The feedback circuit controls a duty cycle of the pulse signal to adjust a during time of the primary coil being on in a cycle. The primary coil transmits energy to the secondary coil according the during time.

Abstract: A testing apparatus includes a testing desk; a supporting tray adapted for securing an expansion card, and a lifting device attached to the testing desk. The supporting tray includes a retaining portion rotatably attached to the testing desk. The lifting device includes a positioning post and a lifting post moveably received in the positioning post. The supporting tray is slanted relative to the testing desk, the lifting post is rotatable relative to the positioning post in a direction substantially perpendicular to the testing desk, and the supporting tray is rotatable relative to the testing desk for adjusting an angle between the supporting tray and the testing desk.

Abstract: A test support apparatus includes a hanging plate and a holding post. The hanging plate defines a receiving hole and includes a bearing portion. The holding post is received in the receiving hole and rotatable relative to the hanging plate. The holding post includes a holding portion and a latching portion extending from the holding portion. The holding portion is secured to the bearing portion and defining a slit for a securing member to engage therein. The latching portion is rotatably engaged with edge of the receiving hole. The securing member is capable of be inserted into a threaded hole defined in a test product.

Abstract: A drop test device for testing a corner portion of a work piece, includes a bottom board, a support pillar, and a hanging mechanism. The support pillar is mounted on the bottom board. The hanging mechanism is mounted on the support pillar and is located above the bottom board. The hanging mechanism includes a support member. The support member includes a triangle base. Angles and sides of the triangle base hold the work piece thereon to have a corner of the work piece directed towards the bottom board.

Abstract: A dust test system includes a test chamber, a vibration apparatus mounted on the test chamber and a vibration control circuit electrically connected to the vibration apparatus. The test chamber is adapted to accommodate an electronic device. The vibration apparatus includes a vibration sieve mounted on the test chamber and at least one vibration motor linkage to the vibration sieve. A plurality of dust is laid on the vibration sieve. The vibration control circuit is adapted to receive a first AC voltage, and output a second AC voltage according to the first AC voltage. The at least one vibration motor is adapted to receive the second AC voltage and vibrate. The vibration sieve is adapted to vibrate together with the at least one vibration motor. The plurality of dust lying on the vibration sieve are dropped into the test chamber.

Abstract: A temperature control system includes a temperature sensing module, a temperature control module, a pulse width modulation control module, a heating module, a heat dissipating module, and a switch module. The temperature sensing module is configured to obtain a current ambient temperature in a test box. The temperature control module is configured to output a control signal according to a difference between the current ambient temperature and a reference temperature. The pulse width modulation control module is configured to output a pulse width modulation signal according to the control signal. The switch module is configured to instruct the heating module or the heat dissipating module according to the pulse width modulation signal to keep the current ambient temperature generally equal to the reference temperature in the test box.

Abstract: A solder apparatus includes a platform, an operating mechanism, a solder member, a heater, and a control box module. The control box module includes a temperature controller and a temperature sensor. The temperature controller defines a predetermined temperature. The temperature sensor is capable of measuring the temperature of the solder member. The temperature controller has the heater heat the solder member when the measured temperature of the solder member is lower than or equal to the predetermined temperature, and has the heater stop heating the solder member, when the measured temperature of the solder member is higher than the predetermined temperature.

Abstract: A fan speed testing system for testing a testing fan includes a testing fan, a collecting module, a processing module, a converting module; and a displaying module. A label is attached to the testing fan and capable of rotating with the testing fan. The collecting module is configured to collect light reflected off of the label as the fan rotates in order to produce a pulse signal. The processing module is configured to adjust the pulse signal to be a standard square wave. The converting module is configured to obtain a fan speed data of the testing fan according to conversion times between high levels and low levels of the standard square wave. The displaying module is configured to display the fan speed data.

Abstract: A test system includes a testing power supply unit which includes a rectifier and filter circuit and a voltage output circuit, a dropping voltage circuit which includes a primary coil and a secondary coil, a PWM regulator, and a control circuit. The rectifier and filter circuit receives an AC voltage and converts the AC voltage into a square wave signal. The primary coil is connected to the rectifier and filter circuit and receives the square wave signal. The secondary coil is connected to the voltage output circuit. The PWM regulator is connected to the primary coil. The PWM regulator generates a pulse signal to turn on and turn off the primary coil periodically. The control circuit is connected to the PWM regulator. The control circuit controls a duty cycle of the pulse signal to adjust time of the primary coil being on in a cycle.

Abstract: A drop test apparatus performs a drop test on a product. The drop test apparatus includes a drop control module and a support module. The drop control module includes a bottom plate and a support beam substantially perpendicularly attached to the bottom plate. The support module is attached at a predetermined height to the support beam and includes a lever for detecting whether the product is placed in a desired position. A support panel is disposed at a first end of the lever for supporting the product. A second end of the lever is under a predetermined force for maintaining the lever in a balanced state when the product is placed in the desired position.

Abstract: A motherboard testing apparatus for testing a motherboard by subjecting it to sequential power-on and power-off modes includes a control module, a switch module and a display module. The control module stores power-on and power-off number of times and outputs control signals accordingly. The switch module provides a first voltage to the motherboard according to the control signals. The switch module includes a photocoupler and a delay. The photocoupler includes an LED and a phototransistor. The delay includes a winding element and a switch element. The display module displays the time periods and the number of times the motherboard abnormally power-on and power-off. The LED receives the control signals. The phototransistor turns on when the LED emits light. The winding element is powered up and closes the switch element. The switch element outputs the first voltage.

Abstract: A drop test device for testing any deviation between the gravity line of an object and a defined vertical orientation includes a dropping machine and a drop panel installed on the dropping machine. The drop panel includes a support board, a plurality of restriction boards fixed on the support board, a plurality of rollers mounted on the support board and a sliding board positioned on the plurality of rollers for supporting the object. The sliding board is positioned between the plurality of restriction boards and slides on the plurality of rollers. If the gravity line of the object is not on the same line as a supportive strength line of the object, the sliding board moves on the support board and triggers the plurality of restriction boards.

Abstract: An interface card comprising a graphic unit, an outputting interface, an inputting interface, an assigning processor and a card body is disclosed. The inputting interface is used for receiving a PCIE inputting signal. When the inputting interface is electrically connected to a CPU via a connector, the PCIE inputting signal is inputted to the assigning processor via an inputting interface. The assigning processor assigns a PCIE outputting signal to a graphic unit according to the PCIE inputting signal, and further assigns another PCIE outputting signal to another graphic unit according to the PCIE inputting signal when the outputting interface is externally connected to another graphic unit. The card body is used for placing the graphic unit, the outputting interface, the assigning processor and the inputting interface.

Abstract: A detecting device for performing fatigue tests on a pivoting piece includes a clamping module and an actuating module. The clamping module clamps the pivoting piece. The actuating module includes an elastic actuating shaft abutting the clamping module and a resilient member mounted in the elastic actuating shaft. The resilient member is adapted to push forward against spring pressure and retract by the release of spring tension so as to achieve cyclic movements in the pivoting piece.

Abstract: A test support apparatus includes a supporting mechanism supporting a product, a holding post pressed on the product, a positioning assembly, an operating member and a clamping member. The positioning assembly is attached to the supporting mechanism and the holding post. The positioning assembly includes a positioning member and a moving member. The moving member is attached to the holding post, and moveably relative to the positioning member to adjust a distance between the holding post and the supporting mechanism. The operating member is rotatably attached to the positioning member. The clamping member is rotatably attached to the operating member and rotatable relative to the operating member about a first axis. The clamping member engaged with the supporting mechanism, and the operating member is rotatable relative to the positioning member about a second axis to rotate the clamping member about the first axis to disengaged from the supporting mechanism.

Abstract: A mounting apparatus for securing electronic devices is disclosed. The mounting apparatus comprises a base; two supports secured to the base; a positioning member located in each of the two supports, wherein the positioning member and each of the two supports are configured to move relative to each other along an axis parallel to a surface of the base, and the positioning member has a tooth-faced side with a plurality of first teeth; a securing member having a plurality of second teeth, wherein the securing member is adapted to engage with the positioning member by meshing the plurality of second teeth and the plurality of first teeth, and the securing member is slidable towards the base along the position member; and two resilient members located in each of the two supports, wherein the two resilient members maintains engagement between the plurality of first teeth and the plurality of second teeth.

Abstract: A solder apparatus includes a platform, an operating mechanism, a solder member, a heater, and a control box module. The control box module includes a temperature controller and a temperature sensor. The temperature controller defines a predetermined temperature. The temperature sensor is capable of measuring the temperature of the solder member. The temperature controller has the heater heat the solder member when the measured temperature of the solder member is lower than or equal to the predetermined temperature, and has the heater stop heating the solder member, when the measured temperature of the solder member is higher than the predetermined temperature.

Abstract: A testing apparatus includes a support mechanism, a pushing device, and a clamping device secured to the driving member. The clamping device secures a product. The pushing device includes a guiding pipe, a driving member moveably attached to the guiding pipe, and an elastic member received in the guiding pipe. The elastic member is connected to a first end of the driving member. The first end of the driving member is received in the guiding pipe. The clamping device is secured to the driving member. Wherein the guiding pipe is adapted to receive air, the driving member is adapted to be driven by air to move along a first direction, and the elastic member is adapted to rebound to pull the driving member to move along a second direction opposite to the first direction.