Patents by Inventor Yu Min LIM

Yu Min LIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11959886
    Abstract: The present invention relates to a scanner having a flexible probe which is an apparatus capable of being utilized for an inspection on a weld zone of a general ferrite material and a stainless material and allowing an inspection to be performed on a fitting weld zone where it is difficult for a general phased array ultrasonic testing (PAUT) probe to approach.
    Type: Grant
    Filed: November 18, 2020
    Date of Patent: April 16, 2024
    Assignees: Foundation for Research and Business, Seoul National University of Science and Technology, Korea Inspection Eng.Co., Ltd
    Inventors: Ik Keun Park, Yu Min Choi, Seong Jin Lim, In Gon Jung, Hye Jin Park
  • Publication number: 20240054652
    Abstract: A semantic segmentation method performed by at least one computing device is provided. The method may include extracting a plurality of support features, which include a first-level feature and a second-level feature, from a support image; generating a plurality of prototypes for a class associated with the support image, based on the plurality of support features; and predicting a segmentation mask for a query image using the plurality of prototypes, wherein the plurality of prototypes comprise a first prototype generated based on the first-level feature and a second prototype generated based on the second-level feature.
    Type: Application
    Filed: August 7, 2023
    Publication date: February 15, 2024
    Applicant: SAMSUNG SDS CO., LTD.
    Inventors: Do Young PARK, Sun Jin KIM, Min Kyu KIM, Reddy Yarram NARESH, Yu Min LIM