Abstract: According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.

Abstract: According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.

Abstract: According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.

Abstract: According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.

Abstract: A semiconductor device includes an electronic circuit, a setting processor, and a voltage generator. The electronic circuit includes a transistor. The setting processor changes a value of an operating voltage to be supplied to the electronic circuit from a first value to a second value smaller than the first value, according to a characteristic of the transistor. The voltage generator generates the operating voltage at a value set by the setting processor. The first value and the second value are decided in consideration of a variation in the characteristic of the transistor due to a variation in the electronic circuit during manufacture.

Abstract: The vessel for sealingly storing liquid therein comprises a cylindrical trunk member of rectangular cross-section having at least an open end and made of a laminated sheet material having a thermally bonding synthetic resin layer on the inner surface thereof and at least one end member having an axially extending flange portion having a thermally bonding synthetic resin layer on the outer surface thereof, the flange portion of the end member being adapted to be fitted in the open end of the trunk member so as to be thermally bonded thereto for forming hermetical sealing therebetween. An outwardly projecting thin axial ear portion is formed at the respective corner of the flange portion of the end member by the thermally bonding synthetic resin layer provided on the outer surface of the flange portion.