Abstract: The purpose of the present invention is to provide a novel anthraquinone compound, and to provide: a dichroic dye constituted of the novel anthraquinone compound; a liquid crystal composition which contains the dichroic dye; and preferably a dimming element having excellent contrast and light resistance and containing said composition. The present invention discloses an anthraquinone compound represented by formula A below (wherein R1 represents a C3-16 branched alkyl group, and R2 represents a hydrogen atom, a C1-8 straight-chain or branched alkyl group, or a C1-8 straight-chain or branched alkoxy group). In addition, the present invention discloses a liquid crystal composition including the anthraquinone compound and a liquid crystal material, and a dimming element containing said composition.

Abstract: A method for detecting a substance to be detected, which comprises bringing a) a first recognizing substance bound to a fibrous substance, b) a second recognizing substance which is labeled, and c) a substance to be detected, provided that the first recognizing substance and the second recognizing substance are capable of being bound to the substance to be detected, into contact with one another in a dispersed state so as to form a complex in which the above a, b and c are bound together, separating the complex and an unbound b, and detecting the label of the obtained complex.

Abstract: The invention provides an assay method for an assay system using an anti-immunocomplex antibody, which is able to increase reaction efficiency. The n immunoassay method uses: an anti-hapten rabbit monoclonal antibody immobilized on a water-insoluble carrier, and a labeled anti-immunocomplex antibody, wherein the method comprises the following steps (i) to (iii): (i) a step of reacting the anti-hapten rabbit monoclonal antibody immobilized on the water-insoluble carrier with a hapten in a solution to be measured, (ii) a step of reacting the labeled anti-immunocomplex antibody with the hapten-anti-hapten rabbit monoclonal antibody immune complex, and (iii) a step of detecting the signal from the label.

Abstract: To provide a measurement system in which the reaction rate of the antigen-antibody reaction is high, and a B/F separation step can easy be carried out. A method for detecting a substance to be detected, which comprises bringing a) a first recognizing substance bound to a fibrous substance, b) a second recognizing substance which is labeled, and c) a substance to be detected, provided that the first recognizing substance and the second recognizing substance are capable of being bound to the substance to be detected, into contact with one another in a dispersed state so as to form a complex in which the above a, b and c are bound together, separating the complex and an unbound b, and detecting the label of the obtained complex.

Abstract: A subject matter of this invention is that a manufacturing yield of a semiconductor device is improved. A resistance value between a pogo pin and a test pin is measured by bringing a plurality of pogo pins of a socket mounted over a test board included in an inspection device of a semiconductor device into contact with a plurality of solder balls, respectively, and bringing the test pin provided in the socket into contact with a first solder ball of a plurality of solder balls at a position different from a position where the pogo pin is brought into contact with the first solder ball. Thereby, a coupling failure between the pogo pin and the first solder ball is detected, so that a conductive state is inspected.

Abstract: A subject matter of this invention is that a manufacturing yield of a semiconductor device is improved. A resistance value between a pogo pin and a test pin is measured by bringing a plurality of pogo pins of a socket mounted over a test board included in an inspection device of a semiconductor device into contact with a plurality of solder balls, respectively, and bringing the test pin provided in the socket into contact with a first solder ball of a plurality of solder balls at a position different from a position where the pogo pin is brought into contact with the first solder ball. Thereby, a coupling failure between the pogo pin and the first solder ball is detected, so that a conductive state is inspected.