Patents by Inventor Yu Na WANG

Yu Na WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for testing semiconductor manufacturing equipment automation program
    Patent number: 9804953
    Abstract: A method for testing an equipment automation program may be implemented using a hardware device and may include the following steps: receiving user input through a user interface of the device; automatically identifying a test scenario based on the user input; automatically and sequentially fetching a plurality of messages according to the test scenario; and automatically and sequentially sending the messages to the equipment automation program.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: October 31, 2017
    Assignee: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
    Inventor: Yu Na Wang
  • METHOD AND DEVICE FOR TESTING SEMICONDUCTOR MANUFACTURING EQUIPMENT AUTOMATION PROGRAM
    Publication number: 20160140024
    Abstract: A method for testing an equipment automation program may be implemented using a hardware device and may include the following steps: receiving user input through a user interface of the device; automatically identifying a test scenario based on the user input; automatically and sequentially fetching a plurality of messages according to the test scenario; and automatically and sequentially sending the messages to the equipment automation program.
    Type: Application
    Filed: September 29, 2015
    Publication date: May 19, 2016
    Inventor: Yu Na WANG