Abstract: Machine logic (for example, software) for determining a placement mode of at least one kind of objects in a multiplicity of storage areas are disclosed. A placement method includes the following operations: determining attraction factors of the multiplicity of storage areas, an attraction factor of each storage area indicating a capability that the storage area attracts attention of a customer; determining a spatial elasticity factor of the at least one kind of objects, a spatial elasticity factor of each kind of objects indicating an impact of a change of the storage areas where the kind of objects are placed on an attention degree of the kind of objects; and determining the placement mode of the objects in the multiplicity of storage areas, at least according to the attraction factors of the multiplicity of storage areas and the spatial elasticity factor of the at least one kind of objects.

Abstract: Machine logic (for example, software) for determining a placement mode of at least one kind of objects in a multiplicity of storage areas are disclosed. A placement method includes the following operations: determining attraction factors of the multiplicity of storage areas, an attraction factor of each storage area indicating a capability that the storage area attracts attention of a customer; determining a spatial elasticity factor of the at least one kind of objects, a spatial elasticity factor of each kind of objects indicating an impact of a change of the storage areas where the kind of objects are placed on an attention degree of the kind of objects; and determining the placement mode of the objects in the multiplicity of storage areas, at least according to the attraction factors of the multiplicity of storage areas and the spatial elasticity factor of the at least one kind of objects.

Abstract: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

Abstract: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

Abstract: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

Abstract: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.