Patents by Inventor Yu-Ra KIM

Yu-Ra KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10529784
    Abstract: There are disclosed a temperature sensor and a method for manufacturing the same. The temperature sensor comprises; a sensor unit including an organic light emitting layer including a delayed fluorescent material; a temperature transfer unit located below the sensor unit to transfer an external temperature to the sensor unit; a first electrode located on the sensor unit; a second electrode located below the sensor unit to be spaced apart from the temperature transfer unit; and a light intensity measuring unit located below the second electrode and measuring the intensity of light emitted from the organic light emitting layer. The temperature sensor can measure a temperature by using a change in the intensity of light using delayed fluorescence, thereby providing improved sensitivity.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: January 7, 2020
    Assignee: LG DISPLAY CO., LTD.
    Inventors: Tae Whan Kim, Young Pyo Jeon, Yong Hoon Choi, Yu Ra Kim
  • Publication number: 20180122872
    Abstract: There are disclosed a temperature sensor and a method for manufacturing the same. The temperature sensor comprises; a sensor unit including an organic light emitting layer including a delayed fluorescent material; a temperature transfer unit located below the sensor unit to transfer an external temperature to the sensor unit; a first electrode located on the sensor unit; a second electrode located below the sensor unit to be spaced apart from the temperature transfer unit; and a light intensity measuring unit located below the second electrode and measuring the intensity of light emitted from the organic light emitting layer. The temperature sensor can measure a temperature by using a change in the intensity of light using delayed fluorescence, thereby providing improved sensitivity.
    Type: Application
    Filed: March 28, 2016
    Publication date: May 3, 2018
    Applicant: LG DISPLAY CO., LTD.
    Inventors: Tae Whan KIM, Young Pyo JEON, Yong Hoon CHOI, Yu Ra KIM
  • Patent number: 9567576
    Abstract: The present application relates to a strain expressing the FrsA protein, and a method for producing ethanol using the same. The FrsA of the present application has a high PDC enzyme activity for a pyruvate, which is a substrate, and thus can be used in a process for producing ethanol. In addition, an FrsA mutant having improved stability in a host cell can be more effective in producing ethanol due to the increase in stability when the FrsA mutant is overexpressed together with IIAGlc, compared with when using conventional Zymomonas mobilis-derived PDC.
    Type: Grant
    Filed: October 18, 2013
    Date of Patent: February 14, 2017
    Assignee: SOGANG UNIVERSITY RESEARCH FOUNDATION
    Inventors: Kyung-Jo Lee, Yu Ra Kim, Jung Kee Lee, Sun-Shin Cha, Kyu-Ho Lee
  • Patent number: 9379019
    Abstract: In a method, an isolation layer pattern is formed on a substrate to define first and second active fins. An ARC layer is formed on the isolation layer pattern to at least partially cover sidewalls of the first and second active fins. A level of a top surface of the ARC layer is equal to or less than, and equal to or greater than half of, those of the first and second active fins. A photoresist layer is formed on the first and second active fins and the ARC layer. A portion of the photoresist layer is removed to form a photoresist pattern covering the first active fin and exposing the second active fin. A portion of the ARC layer under the removed portion of the photoresist layer is removed to form an ARC layer pattern. Impurities are implanted into the exposed second active fin to form an impurity region.
    Type: Grant
    Filed: May 1, 2015
    Date of Patent: June 28, 2016
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Bum-Joon Youn, Tae-Sun Kim, Yeo-Jin Lee, Yu-Ra Kim, Jin-Man Kim, Jae-Kyung Seo, Ki-Man Lee
  • Publication number: 20160099177
    Abstract: In a method, an isolation layer pattern is formed on a substrate to define first and second active fins. An ARC layer is formed on the isolation layer pattern to at least partially cover sidewalls of the first and second active fins. A level of a top surface of the ARC layer is equal to or less than, and equal to or greater than half of, those of the first and second active fins. A photoresist layer is formed on the first and second active fins and the ARC layer. A portion of the photoresist layer is removed to form a photoresist pattern covering the first active fin and exposing the second active fin. A portion of the ARC layer under the removed portion of the photoresist layer is removed to form an ARC layer pattern. Impurities are implanted into the exposed second active fin to form an impurity region.
    Type: Application
    Filed: May 1, 2015
    Publication date: April 7, 2016
    Inventors: Bum-Joon YOUN, Tae-Sun KIM, Yeo-Jin LEE, Yu-Ra KIM, Jin-Man KIM, Jae-Kyung SEO, Ki-Man LEE
  • Publication number: 20150299686
    Abstract: The present application relates to a strain expressing the FrsA protein, and a method for producing ethanol using the same. The FrsA of the present application has a high PDC enzyme activity for a pyruvate, which is a substrate, and thus can be used in a process for producing ethanol.
    Type: Application
    Filed: October 18, 2013
    Publication date: October 22, 2015
    Applicant: SOGANG UNIVERSITY RESEARCH FOUNDATION
    Inventors: Kyung-Jo LEE, Yu Ra KIM, Jung Kee LEE, Sun-Shin CHA, Kyu-Ho LEE
  • Patent number: 9123655
    Abstract: A method of manufacturing a layer pattern of a semiconductor device, the method including forming an anti-reflective coating (ARC) layer on an etching object layer such that the ARC layer includes a polymer having an imide group; forming a photoresist pattern on the ARC layer; wet etching portions of the ARC layer exposed by the photoresist pattern to form an ARC layer pattern; and etching the etching object layer using the photoresist pattern as an etch mask to form the layer pattern.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: September 1, 2015
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Tae-Hwan Oh, Yu-Ra Kim, Tae-Sun Kim, Kwang-Sub Yoon
  • Publication number: 20140242800
    Abstract: A method of manufacturing a layer pattern of a semiconductor device, the method including forming an anti-reflective coating (ARC) layer on an etching object layer such that the ARC layer includes a polymer having an imide group; forming a photoresist pattern on the ARC layer; wet etching portions of the ARC layer exposed by the photoresist pattern to form an ARC layer pattern; and etching the etching object layer using the photoresist pattern as an etch mask to form the layer pattern.
    Type: Application
    Filed: February 26, 2014
    Publication date: August 28, 2014
    Applicant: SAMSUNG ELECTRONICS CO., LTD
    Inventors: Tae-Hwan OH, Yu-Ra KIM, Tae-Sun KIM, Kwang-Sub YOON