Patents by Inventor Yu Sze Cheung
Yu Sze Cheung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11592477Abstract: A test handler comprising a primary rotary turret comprising pick heads for transporting electronic components, and a secondary rotary turret arranged and configured to receive electronic components directly or indirectly from the primary rotary turret, the secondary rotary turret including multiple separate test sectors having component carriers for carrying the electronic components received from the primary rotary turret, wherein the multiple test sectors are rotatably movable relative to one another. The test handler also comprises at least one testing device positioned along a periphery of the secondary rotary turret, wherein the component carriers of the respective test sectors are operative to convey the electronic components to a position of the at least one testing device for testing.Type: GrantFiled: September 6, 2019Date of Patent: February 28, 2023Assignee: ASMPT SINGAPORE PTE. LTD.Inventors: Chi Wah Cheng, Kai Fung Lau, Yu Sze Cheung
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Patent number: 10996308Abstract: A testing apparatus and a method for testing electronic devices is provided. The apparatus comprising a plurality of detachably mountable test stations which are operative to perform tests on the electronic devices and a plurality of pick heads for conveying the electronic devices to at least one of the plurality of test stations for testing. The apparatus further comprises an identification element incorporated in each test station indicating a characteristic of the test station, and an identification element detector movable relative to the plurality of test stations, the identification element detector being operative to identify and authenticate the characteristic of the at least one test station by detecting the identification element incorporated in the test station, prior to utilizing the test station for testing the electronic devices.Type: GrantFiled: April 17, 2018Date of Patent: May 4, 2021Inventors: Chi Wah Cheng, Yu Sze Cheung
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Publication number: 20200341056Abstract: A test handler comprising a primary rotary turret comprising pick heads for transporting electronic components, and a secondary rotary turret arranged and configured to receive electronic components directly or indirectly from the primary rotary turret, the secondary rotary turret including multiple separate test sectors having component carriers for carrying the electronic components received from the primary rotary turret, wherein the multiple test sectors are rotatably movable relative to one another. The test handler also comprises at least one testing device positioned along a periphery of the secondary rotary turret, wherein the component carriers of the respective test sectors are operative to convey the electronic components to a position of the at least one testing device for testing.Type: ApplicationFiled: September 6, 2019Publication date: October 29, 2020Inventors: Chi Wah CHENG, Kai Fung LAU, Yu Sze CHEUNG
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Patent number: 10699932Abstract: An apparatus and a method for inspecting a substantially transparent semiconductor device are provided, where the method comprises the steps of holding the substantially transparent semiconductor device with a semiconductor device holder, and illuminating a surface of the semiconductor device held by the semiconductor device holder from multiple directions with an enveloping light source. Thereafter, capturing a first image of the semiconductor device with an imaging module from the light projected from the enveloping light source, the first image revealing a direction of grinding marks on the said surface of the transparent semiconductor device.Type: GrantFiled: April 10, 2018Date of Patent: June 30, 2020Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Yu Sze Cheung, Man Yin Kwan
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Patent number: 10473714Abstract: A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing which includes defining a fiducial marker and positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device. The moveable imaging device determines, with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker. The stationary imaging device determines, with respect to each electronic component, a second offset between the electronic component and the fidicual marker. Alignment is effected between each electronic component and the testing device in accordance with the first and second offsets.Type: GrantFiled: March 6, 2017Date of Patent: November 12, 2019Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Chi Wah Cheng, Chi Hung Leung, Yu Sze Cheung, Kai Fung Lau
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Publication number: 20190317174Abstract: A testing apparatus and a method for testing electronic devices is provided. The apparatus comprising a plurality of detachably mountable test stations which are operative to perform tests on the electronic devices and a plurality of pick heads for conveying the electronic devices to at least one of the plurality of test stations for testing. The apparatus further comprises an identification element incorporated in each test station indicating a characteristic of the test station, and an identification element detector movable relative to the plurality of test stations, the identification element detector being operative to identify and authenticate the characteristic of the at least one test station by detecting the identification element incorporated in the test station, prior to utilizing the test station for testing the electronic devices.Type: ApplicationFiled: April 17, 2018Publication date: October 17, 2019Inventors: Chi Wah CHENG, Yu Sze CHEUNG
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Publication number: 20190311931Abstract: An apparatus and a method for inspecting a substantially transparent semiconductor device are provided, where the method comprises the steps of holding the substantially transparent semiconductor device with a semiconductor device holder, and illuminating a surface of the semiconductor device held by the semiconductor device holder from multiple directions with an enveloping light source. Thereafter, capturing a first image of the semiconductor device with an imaging module from the light projected from the enveloping light source, the first image revealing a direction of grinding marks on the said surface of the transparent semiconductor device.Type: ApplicationFiled: April 10, 2018Publication date: October 10, 2019Inventors: Yu Sze CHEUNG, Man Yin KWAN
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Patent number: 10324126Abstract: A method for aligning probe pins with respect to positions of electronic devices comprises conducting contact stamping on a first electronic device with the probe pins to form first probe marks on lead pads of the first electronic device, capturing an image of the first electronic device, determining positions of the first probe marks on the first electronic device using the captured image, calculating an offset using the positions of the first probe marks, adjusting relative positions between a subsequent plurality of electronic devices and the probe pins using the offset, and contacting lead pads of the subsequent plurality of electronic devices with the probe pins for testing said electronic devices. The first probe marks are configured to have greater visibility as compared with second probe marks formed when contacting the lead pads of the subsequent plurality of electronic devices with the probe pins, so as to improve the accuracy of the offset calculated.Type: GrantFiled: June 10, 2016Date of Patent: June 18, 2019Assignee: ASM TECHNOLOGY SINGAPORE PTE LTD.Inventors: Yu Sze Cheung, Hon Kam Ng, Chun Shing Yip
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Patent number: 10151774Abstract: Disclosed are an electrical contact for contacting an electrical component, an apparatus for testing an electrical component and a method of assembling an apparatus comprising an electrical contact for testing an electrical component.Type: GrantFiled: June 10, 2015Date of Patent: December 11, 2018Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Yu Sze Cheung, Kai Fung Lau
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Patent number: 10115620Abstract: Disclosed is an apparatus for handling electronic components and a method of adjusting the position of at least one handling device of an apparatus for handling electronic components.Type: GrantFiled: August 31, 2015Date of Patent: October 30, 2018Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Yu Sze Cheung, Chi Wah Cheng, Chi Fung Chan
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Patent number: 10091919Abstract: An apparatus for securing electronic devices on a carrier for storing electronic devices during transportation of the electronic devices on the carrier has a guiding track for guiding motion of the carrier when the carrier receives electronic devices. A magnetic track located adjacent to the guiding track attracts the electronic devices onto the carrier with a magnetic attraction force. In particular, the magnetic track has a support surface facing the carrier that has a smaller width than a width of a portion of the magnetic track that is spaced from the support surface.Type: GrantFiled: February 23, 2017Date of Patent: October 2, 2018Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Yan Yiu Lam, Shing Kai Yip, Yu Sze Cheung
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Publication number: 20180252766Abstract: A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing which includes defining a fiducial marker and positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device. The moveable imaging device determines, with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker. The stationary imaging device determines, with respect to each electronic component, a second offset between the electronic component and the fidicual marker. Alignment is effected between each electronic component and the testing device in accordance with the first and second offsets.Type: ApplicationFiled: March 6, 2017Publication date: September 6, 2018Inventors: Chi Wah CHENG, Chi Hung LEUNG, Yu Sze CHEUNG, Kai Fung LAU
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Publication number: 20180242481Abstract: An apparatus for securing electronic devices on a carrier for storing electronic devices during transportation of the electronic devices on the carrier has a guiding track for guiding motion of the carrier when the carrier receives electronic devices. A magnetic track located adjacent to the guiding track attracts the electronic devices onto the carrier with a magnetic attraction force. In particular, the magnetic track has a support surface facing the carrier that has a smaller width than a width of a portion of the magnetic track that is spaced from the support surface.Type: ApplicationFiled: February 23, 2017Publication date: August 23, 2018Inventors: Yan Yiu LAM, Shing Kai YIP, Yu Sze CHEUNG
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Patent number: 9850074Abstract: A feeding apparatus for supplying electronic devices for pick-up comprises a guide track for guiding and feeding a plurality of electronic devices and a separator operative to receive electronic devices from the guide track for the electronic devices to be picked up from the separator. A protrusion is located on either of the guide track or the separator, and a cavity is located on the other of the guide track or the separator for receiving the protrusion. The protrusion and the cavity cooperate to form a substantially continuous surface for transferring the electronic devices to the separator.Type: GrantFiled: April 4, 2016Date of Patent: December 26, 2017Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Shing Kai Yip, Yu Sze Cheung, Chi Wah Cheng
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Publication number: 20170356958Abstract: A method for aligning probe pins with respect to positions of electronic devices comprises conducting contact stamping on a first electronic device with the probe pins to form first probe marks on lead pads of the first electronic device, capturing an image of the first electronic device, determining positions of the first probe marks on the first electronic device using the captured image, calculating an offset using the positions of the first probe marks, adjusting relative positions between a subsequent plurality of electronic devices and the probe pins using the offset, and contacting lead pads of the subsequent plurality of electronic devices with the probe pins for testing said electronic devices. The first probe marks are configured to have greater visibility as compared with second probe marks formed when contacting the lead pads of the subsequent plurality of electronic devices with the probe pins, so as to improve the accuracy of the offset calculated.Type: ApplicationFiled: June 10, 2016Publication date: December 14, 2017Inventors: Yu Sze CHEUNG, Hon Kam NG, Chun Shing YIP
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Publication number: 20170283178Abstract: A feeding apparatus for supplying electronic devices for pick-up comprises a guide track for guiding and feeding a plurality of electronic devices and a separator operative to receive electronic devices from the guide track for the electronic devices to be picked up from the separator. A protrusion is located on either of the guide track or the separator, and a cavity is located on the other of the guide track or the separator for receiving the protrusion. The protrusion and the cavity cooperate to form a substantially continuous surface for transferring the electronic devices to the separator.Type: ApplicationFiled: April 4, 2016Publication date: October 5, 2017Inventors: Shing Kai YIP, Yu Sze CHEUNG, Chi Wah CHENG
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Patent number: 9606171Abstract: A test handler comprises a main rotary turret and a loading station operative to convey electronic components to functional modules of the main rotary turret. An auxiliary rotary turret incorporating multiple carrier modules then receives electronic components from the functional modules of the main rotary turret. Multiple testing stations located along a periphery of the auxiliary turret are operative to receive electronic components from the carrier modules for testing while the loading station is concurrently conveying electronic components to the functional modules of the main rotary turret, so that the impact of transfer time is reduced or eliminated in a test process cycle of the test handler.Type: GrantFiled: January 28, 2015Date of Patent: March 28, 2017Assignee: ASM TECHNOLOGY SINGAPORE PTE LTDInventors: Yu Sze Cheung, Kai Fung Lau
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Publication number: 20170062256Abstract: Disclosed is an apparatus for handling electronic components and a method of adjusting the position of at least one handling device of an apparatus for handling electronic components.Type: ApplicationFiled: August 31, 2015Publication date: March 2, 2017Inventors: Yu Sze CHEUNG, Chi Wah CHENG, Chi Fung CHAN
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Patent number: 9561914Abstract: An apparatus for conveying electronic devices comprises a track for conveying a plurality of electronic devices in a row towards a pick-up position on the track where the electronic devices are removed by a pick-up device. A guiding portion located over the track has a first restraining mechanism formed in the guiding portion that is operative to restrain and secure a first electronic device at a first position next to the pick-up position and a second restraining mechanism formed in the guiding portion that is operative to restrain and secure a second electronic device at a second position away from the pick-up position which is immediately subsequent to the first position. The first and second electronic devices are configured to be released and conveyed towards the pick-up position when the first and second restraining mechanisms respectively are deactivated. A corresponding method is also provided.Type: GrantFiled: October 13, 2015Date of Patent: February 7, 2017Assignee: ASM TECHNOLOGY SINGAPORE PTE. LTDInventors: Shing Kai Yip, Yu Sze Cheung, Chi Wah Cheng
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Publication number: 20160363610Abstract: Disclosed are an electrical contact for contacting an electrical component, an apparatus for testing an electrical component and a method of assembling an apparatus comprising an electrical contact for testing an electrical component.Type: ApplicationFiled: June 10, 2015Publication date: December 15, 2016Inventors: Yu Sze CHEUNG, Kai Fung LAU