Patents by Inventor Yu-Ta Wang
Yu-Ta Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20240098960Abstract: An integrated circuit structure in which a gate overlies channel region in an active area of a first transistor. The first transistor includes a channel region, a source region and a drain region. A conductive contact is coupled to the drain region of the first transistor. A second transistor that includes a channel region, a source region a drain region is adjacent to the first transistor. The gate of the second transistor is spaced from the gate of the first transistor. A conductive via passes through an insulation layer to electrically connect to the gate of the second transistor. An expanded conductive via overlays both the conductive contact and the conductive via to electrically connect the drain of the first transistor to the gate of the second transistor.Type: ApplicationFiled: November 22, 2023Publication date: March 21, 2024Inventors: YU-KUAN LIN, CHANG-TA YANG, PING-WEI WANG, KUO-YI CHAO, MEI-YUN WANG
-
Patent number: 11916155Abstract: An optoelectronic package and a method for producing the optoelectronic package are provided. The optoelectronic package includes a carrier, a photonic device, a first encapsulant and a second encapsulant. The photonic device is disposed on the carrier. The first encapsulant covers the carrier and is disposed around the photonic device. The second encapsulant covers the first encapsulant and the photonic device. The first encapsulant has a topmost position and a bottommost position, and the topmost position is not higher than a surface of the photonic device.Type: GrantFiled: May 21, 2021Date of Patent: February 27, 2024Assignees: LITE-ON OPTO TECHNOLOGY (CHANGZHOU) CO., LTD., LITE-ON TECHNOLOGY CORPORATIONInventors: Chien-Hsiu Huang, Bo-Jhih Chen, Kuo-Ming Chiu, Meng-Sung Chou, Wei-Te Cheng, Kai-Chieh Liang, Yun-Ta Chen, Yu-Han Wang
-
Patent number: 8610900Abstract: The present invention relates to an apparatus for low coherence optical imaging, and more particularly to an apparatus for low coherence optical imaging which can obtain the information of the different depths of a sample simultaneously. The apparatus comprises a phase transformation unit or a beam shift unit. The phase transformation unit or beam shift unit transforms and reflects the reference light, such that the reflected reference light comprises different phases at the different positions of a cross-section. When the reference light and a information light from the sample are superimposed on a photo detector, the information of the different depths of the sample is obtained. By using the apparatus of the present invention, the elements, the volume, and the cost of the apparatus are reduced. Because of only two-dimensional scanning is required, the scanning rate is improved.Type: GrantFiled: December 14, 2012Date of Patent: December 17, 2013Assignee: National Taiwan UniversityInventors: Yu-Ta Wang, Po-Kai Hsu, Sheng-Lung Huang
-
Patent number: 8582110Abstract: The present invention relates to an apparatus for low coherence optical imaging, and more particularly to an apparatus for low coherence optical imaging which can obtain the information of the different depths of a sample simultaneously. The apparatus comprises a phase transformation unit or a beam shift unit. The phase transformation unit or beam shift unit transforms and reflects the reference light, such that the reflected reference light comprises different phases at the different positions of a cross-section. When the reference light and a information light from the sample are superimposed on a photo detector, the information of the different depths of the sample is obtained. By using the apparatus of the present invention, the elements, the volume, and the cost of the apparatus are reduced. Because of only two-dimensional scanning is required, the scanning rate is improved.Type: GrantFiled: July 22, 2010Date of Patent: November 12, 2013Assignee: National Taiwan UniversityInventors: Yu-Ta Wang, Po-Kai Hsu, Sheng-Lung Huang
-
Patent number: 8493568Abstract: The present invention relates to an optical imaging apparatus and a method, and more particularly to an optical imaging apparatus and a method with short coherence length optical source. The apparatus comprises an optical source with a plurality of outputs for providing a reference light and a sample light; a sample probe module for leading the sample light to a sample, and leading an information light out; an interference module for leading the reference light to a photo detector, and leading the information light to the photo detector; and a signal processing unit electrically coupled to the photo detector; wherein the reference light and the information light are superimposed on the photo detector, an interference light pattern is detected by the photo detector, and a signal that represents the interference light pattern is transmitted to said signal processing unit for analyzing the spatial information of the sample.Type: GrantFiled: July 6, 2009Date of Patent: July 23, 2013Assignee: National Taiwan UniversityInventors: Yu-Ta Wang, Po-Kai Hsu, Kuang-Yu Hsu, Dong-Yo Jheng, Chien-Chung Tsai, Sheng-Lung Huang
-
Publication number: 20120293805Abstract: An interference measuring apparatus comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam. The first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object.Type: ApplicationFiled: July 6, 2012Publication date: November 22, 2012Inventors: Chien-Chung TSAI, Dong-Yo Jheng, Yu-Ta Wang, Yen-Sheng Lin, Kuang-Yu Hsu, Sheng-Lung Huang
-
Publication number: 20110235048Abstract: The present invention relates to an apparatus for low coherence optical imaging, and more particularly to an apparatus for low coherence optical imaging which can obtain the information of the different depths of a sample simultaneously. The apparatus comprises a phase transformation unit or a beam shift unit. The phase transformation unit or beam shift unit transforms and reflects the reference light, such that the reflected reference light comprises different phases at the different positions of a cross-section. When the reference light and a information light from the sample are superimposed on a photo detector, the information of the different depths of the sample is obtained. By using the apparatus of the present invention, the elements, the volume, and the cost of the apparatus are reduced. Because of only two-dimensional scanning is required, the scanning rate is improved.Type: ApplicationFiled: July 22, 2010Publication date: September 29, 2011Inventors: Yu-Ta WANG, Po-Kai Hsu, Sheng-Lung Huang
-
Publication number: 20110037986Abstract: The present invention discloses an interference measuring apparatus, which comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam, wherein the first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object.Type: ApplicationFiled: December 31, 2009Publication date: February 17, 2011Inventors: Chien-Chung TSAI, Dong-Yo Jheng, Yu-Ta Wang, Yen-Sheng Lin, Kuang-Yu Hsu, Sheng-Lung Huang
-
Publication number: 20110001982Abstract: The present invention relates to an optical imaging apparatus and a method, and more particularly to an optical imaging apparatus and a method with short coherence length optical source. The apparatus comprises an optical source with a plurality of outputs for providing a reference light and a sample light; a sample probe module for leading the sample light to a sample, and leading an information light out; an interference module for leading the reference light to a photo detector, and leading the information light to the photo detector; and a signal processing unit electrically coupled to the photo detector; wherein the reference light and the information light are superimposed on the photo detector, an interference light pattern is detected by the photo detector, and a signal that represents the interference light pattern is transmitted to said signal processing unit for analyzing the spatial information of the sample.Type: ApplicationFiled: July 6, 2009Publication date: January 6, 2011Inventors: Yu-Ta Wang, Po-Kai Hsu, Kuang-Yu Hsu, Dong-Yo Jheng, Chien-Chung Tsai, Sheng-Lung Huang