Patents by Inventor Yu TESHIMA

Yu TESHIMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11841294
    Abstract: A diagnosis device includes a first acquisition unit, a second acquisition unit, and an associating unit. The first acquisition unit is configured to acquire, from a machine tool, context information including at least a monitoring specifying number identifying a machining process. The second acquisition unit is configured to acquire detection information output from a detection unit installed for the machine tool. The associating unit is configured to associate the monitoring specifying number included in the context information acquired by the first acquisition unit and the detection information acquired by the second acquisition unit.
    Type: Grant
    Filed: March 24, 2020
    Date of Patent: December 12, 2023
    Assignees: RICOH COMPANY, LTD., FANUC CORPORATION
    Inventors: Yu Teshima, Yasuhiro Nakahama
  • Publication number: 20230103413
    Abstract: An information processing apparatus includes a detection result acquisition unit configured to acquire a detection result of a physical quantity that changes as a movable body moves while being in contact with a subject; an image data acquisition unit configured to acquire image data of the subject; and a display control unit configured to control a display to display likelihood information indicating a likelihood of abnormality of the subject and the image data in association with each other. The likelihood is determined based on the detection result.
    Type: Application
    Filed: March 5, 2021
    Publication date: April 6, 2023
    Inventors: Gakushi MIYARA, Tomoki UMEZAWA, Junichi TAKAMI, Yuichi NODA, Takafumi HORIO, Yu TESHIMA
  • Publication number: 20230091235
    Abstract: An information processing apparatus includes a detection result acquisition unit to acquire, for each of processes performed on a plurality of workpieces, a detection result of a physical quantity that changes according to processing applied to a workpiece; an identification information acquisition unit to acquire process identification information identifying one of the processes performed on the same workpiece and workpiece identification information identifying one of the workpieces subjected to the same process; and a display control unit to display, on a display, the process identification information and the workpiece identification information; and display, on the display, abnormality likelihood information indicating likelihood of abnormality, determined based on the detection result, of the particular process or the particular workpiece, in association with at least one of the process identification information and the workpiece identification information.
    Type: Application
    Filed: March 10, 2021
    Publication date: March 23, 2023
    Inventors: Satoshi HAGIWARA, Junichi TAKAMI, Yu TESHIMA, Tomoki UMEZAWA, Gakushi MIYARA
  • Patent number: 11221608
    Abstract: A device includes: a first acquiring unit to acquire context information corresponding to running operation among pieces of context information; a second acquiring unit to acquire detection information output from a detecting unit detecting a physical quantity of a target device; an extracting unit to extract, from the detection information, feature information indicating a feature of the detection information in an interval including a specific operation interval of the target device; a selecting unit to select reference feature information used as reference based on the feature information, and sequentially select pieces of target feature information; a calculating unit to calculate a likelihood of a process interval based on a comparison between the reference feature information and each piece of target feature information; a determining unit to determine whether the target feature information corresponding to the likelihood is included in the process interval based on the likelihood; and an estimating uni
    Type: Grant
    Filed: March 16, 2018
    Date of Patent: January 11, 2022
    Assignees: RICOH COMPANY, LTD., FANUC CORPORATION
    Inventors: Satoru Goto, Junichi Takami, Yasunobu Shirata, Tomoki Umezawa, Yohsuke Muramoto, Takafumi Horio, Yu Teshima
  • Publication number: 20200309642
    Abstract: A diagnosis device includes a first acquisition unit, a second acquisition unit, and an associating unit. The first acquisition unit is configured to acquire, from a machine tool, context information including at least a monitoring specifying number identifying a machining process. The second acquisition unit is configured to acquire detection information output from a detection unit installed for the machine tool. The associating unit is configured to associate the monitoring specifying number included in the context information acquired by the first acquisition unit and the detection information acquired by the second acquisition unit.
    Type: Application
    Filed: March 24, 2020
    Publication date: October 1, 2020
    Inventors: Yu TESHIMA, Yasuhiro NAKAHAMA
  • Publication number: 20200133230
    Abstract: A device includes: a first acquiring unit to acquire context information corresponding to running operation among pieces of context information; a second acquiring unit to acquire detection information output from a detecting unit detecting a physical quantity of a target device; an extracting unit to extract, from the detection information, feature information indicating a feature of the detection information in an interval including a specific operation interval of the target device; a selecting unit to select reference feature information used as reference based on the feature information, and sequentially select pieces of target feature information; a calculating unit to calculate a likelihood of a process interval based on a comparison between the reference feature information and each piece of target feature information; a determining unit to determine whether the target feature information corresponding to the likelihood is included in the process interval based on the likelihood; and an estimating uni
    Type: Application
    Filed: March 16, 2018
    Publication date: April 30, 2020
    Inventors: Satoru GOTO, Junichi TAKAMI, Yasunobu SHIRATA, Tomoki UMEZAWA, Yohsuke MURAMOTO, Takafumi HORIO, Yu TESHIMA