Abstract: The present disclosure provides a clock control circuit and method for a circuitry. The circuitry includes a scan flip-flop circuit, an at-speed domain and a timing exception domain. The scan flip-flop circuit is configured to output data to the at-speed domain and the timing exception domain. The clock control circuit includes a first gate control circuit, a first gate circuit, a second gate control circuit and a second gate circuit. The first gate circuit is controlled by a first control signal output by the first gate control circuit, a scan enable signal and a scan mode signal to block or output a clock signal to the scan flip-flop circuit. The second gate circuit is controlled by a second control signal output by the second gate control circuit to block or output an output signal of the scan flip-flop circuit to the timing exception domain.

Abstract: An electro-absorption bias circuit may include a temperature sensor. The electro-absorption bias circuit may include a controller to provide a temperature-dependent control signal based on data received from the temperature sensor. The electro-absorption bias circuit may include a power supply to provide an output voltage based on the temperature-dependent control signal from the controller. The electro-absorption bias circuit may include an electro-absorption driving circuit to output a bias voltage applied to the output voltage provided by the power supply.

Abstract: An electro-absorption bias circuit may include a temperature sensor. The electro-absorption bias circuit may include a controller to provide a temperature-dependent control signal based on data received from the temperature sensor. The electro-absorption bias circuit may include a power supply to provide an output voltage based on the temperature-dependent control signal from the controller. The electro-absorption bias circuit may include an electro-absorption driving circuit to output a bias voltage applied to the output voltage provided by the power supply.