Abstract: A method for determining a three-dimensional atomic distribution of a sample having a tip, during an atom probe tomography process. The method accounts for the tip not being axial symmetric and not having a hemispherical shaped apex throughout the evaporation process.

Abstract: A keyboard device includes a keycap, a connecting element and a base plate. The keycap includes a sliding-type hook. The connecting element includes a first frame and a second frame. A first connecting part is inserted into the sliding-type hook. The first connecting part includes a top side and a contact slant. The top side is located at a distal end of the first connecting part. The contact slant is arranged beside the top side. A junction line between the top side and the contact slant is perpendicular to a top surface of the first frame. Due to the structure of the contact slant, the contact area between the first connecting part and the sliding-type hook is reduced. Consequently, the amount of the assembling interference between the first connecting part and the sliding-type hook is reduced.