Abstract: A method for promoting growth of a probiotic microorganism includes cultivating the probiotic microorganism in a growth medium containing a fermented culture of lactic acid bacterial strains that include Lactobacillus salivarius subsp. salicinius AP-32 deposited at the China Center for Type Culture Collection (CCTCC) under CCTCC M 2011127, Lactobacillus plantarum LPL28 deposited at the China General Microbiological Culture Collection Center (CGMCC) under CGMCC 17954, Lactobacillus acidophilus TYCA06 deposited at the CGMCC under CGMCC 15210, and Bifidobacterium longum subsp. infantis BLI-02 deposited at the CGMCC under CGMCC 15212.

Abstract: Disclosed herein is a method for promoting growth of a probiotic microorganism. The method includes cultivating the probiotic microorganism in a growth medium containing a fermented culture of lactic acid bacterial strains that include Lactobacillus salivarius subsp. salicinius AP-32 deposited at the China Center for Type Culture Collection (CCTCC) under CCTCC M 2011127, Lactobacillus plantarum LPL28 deposited at the China General Microbiological Culture Collection Center (CGMCC) under CGMCC 17954, Lactobacillus acidophilus TYCA06 deposited at the CGMCC under CGMCC 15210, and Bifidobacterium longum subsp. infantis BLI-02 deposited at the CGMCC under CGMCC 15212.

Abstract: A method of semiconductor die singulation is provided. The method includes forming a first trench along a singulation lane of a semiconductor wafer. A second trench is formed extending from a bottom of the first trench. A portion of the semiconductor wafer remains between a bottom of the second trench and a backside of the semiconductor wafer. A cut is formed by way of a laser to singulate die of the semiconductor wafer. The cut extends through the portion of the semiconductor wafer remaining between the bottom of the second trench and the backside of the semiconductor wafer.

Abstract: The method of the present invention forms a thin oxide layer on the circumferential wall of a recess in a trench and, at the same time, forms a thick oxide layer on the bottom surface of the recess. The thick oxide layer serves as the trench top oxide and the thin oxide layer serves as the gate oxide.

Abstract: A card connector for electrically coupling a PC card to an electrical device is provided. The card connector comprises a header section having a plurality of terminal pins disposed within the header section. A first and second elongated arm section are integrally coupled with the header section. Each one of the arms extend from a first end to a second end thereby forming a slot which is adapted to receive the PC card and guide the PC card into electrical contact with the terminal pins. A guide housing is securely disposed over said first arm. A push-rod is slidably mounted within the guide housing and adapted to move from a first position to a second position. A post is disposed within the guide housing. A swing arm is pivotally mounted on the push-rod and is adapted to engage and disengage with the post as the push-rod moves from the first position to the second position. A first spring is in communication with said swing arm.