Patents by Inventor Yu-Yi Cheng

Yu-Yi Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9239377
    Abstract: A pulse radar ranging apparatus and a ranging algorithm thereof are provided. The pulse radar ranging apparatus includes a radio frequency pulse generator, a radio frequency filter, a radio frequency switch and a transceiver aerial. The radio frequency pulse generator generates a pulse signal. The radio frequency filter receives the pulse signal and generates a high-pass filter signal, wherein the high-pass filter signal includes a radio frequency pulse reference signal. The radio frequency switch controls an output of the radio frequency pulse reference signal. The transceiver aerial transmits the radio frequency pulse reference signal. The radio frequency pulse reference signal contacts an object and generates a return signal, and the transceiver aerial receives the return signal. The ranging algorithm processes and analyzes the signals obtained by the pulse radar ranging apparatus, and calculates a distance between pulse radar ranging apparatus and the object by using polynomial interpolation.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: January 19, 2016
    Assignee: Industrial Technology Research Institute
    Inventors: Yu-Yi Cheng, Tien-Cheng Tseng, Kuang-I Chang, Jyun-Long Chen, Jwu-Sheng Hu
  • Patent number: 7957459
    Abstract: A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 0 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.
    Type: Grant
    Filed: March 21, 2007
    Date of Patent: June 7, 2011
    Assignee: Industrial Technology Research Institute
    Inventors: Yu-Yi Cheng, Kou-Cheng Yeh, Chun-Chen Chen, Teng-Chun Wu
  • Publication number: 20080159164
    Abstract: A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 1 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.
    Type: Application
    Filed: March 21, 2007
    Publication date: July 3, 2008
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Yu-Yi Cheng, Kou-Cheng Yeh, Chun-Chen Chen, Teng-Chun Wu