Abstract: A method of fabricating a contact structure includes the following steps. An opening is formed in a dielectric layer. A conductive material layer is formed within the opening and on the dielectric layer, wherein the conductive material layer includes a bottom section having a first thickness and a top section having a second thickness, the second thickness is greater than the first thickness. A first treatment is performed on the conductive material layer to form a first oxide layer on the bottom section and on the top section of the conductive material layer. A second treatment is performed to remove at least portions of the first oxide layer and at least portions of the conductive material layer, wherein after performing the second treatment, the bottom section and the top section of the conductive material layer have substantially equal thickness.

Abstract: A method for resuming topology of a single loop network and a network switch system are provided. The network switch system includes one or more first network switches each having a first port and a second port and a second network switch having a third port and a fourth port. When the first port of one of the first network switches is abnormal, a recovery control frame is transmitted through the second port. The second network switch sets the third port in a disabled state to an enabled state. When the abnormal port is resumed, the first network switch transmits a block control frame through the second port. The second network switch sets the third port in the enabled state to the disabled state and transmits a forward control frame through the fourth port. The first network switch sets the first port in the disabled state to the enabled state.

Abstract: Embodiments of the present invention provide a multiple-variable predictive maintenance method for a component of a production tool and a computer program product thereof, in which a multiple-variable time series prediction (TSPMVA) and an information criterion algorithm are adapted to build a best vector autoregression model (VAR), thereby forecasting the complicated future trend of accidental shutdown of the component of the production tool. Therefore, the multiple-variable prediction of the present invention can improve the accuracy of prediction compared with the single-variable prediction.

Abstract: A pulse radar ranging apparatus and a ranging algorithm thereof are provided. The pulse radar ranging apparatus includes a radio frequency pulse generator, a radio frequency filter, a radio frequency switch and a transceiver aerial. The radio frequency pulse generator generates a pulse signal. The radio frequency filter receives the pulse signal and generates a high-pass filter signal, wherein the high-pass filter signal includes a radio frequency pulse reference signal. The radio frequency switch controls an output of the radio frequency pulse reference signal. The transceiver aerial transmits the radio frequency pulse reference signal. The radio frequency pulse reference signal contacts an object and generates a return signal, and the transceiver aerial receives the return signal. The ranging algorithm processes and analyzes the signals obtained by the pulse radar ranging apparatus, and calculates a distance between pulse radar ranging apparatus and the object by using polynomial interpolation.

Abstract: A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 0 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.

Abstract: A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 1 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.