Abstract: The present disclosure describes a method of forming low thermal budget dielectrics in semiconductor devices. The method includes forming, on a substrate, first and second fin structures with an opening in between, filling the opening with a flowable isolation material, treating the flowable isolation material with a plasma, and removing a portion of the plasma-treated flowable isolation material between the first and second fin structures.

Abstract: A combinational circuit block has input pins configured to receive input digital signals and output pins configured to provide output digital signals as a function of the input digital signals received. A test input pin receives a test input signal. A test output pin provides a test output signal as a function of the test input signal received. A set of scan registers are selectively coupled to either the combinational circuit block or to one another so as to form a scan chain of scan registers serially coupled between the test input pin and the test output pin. The scan registers in the set of scan registers are clocked by a clock signal. At least one input register is coupled between the test input pin and a first scan register of the scan chain. The at least one input register is clocked by an inverted replica of the clock signal.

Abstract: A combinational circuit block has input pins configured to receive input digital signals and output pins configured to provide output digital signals as a function of the input digital signals received. A test input pin receives a test input signal. A test output pin provides a test output signal as a function of the test input signal received. A set of scan registers are selectively coupled to either the combinational circuit block or to one another so as to form a scan chain of scan registers serially coupled between the test input pin and the test output pin. The scan registers in the set of scan registers are clocked by a clock signal. At least one input register is coupled between the test input pin and a first scan register of the scan chain. The at least one input register is clocked by an inverted replica of the clock signal.

Abstract: An improved tooth profile for a roller chain sprocket enables noise reduction from impact and polygonal action during the meshing process. The profile of the engaging flank consists of three portions which are the seating, impact and distal portions all three of which are arcs with well-defined radii and arc centers. The profile of the disengaging flank is determined in accordance to a modified form of the JIS standard in which the sprocket pitch is smaller than the roller chain pitch. The impact point is located at the tangent point, thus permitting a gradual change of the roller velocity, thereby lessening the impact level and the effects of polygonal action.

Abstract: An improved tooth profile for a roller chain sprocket enables noise reduction from impact and polygonal action during the meshing process. The profile of the engaging flank consists of three portions which are the seating, impact and distal portions all three of which are arcs with well-defined radii and arc centres. The profile of the disengaging flank is determined in accordance to a modified form of the JIS standard in which the sprocket pitch is smaller than the roller chain pitch. The impact point is located at the tangent point, thus permitting a gradual change of the roller velocity, thereby lessening the impact level and the effects of polygonal action.