Patents by Inventor Yuan Sang

Yuan Sang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11965931
    Abstract: A dummy dual in-line memory module (DIMM) testing system based on boundary scan interconnect and a method thereof. A dummy dual in-line memory module functioning normally is used as a test fixture, a dummy dual in-line memory module under test is served as an unit under test (UUT), and the test fixture and the unit under test are inserted into a test device to electrically connect to each other, so that the test access port (TAP) device can perform boundary scan to control the test fixture to test the unit under test through signal pins, and check a test result based on a data signal collected from at least one boundary scan register. Therefore, the effect of improving testing convenience of the dummy DIMM can be achieved.
    Type: Grant
    Filed: December 9, 2022
    Date of Patent: April 23, 2024
    Assignees: Inventec (Pudong) Technology Corporation, Inventec Corporation
    Inventors: Yuan Sang, Xiao-Xiao Mao, Jin-Dong Zhao
  • Patent number: 11927632
    Abstract: A DIMM slot test system without series connection of test board through JTAG and a method thereof are disclosed. A DIMM connector interface of a test board is inserted to a DIMM slot of a circuit board under test, a CPU generates test data or a test signal based on a test signal with JTAG signal format, the CPU transmits test data to a specified CPLD chip through differential pins or IO pins, the specified CPLD chip records the received data as a test result; the CPU transmits the generated test signal to the specified CPLD chip, which then tests power pins or ground pins, reads and records values of the power pins or the ground pins as the test result; the CPU generates and transmits a test result read signal to the specified CPLD chip through the control pins, obtains the test result through data transmission pins.
    Type: Grant
    Filed: December 9, 2022
    Date of Patent: March 12, 2024
    Assignees: Inventec (Pudong) Technology Corporation, Inventec Corporation
    Inventors: Chang-Qing Mu, Yuan Sang, Xue-Shan Han
  • Publication number: 20200132769
    Abstract: A SAS connector conduction detecting system and a method thereof are provided. A SAS connector of each of two detection circuit boards is connected to one mainboard SAS connector of the mainboard respectively, and a TAP controller and the two detection circuit boards are cascaded through the JTAG input connector and the JTAG output connector on each of the two detection circuit boards, so that the two detection circuit boards can provide the conduction detection for the mainboard SAS connectors correspondingly connected at the same time. Therefore, the improve efficiency of SAS connector conduction detection may be achieved.
    Type: Application
    Filed: December 19, 2018
    Publication date: April 30, 2020
    Inventor: Yuan Sang
  • Publication number: 20200132768
    Abstract: A SAS connector conduction detecting system and a method thereof are provided. By a SAS connector on a detection circuit board and a mainboard SAS connector of a mainboard are connected to each other, and the detection circuit board and a test access port controller are connected in series with each other through a JTAG input connector and a JTAG output connector on the detection circuit board. The detection circuit board can provide the conduction detection for one mainboard SAS connector of the mainboard, thereby achieving the technical effect of improving the detection efficiency of the SAS connector.
    Type: Application
    Filed: December 19, 2018
    Publication date: April 30, 2020
    Inventor: Yuan Sang