Abstract: A wearable device includes a frame element and a dielectric substrate. The frame element includes a first metal element, a second metal element, and a third metal element. A first gap is provided between the first metal element and the second metal element. A second gap is provided between the second metal element and the third metal element. A third gap is provided between the third metal element and the first metal element. The dielectric substrate is surrounded by the first metal element, the second metal element, and the third metal element. A first antenna element is formed by the first metal element. A second antenna element is formed by the second metal element. A third antenna element is formed by the third metal element.

Abstract: A display apparatus is disclosed The display apparatus includes a display, configured to present an image interface, the image interface includes a render layer and a display layer superimposed: and a controller, configured to obtain a target video resource and one or more recommended video resource associated with the target video resource; control the display layer to present the target video resource and output audio of the target video resource; and control the render layer to present the one or more recommended video resource simultaneously.

Abstract: Disclosed are a method and system for evaluating sonar self-noise at a ship design stage. The method includes: building a ship structure full-scale geometric simulation model; acquiring loss factors and sonar transducer space outfitting acoustic absorption coefficient material parameters; acquiring mechanical excitation, hydrodynamic excitation, and propeller excitation; inputting the loss factors and the sonar transducer space outfitting acoustic absorption coefficient material parameters into an established statistical energy evaluation model, and applying a mechanical excitation to a face plate of foundation of the built ship structure full-scale geometric simulation model, applying a hydrodynamic excitation to the surface of a ship hull, and applying a propeller excitation to a stern shaft to perform calculation of sonar self-noise of a ship to obtain total spectral density level of the sonar self-noise; and evaluating spectral density level calculation results by index requirements.

Abstract: The present invention relates to population of T cells with reduced expression of SIGLEC15, wherein the T cells are derived from sentinel lymph nodes in a subject having a cancer. The invention also relates to methods for obtaining such T cells, as well as to their use in therapy and pharmaceutical compositions comprising such T cells.

Abstract: Disclosed are a method and system for evaluating sonar self-noise at a ship design stage. The method includes: building a ship structure full-scale geometric simulation model; acquiring loss factors and sonar transducer space outfitting acoustic absorption coefficient material parameters; acquiring mechanical excitation, hydrodynamic excitation, and propeller excitation; inputting the loss factors and the sonar transducer space outfitting acoustic absorption coefficient material parameters into an established statistical energy evaluation model, and applying a mechanical excitation to a face plate of foundation of the built ship structure full-scale geometric simulation model, applying a hydrodynamic excitation to the surface of a ship hull, and applying a propeller excitation to a stern shaft to perform calculation of sonar self-noise of a ship to obtain total spectral density level of the sonar self-noise; and evaluating spectral density level calculation results by index requirements.

Abstract: Provided are a complex of an anti-IL-4R antibody or an antigen-binding fragment thereof, and a medical use thereof. Specifically, provided are a complex of an antibody that specifically binds to IL-4R or an antigen-binding fragment thereof covalently linked to a toxin, a pharmaceutical composition comprising the complex, and a use thereof in the preparation of a drug for treating IL-4R-mediated diseases or disorders, especially a use in the preparation of an anti-cancer drug.

Abstract: Disclosed are a silicon nitride ceramic sintered body and preparation method thereof. The silicon nitride ceramic sintered body includes a sintered bulk and a hard surface layer having a thickness of 10-1000 ?m, formed on a surface of the sintered bulk, wherein the sintered bulk comprises a first silicon nitride crystalline phase and a first grain boundary phase; the hard surface layer comprises a second silicon nitride crystalline phase and a second grain boundary phase; the first grain boundary phase comprises a metal tungsten phase being tungsten elementary substance and/or a tungsten alloy; the second grain boundary phase comprises tungsten carbide particles; tungsten element in the metal tungsten phase accounts for 80-100 wt % of total tungsten element in the first grain boundary phase; and tungsten element in the tungsten carbide particles accounts for 60-100 wt % of total tungsten element in the second grain boundary phase.

Abstract: A non-volatile memory device includes a set of memory cells, a cycle transistor, a reference transistor and a control circuit. The control circuit is coupled to the set of memory cells, the cycle transistor and the reference transistor. A method of controlling the non-volatile memory device includes in a program operation or an erase operation of the set of memory cells, the control circuit determining a state of the cycle transistor, and upon determining the cycle transistor being in an erased state (or a programmed state), the control circuit setting the reference transistor from a reference state to the erased state (or the programmed state), and then restoring the reference transistor from the erased state (or the programmed state) to the reference state. The reference state is set between the erased state and a programmed state.

Abstract: A backing up and recovering method of a file system is applied to a communication device. In the backing up and recovering method, a detecting step is performed to drive a first processing unit to detect whether the file system is damaged, and then generate a detection result. A transmitting step is performed to drive the first processing unit to transmit the detection result to a second processing unit. In response to the detection result being the file system is damaged, the second processing unit executes a system recovering step which recovers the file system according to a backup data that corresponds to the file system and is stored in a storage unit, and in response to the file system being not damaged, the second processing unit executes a backup confirming step which confirms whether the storage unit has the backup data.

Abstract: A storage device including a cell array and a disturb-free circuit is provided. The cell array includes a first cell and a second cell. The first cell is coupled to a first conductive line and a specific conductive line. The second cell is coupled to a second conductive line and the specific conductive line. The disturb-free circuit performs a first write operation on the first cell and performs a verification operation on the second cell. The verification operation determines whether data stored in the second cell is disturbed by the first write operation. In response to the data stored in the second cell being disturbed by the first write operation, the disturb-free circuit performs a second write operation.

Abstract: A storage device including a cell array and a disturb-free circuit is provided. The cell array includes a first cell and a second cell. The first cell is coupled to a first conductive line and a specific conductive line. The second cell is coupled to a second conductive line and the specific conductive line. The disturb-free circuit performs a first write operation on the first cell and performs a verification operation on the second cell. The verification operation determines whether data stored in the second cell is disturbed by the first write operation. In response to the data stored in the second cell being disturbed by the first write operation, the disturb-free circuit performs a second write operation.

Abstract: Provided are a treatment apparatus and a treatment method treating a waste cleaning liquid discharged from a process of producing an electrode of a lithium-ion secondary battery, in which a liquid component and a solid component are efficiently separated from each other, and the liquid component can be sufficiently collected and subjected to volume reduction treatment. The treatment apparatus includes: a stirring tank stirring the waste cleaning liquid; a liquid feed line that takes out the waste cleaning liquid from the stirring tank; and a thin film evaporator evaporating a cleaning liquid in the waste cleaning liquid to separate the solid component. Then, in the treatment method, the waste cleaning liquid is stirred in the stirring tank, the waste cleaning liquid is supplied to the thin film evaporator in a state in which the solid component is diffused, and the cleaning liquid in the waste cleaning liquid is evaporated.

Abstract: A test circuit testing a storage circuit and including a controller, a pattern-generator circuit, a comparing circuit, and a first register is provided. The storage circuit includes a storage block. The controller is configured to generate a plurality of internal test signals. The pattern-generator circuit generates and provides test data to the storage circuit according to the internal test signal. The storage circuit writes the test data into the storage block and reads the storage block to generate read data. The comparing circuit compares the test data and the read data to generate a test result. The first register stores the test result. The controller determines whether the storage circuit is working normally according to the test result stored in the first register.

Abstract: An access method for a memory device is provided. The access method includes receiving external data; reading a plurality of first memory cells of the memory device according to a write address to obtain first original data; comparing the external data and the first original data to determine whether the number of specific cells among the first memory cells is higher than a predetermined value, wherein the value of each of the specific cells would be changed from a first value to a second value in response to the external data being written into the first memory cells; and reversing the external data to generate reversed data and writing the reversed data into the first memory cells to replace the first original data in response to the number of specific cells being higher than the predetermined value.

Abstract: The present disclosure discloses a method for searching the shortest path of must-pass node, which includes the following processing steps: S1, constructing a Thiessen polygon; S2, when start node of must-pass nodes and end node of must-pass node are not the same must-pass node, performing processing of S3; S3, starting from the Thiessen polygon where the start node of must-pass nodes is located, querying the adjacent Thiessen polygons and merging them into the first merged polygon; S4, based on the first merged polygon, querying the unprocessed adjacent Thiessen polygons to merge the second merged polygon; S5, merging the isolated Thiessen polygon into a certain adjacent merged polygon with common edge; S6, deleting the edge lines of two vertices in Denaulay triangle that are not in the same merged polygon; S7.

Abstract: A test circuit testing a storage circuit and including a controller, a pattern-generator circuit, a comparing circuit, and a first register is provided. The controller is configured to generate a plurality of internal test signals. The pattern-generator circuit writes test data into the storage block of the storage circuit according to the internal test signal and reads the storage block to generate read data. The comparing circuit compares the test data and the read data to generate a test result. The first register stores the test result. The controller determines whether the storage circuit is working normally according to the test result stored in the first register.