Abstract: One aspect of this description relates to a testing apparatus including an advance process control monitor (APCM) in a first wafer, a plurality of pads disposed over and coupled to the APCM. The plurality of pads are in a second wafer. The testing apparatus includes a testing unit disposed between the first wafer and the second wafer. The testing unit is coupled to the APCM. The testing unit includes a metal structure within a dielectric. The testing apparatus includes a plurality of through silicon vias (TSVs) extending in a first direction from the first wafer, through the dielectric of the testing unit, to the second wafer.

Abstract: A capacitor structure and a manufacturing method thereof. The capacitor structure includes a first conductor layer, a dielectric layer and a second conductor layer. The first conductor layer has a first metal material and a second metal material. The first metal material is formed with voids and the second metal material is filled in the voids via hot melt. Accordingly, in the first conductor layer, the second metal material is filled into the voids of the first metal material by means of hot melt to bond with the first metal material. In this case, the thermal treatment temperature can be effectively lowered and the electrical conductivity of the capacitor structure can be increased. Also, the strength of the capacitor structure is increased.

Abstract: A portable wafer inspection system is applied on an inspection window of a manufacturing tool for wafers. The portable wafer inspection system comprises: a housing, a lighting unit, and an inspection unit. The housing has a receiving room therein, and a plurality of fixing members is disposed at the opening of the housing. The fixing members are used for fixing the housing on the inspection window of the manufacturing tool. The lighting unit and the inspection unit are disposed in the receiving room of the housing, wherein the inspection unit is for capturing images of the wafers.

Abstract: A planar light source including a transflective film, a plurality of cold cathode fluorescence flat lamps and at least one reflective component to provide a uniform light source is described. A portion of the light emitted from the emitting areas of the cold cathode fluorescence flat lamps passes through the transflective film, and the other portion of the light is reflected to the reflective component by the transflective film. Then, the light is reflected to the dark areas between the emitting areas to compensate the brightness of the dark areas. When the brightness of the dark areas is compensated, the planar light source provides a uniform light without dark stripes.

Abstract: A reflective-type liquid crystal display is disclosed. The reflective-type liquid crystal display comprises an outer frame, a liquid crystal display panel mounted within the outer frame and a movable cold cathode flat fluorescent lamp disposed on the outer frame by a connecting element to provide a light source to the liquid crystal display.

Abstract: A backlight module for transflective liquid crystal display includes an LCD panel and a Cold Cathode Flat Fluorescent Lamp (CCFFL) installed on the back side of the LCD panel. The CCFFL lamp can be electrified and illuminated itself, and the lamp's surface having high reflectivity is smooth, thereby, the illumination is high and uniform. Therefore, the backlight module for transflective liquid crystal display can make the most of ambient light source to attain the object of conserving power.