Abstract: A power system includes a battery charge path and capacitor charge path arranged in parallel. During an inrush event, a current limiting element restricts current flow along the battery charge path to relieve battery stress. During the inrush event, current flow between the battery and load along a bypass path is also prevented by a switch element. Under steady state charging conditions, the resistance of the current limiting element decreases, thus increasing current flow between the battery and load along the battery charge path. During steady state conditions, a switch circuit controls operation of the switch element to also allow current flow between the battery and load along the bypass path. The change in the resistance of the current limiting element and/or actuation of the switch element by the switch circuit are optionally based on changes in temperature, and are passively effectuated without requiring an external control input signal.

Abstract: The present disclosure provides smart glasses including a frame (10), an imaging system (20), and a first lens (30), wherein the imaging system (20) includes an image source assembly (21) configured to emit light for forming an image, and an optical assembly (22) configured to change an optical path of the light to project light in a direction of a first side of the image source assembly (21), the image source assembly (21) and the optical assembly (22) being both provided on the frame (10); and the first lens (30) is provided on the frame (10) and located on a second side of the image source assembly (21), with a gap being formed between the first lens (30) and the optical assembly (22), and the gap being sealed to form a sealed space.

Abstract: A device model for simulating a leakage current of a semiconductor device is disclosed, including a gate structure having a first metal gate and a metal work function layer of the first conductive type. The leakage current of the device model is acquired by multiplying a main function by a first function. The first function is a function of the metal gate boundary proximity effect parameters of the semiconductor device. These parameters influence the metal gate boundary proximity effect on the leakage current in modeling. Also disclosed is a method to extract the device model of leakage current. The device model simulates the influence of the MBE effects via parameter fitting, thereby improving on the device leakage current and the design of more reasonable layouts.

Abstract: A head-mounted display device relates to the field of electronic products.

Abstract: A head-mounted display device relates to the field of electronic products.

Abstract: Technology is disclosed herein for early erase termination as a counter-measure for erase disturb. Multiple erase blocks of NAND memory cells are erased in parallel during an erase procedure. Erasing multiple erase blocks in parallel can place considerable strain on the circuitry that generates the erase voltage. If there is significant leakage current in one of the erase blocks the magnitude of the erase voltage for all of the erase blocks may drop. The erase blocks are tested sequentially for leakage current during the first erase loop while the erase voltage is applied to only the erase block under test. If any erase block fails the leakage current test that erase block is removed from the erase procedure. One or more additional erase loops are then performed with only those erase blocks that passed the leakage current test simultaneously receiving an erase voltage, thereby preventing erase disturb with early termination.

Abstract: The present application relates to smart glasses including: a frame; a first temple and a second temple, head ends of which are connected to two opposite sides of the frame, the first temple and the second temple each including a first temple member and a second temple member arranged opposite to each other, the first temple member and the second temple member being connected to form an accommodating cavity; a first circuit board accommodated in the accommodating cavity; an external interface provided at a tail end of at least one of the first temple and the second temple, the external interface being electrically connected to the first circuit board; and a first fastener fitted over an outer periphery of the tail end of the temple provided with the external interface, to fix tail ends of the connected first temple member and second temple member.

Abstract: An arc suppression pre-charge circuit includes a source for providing energy to a load and a main contactor selectively closed to provide energy from the source to the load, wherein the main contactor provides an alternate current path from the source to the load and bypasses a pre-charge branch of the circuit when the main contactor is closed. The pre-charge branch includes a voltage-controlled resistor and a control circuit configured to control a resistance of the voltage-controlled resistor.

Abstract: Sensitive and specific detection of nucleic acids can be achieved using a chemical ligation-based template assisted rapid assay (TARA-L) with simple chemical reactions between probes and without the need for enzymes. Probes are designed to form a ligation product when they anneal to adjacent portions of a target nucleic acid. The ligation products can be detected, such as in immunochromatographic assays. The methods allow for the fast, efficient analysis of biological samples for the presence of nucleic acids and can be used, for example, in point of care settings.