Patents by Inventor Yudhishthir Kandel

Yudhishthir Kandel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determination of spatial distribution of charged particle beams
    Patent number: 9754360
    Abstract: A point spread function (PSF) of a focused scanning particle beam of an observation instrument is ascertained by obtaining a first image (reference image) based on a reference instrument, the reference image being an image of an area of a reference standard, obtaining a second image (observed image) of the area of the reference standard, and the observed image obtained using the observation instrument configured with a set of operational parameters that define a probe size for the observation instrument, the probe size being larger than a pixel size of the reference image, and then determining, based on the reference image and the observed image, the PSF of the observation instrument as a component of a convolution of the reference image that provides the observed image.
    Type: Grant
    Filed: December 22, 2015
    Date of Patent: September 5, 2017
    Assignee: THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK
    Inventors: Eric Lifshin, Yudhishthir Kandel
  • DETERMINATION OF SPATIAL DISTRIBUTION OF CHARGED PARTICLE BEAMS
    Publication number: 20160180190
    Abstract: A point spread function (PSF) of a focused scanning particle beam of an observation instrument is ascertained by obtaining a first image (reference image) based on a reference instrument, the reference image being an image of an area of a reference standard, obtaining a second image (observed image) of the area of the reference standard, and the observed image obtained using the observation instrument configured with a set of operational parameters that define a probe size for the observation instrument, the probe size being larger than a pixel size of the reference image, and then determining, based on the reference image and the observed image, the PSF of the observation instrument as a component of a convolution of the reference image that provides the observed image.
    Type: Application
    Filed: December 22, 2015
    Publication date: June 23, 2016
    Inventors: Eric Lifshin, Yudhishthir Kandel