Abstract: A method and a system for remote sharing annotation trajectory in a three-dimensional space are provided. In response to activating a first electronic apparatus to display a first space, the first electronic apparatus obtains a first reference point of a designated object presented in the first space. After the first electronic apparatus displays the first space, the first electronic apparatus detects a three-dimensional movement trajectory of a target object in the first space, detects inflection point information of the three-dimensional movement trajectory and captures a diameter of the three-dimensional movement trajectory, and then sends the inflection point information and the diameter to a second electronic apparatus.

Abstract: System and method for profile measurement are provided. The profile measurement system includes a light projector, an imaging device, a control system, and a processing unit. The light projector includes a light source, a mask, and an optical system. An aperture of the mask allows a portion of light to pass through and generates a pattern. The optical system includes a variable focal length lens element configured to project the pattern at different projection distances. The imaging device is configured to capture images of the pattern projected at the different projection distances. The control system is configured to control a projection distance of the light projector and a focus distance of the imaging device. The processing unit is configured to obtain in-focus pixels in the captured images, generate mask images, reconstruct a large depth of field pattern image based on the captured images and reconstruct the object profile.

Abstract: System and method for profile measurement are provided. The profile measurement system includes a light projector, an imaging device, a control system, and a processing unit. The light projector includes a light source, a mask, and an optical system. An aperture of the mask allows a portion of light to pass through and generates a pattern. The optical system includes a variable focal length lens element configured to project the pattern at different projection distances. The imaging device is configured to capture images of the pattern projected at the different projection distances. The control system is configured to control a projection distance of the light projector and a focus distance of the imaging device. The processing unit is configured to obtain in-focus pixels in the captured images, generate mask images, reconstruct a large depth of field pattern image based on the captured images and reconstruct the object profile.

Abstract: A surface topography optical measuring system including image capture modules, a control module and a computation module is provided. Each image capture module includes an electronically controlled focal length tunable lens, an optical assembly and an image sensor, wherein the image capture modules respectively capture images at different heights between a lowest and a highest surfaces of an object. The control module is coupled to the image capture modules to independently control the image capture modules. The computation module is coupled to the control module and the image sensor of each image capture module, wherein the computation module perform calibration of the surface topography optical measuring system and assesses in-focused pixels in the captured images to measure a height difference between a highest and a lowest surfaces of the object or between any surfaces of interest of the object. A surface topography optical measuring method is also provided.

Abstract: A surface topography optical measuring system including image capture modules, a control module and a computation module is provided. Each image capture module includes an electronically controlled focal length tunable lens, an optical assembly and an image sensor, wherein the image capture modules respectively capture images at different heights between a lowest and a highest surfaces of an object. The control module is coupled to the image capture modules to independently control the image capture modules. The computation module is coupled to the control module and the image sensor of each image capture module, wherein the computation module perform calibration of the surface topography optical measuring system and assesses in-focused pixels in the captured images to measure a height difference between a highest and a lowest surfaces of the object or between any surfaces of interest of the object. A surface topography optical measuring method is also provided.

Abstract: Measurement system and method for measuring multi-dimensions of an object are provided. A two-dimensional (2D) image capturing device captures at least one macro-2D image of the object. A three-dimensional (3D) information acquisition device acquires micro-3D measured data of the object. A integration and estimation device performs 2D and 3D image correction on macro-2D image and micro-3D measured data to map micro-3D measured data into macro-2D image to output 3D-topography data corresponding to macro-2D image of the object, and based on machine learning mechanism, performs matching procedure on at least one connection feature between any two positions in 3D-topography data with a database to elect an adapted model. Based on its corresponding to at least one fitting function, the integration and estimation device estimates the connection features of 3D-topography data to output at least one estimated feature amount, thereby obtaining measurement results corresponding to the object.

Abstract: Measurement system and method for measuring multi-dimensions of an object are provided. A two-dimensional (2D) image capturing device captures at least one macro-2D image of the object. A three-dimensional (3D) information acquisition device acquires micro-3D measured data of the object. A integration and estimation device performs 2D and 3D image correction on macro-2D image and micro-3D measured data to map micro-3D measured data into macro-2D image to output 3D-topography data corresponding to macro-2D image of the object, and based on machine learning mechanism, performs matching procedure on at least one connection feature between any two positions in 3D-topography data with a database to elect an adapted model. Based on its corresponding to at least one fitting function, the integration and estimation device estimates the connection features of 3D-topography data to output at least one estimated feature amount, thereby obtaining measurement results corresponding to the object.

Abstract: A workpiece measuring apparatus and a method for measuring a workpiece are provided. A first image of a first portion of a workpiece is captured, and a first location of the first portion is determined. A second image of a second portion is captured that is selected according to the first location and the location of a portion of the workpiece to be measured, and a second location of the second portion is determined. If the second image determines that the first location is correctly determined, a workpiece holding unit is moved along the original direction; otherwise, the second image replaces the first image, and the workpiece holding unit is moved along a new direction. Also, a third image of a third portion of the workpiece is further captured to replace the second image, until the third image determines that the second location is correctly determined.