Patents by Inventor Yuetsu Ochiai

Yuetsu Ochiai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7557598
    Abstract: A method of inspecting a quiescent power supply current in a semiconductor integrated circuit, includes an ID information acquisition process for acquiring ID information of the semiconductor integrated circuit, a quiescent power supply current measuring process for measuring the value of the quiescent power supply current in the semiconductor integrated circuit, a measurement information storing process for storing the quiescent power supply current value and the ID information in a corresponding manner, a reference value determining process for determining a reference value for the quiescent power supply current on the basis of the stored quiescent power supply current value, and a defect determining process for comparing the stored quiescent power supply current value with the reference value for the quiescent power supply current to determine whether the semiconductor integrated circuit is defective or not.
    Type: Grant
    Filed: March 8, 2007
    Date of Patent: July 7, 2009
    Assignee: Panasonic Corporation
    Inventors: Yuetsu Ochiai, Kentaro Yamamoto
  • Publication number: 20070210824
    Abstract: A method of inspecting a quiescent power supply current in a semiconductor integrated circuit, includes an ID information acquisition process for acquiring ID information of the semiconductor integrated circuit, a quiescent power supply current measuring process for measuring the value of the quiescent power supply current in the semiconductor integrated circuit, a measurement information storing process for storing the quiescent power supply current value and the ID information in a corresponding manner, a reference value determining process for determining a reference value for the quiescent power supply current on the basis of the stored quiescent power supply current value, and a defect determining process for comparing the stored quiescent power supply current value with the reference value for the quiescent power supply current to determine whether the semiconductor integrated circuit is defective or not.
    Type: Application
    Filed: March 8, 2007
    Publication date: September 13, 2007
    Inventors: Yuetsu Ochiai, Kentaro Yamamoto
  • Patent number: 4747154
    Abstract: An apparatus for expanding or contracting image data includes an input for storing the image data to be processed, a first barrel shifter for shifting the output data of the input register, a control register for storing a mapping pattern which indicates a position of the image data bits to be extracted in the expansion mode or which indicates the number of times when the image data are to be copied, an expansion and contraction circuit for expanding or contracting the image data by referring to the mapping pattern, and a second barrel register for shifting the output image data of the expansion and contraction circuit before the data are loaded in an output data register.
    Type: Grant
    Filed: September 28, 1984
    Date of Patent: May 24, 1988
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Kazufumi Suzuki, Katsura Kawakami, Shigeo Shimazaki, Yuetsu Ochiai, Etsuko Hirokami, Hiroaki Kotera
  • Patent number: 4342051
    Abstract: An original image field is successively scanned along each of parallel line paths to detect the image density of the scanned elemental picture area. A plurality of recurring sequences of binary digits or pulses is generated for each of the scanned line paths in synchronism with the scansion of each elemental picture area, thereby forming dot pattern conversion matrices corresponding in number to the number of discrete gradation steps or image densities with the pulses representing the dots in each matrix. The detected image density is used to select a corresponding one of the dot pattern matrices to represent the scanned area with a dot if the latter is present in a specified position in the corresponding matrix by allowing the selected recurring pulse sequence to be delivered to a recording unit which is moved with respect to a recording field in synchronism with the scansion of the original field.
    Type: Grant
    Filed: April 24, 1980
    Date of Patent: July 27, 1982
    Assignee: Matsushita Electric Industrial Company, Limited
    Inventors: Kazufumi Suzuki, Shumi Kumagai, Yuetsu Ochiai, Akira Mizoguchi