Abstract: Examples of the present application provide a semiconductor device, a memory system and a fabrication method of a semiconductor device. The semiconductor device includes: a silicon contact structure; a metal silicide layer on one side of the silicon contact structure; a bit line structure located on the side of the metal silicide layer away from the silicon contact structure and extending in a first direction; and a sidewall structure covering the opposite sides of the bit line structure and the opposite sides of the metal silicide layer in the first direction and extending further to cover the opposite sides, in the first direction, of the first end of the silicon contact structure proximate to the metal silicide layer.

Abstract: A decoupling mechanism (01) for large-displacement vibration tests includes a first transfer decoupling assembly (1), a rotary amplifying assembly (3) and a second transfer decoupling assembly (2), wherein the first transfer decoupling assembly (1) includes a first transfer shaft (11) and a first transfer main body (12) axially connected to the first transfer shaft (11); the second transfer decoupling assembly (2) includes a second transfer shaft (21) and a second transfer main body (22) axially connected to the second transfer shaft (21); an extension direction of the axis of the first transfer shaft (11) is the same as that of the axis of the second transfer shaft (21); a first connecting shaft (15) is arranged between the rotary amplifying assembly (3) and the first transfer main body (12), and a second connecting shaft (25) is arranged between the rotary amplifying assembly (3) and the second transfer main body (22); and extension directions of the axis of the first connecting shaft (15) and the axis of t

Abstract: A vibration-centrifugation composite test apparatus and a control method thereof, the apparatus comprises: a centrifuge, an air-cooled electric vibration table and a control electrical cabinet the air-cooled electric vibration table comprises a vibration table main machine and a fan; a central axis of the moving coil in the vibration table main machine is on the same straight line as a horizontal center line of the rotation arm in the centrifuge; the fan is a horizontal fan and disposed above the center of the rotation arm, and a fan cover cabinet is mounted outside the horizontal fan; the control electrical cabinet is mounted above the fan cover cabinet, a power supply line of the control electrical cabinet is connected to a power supply through the conductive slip ring, and a vibration feedback signal line of the vibration table main machine is directly connected to the control electrical cabinet.

Abstract: A vibration-centrifugation composite test apparatus and a control method thereof, the apparatus comprises: a centrifuge, an air-cooled electric vibration table and a control electrical cabinet the air-cooled electric vibration table comprises a vibration table main machine and a fan; a central axis of the moving coil in the vibration table main machine is on the same straight line as a horizontal center line of the rotation arm in the centrifuge; the fan is a horizontal fan and disposed above the center of the rotation arm, and a fan cover cabinet is mounted outside the horizontal fan; the control electrical cabinet is mounted above the fan cover cabinet, a power supply line of the control electrical cabinet is connected to a power supply through the conductive slip ring, and a vibration feedback signal line of the vibration table main machine is directly connected to the control electrical cabinet.