Patents by Inventor Yuhang Wan

Yuhang Wan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130114079
    Abstract: The invention provides an optical phase device, method and system. The optical phase device consists of a transparent dielectric substrate, a multilayer stack of dielectrics and a buffer layer. The refractive index of the transparent dielectric substrate, the multilayer stack of dielectrics and the buffer layer are all larger than that of the external medium. For the wavelength of the incident beam, the optical phase device has a phase variation in the angular range [?, ?] and the critical angle for total reflection on the interface between the buffer layer and the external medium adjacent to the buffer layer is ?, ?<?. The optical device has both low loss and large phase variation, which leads to a large Goos-Hanchen shift. As a dispersion compensation component, it can produce larger, tunable dispersions, and different dispersion compensations can be obtained by adjusting the operating angle or parameters in the structure.
    Type: Application
    Filed: October 12, 2011
    Publication date: May 9, 2013
    Applicant: BEIHANG UNIVERSITY
    Inventors: Zheng Zheng, Yuhang Wan, Xin Zhao, Zhiting Lu, Jingyi Guan
  • Patent number: 8416416
    Abstract: The invention provides an SPR measuring method and a measuring system thereof. According to the measuring method, first, a linear-polarized coherent broadband pulsed light beam is incident onto a surface of a sample under detection of a SPR sensing device to cause reflection; next, a time-domain monotonous chirp is performed on the incident coherent broadband pulsed light and/or the SPR reflected light; finally, the time-domain monotonically chirped SPR reflected light beam is detected, and information of the SPR effect is obtained according to the detected signal. According to the invention, the spectrum detection method used in conventional slow wavelength interrogation is converted into the high-speed real-time detection of time-domain pulse shape signals. Thus, the procedure of the SPR reaction may be monitored closely, and dynamical curves with very high time resolution may be obtained, in that case, fast biochemical reaction procedures may be monitored.
    Type: Grant
    Filed: November 29, 2007
    Date of Patent: April 9, 2013
    Assignees: National Center for Nanoscience and Technology, Beihang University
    Inventors: Zheng Zheng, Yuhang Wan, Xin Zhao, Jinsong Zhu, Jiangfeng Fan
  • Publication number: 20100321697
    Abstract: The invention provides an SPR measuring method and a measuring system thereof. According to the measuring method, first, a linear-polarized coherent broadband pulsed light beam is incident onto a surface of a sample under detection of a SPR sensing device to cause reflection; next, a time-domain monotonous chirp is performed on the incident coherent broadband pulsed light and/or the SPR reflected light; finally, the time-domain monotonically chirped SPR reflected light beam is detected, and information of the SPR effect is obtained according to the detected signal. According to the invention, the spectrum detection method used in conventional slow wavelength interrogation is converted into the high-speed real-time detection of time-domain pulse shape signals. Thus, the procedure of the SPR reaction may be monitored closely, and dynamical curves with very high time resolution may be obtained, in that case, fast biochemical reaction procedures may be monitored.
    Type: Application
    Filed: November 29, 2007
    Publication date: December 23, 2010
    Inventors: Zheng Zheng, Yuhang Wan, Xin Zhao, Jinsong Zhu, Jiangfeng Fan