Patents by Inventor Yuichi Ak

Yuichi Ak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040144928
    Abstract: A testing apparatus using a scanning electron microscope for enabling tests and measurements on any part of a test subject in a nondestructive way without being limited by a size of the test subject, which is, a testing apparatus 1 using a scanning electron microscope for performing tests and measurements on any part of a test subject in a nondestructive way by using a scanning electron microscope 6a, comprising a local vacuum formation portion 9 for forming a local vacuum region by blocking around a part to be tested of the test subject from the outside air, wherein the local vacuum formation portion comprises an exhaust portion for exhausting to form a partial vacuum region, a float means 14 for floating the whole local vacuum formation portion above the test subject by emitting a compressed gas to an outer circumference portion of the local vacuum formation portion and a length measuring means 16 for measuring a distance between the test subject and the local vacuum formation portion for controlling floati
    Type: Application
    Filed: February 17, 2004
    Publication date: July 29, 2004
    Inventors: Tetsuo Abe, Kouki Okawauchi, Tadashi Hattori, Hironori Fujita, Minoru Takeda, Yuichi Ak, Naoki Date, Setsuo Norioka, Toshiaki Miyokawa, Seiichi Nakagawa