Patents by Inventor Yuichi Negami

Yuichi Negami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8498581
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Grant
    Filed: August 20, 2012
    Date of Patent: July 30, 2013
    Assignee: Anritsu Corporation
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Patent number: 8396429
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Grant
    Filed: August 20, 2012
    Date of Patent: March 12, 2013
    Assignee: Anritsu Corporation
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Publication number: 20130005271
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Application
    Filed: August 20, 2012
    Publication date: January 3, 2013
    Applicant: ANRITSU CORPORATION
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Publication number: 20130005373
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Application
    Filed: August 20, 2012
    Publication date: January 3, 2013
    Applicant: ANRITSU CORPORATION
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Patent number: 8311486
    Abstract: A communication test device can assist in identifying a cause of the change in throughput of a mobile communication terminal. The device includes accumulating means for accumulating trace data on a specific unit of data complying with a designated communication standard, and throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal, extracting means for extracting trace data and throughput data from the accumulating means, trace display means for displaying trace data on a display unit, throughput display means for displaying a graph of the variation with time of throughput on the display unit, and time obtaining means for obtaining a time. The extracting means is adapted to extract, from the accumulating means, trace data corresponding to time designated by an operating unit. The trace display means displays the trace data corresponding to the time on the display unit.
    Type: Grant
    Filed: February 8, 2008
    Date of Patent: November 13, 2012
    Assignee: Anritsu Corporation
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Publication number: 20100093283
    Abstract: It is an object of the present invention to provide a communication test device which can assist in identifying a cause of the change in throughput of a mobile communication terminal. The communication test device includes accumulating means for accumulating trace data on a specific unit of data complying with a designated communication standard, and throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal, extracting means for extracting trace data and throughput data from the accumulating means, trace display means for displaying trace data on a display unit, throughput display means for displaying a graph of the variation with time of throughput on the display unit, and time obtaining means for obtaining a time. The extracting means is adapted to extract, from the accumulating means, trace data corresponding to time designated by an operating unit.
    Type: Application
    Filed: February 8, 2008
    Publication date: April 15, 2010
    Applicant: ANRITSU CORPORATION
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto