Patents by Inventor Yuichi Sakuraba
Yuichi Sakuraba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11308666Abstract: An event process data integration and analysis apparatus of the present disclosure includes an integrated display output interface. The integrated display output interface generates, based on unit operation data, a unit operation band for each device among a plurality of devices, the unit operation band representing an operation intention of an operator and being arranged in a time series. The integrated display output interface generates, based on process data, a process trend chart for each device, the process trend chart representing a change over time in a process value. The integrated display output interface generates an integrated display that displays the unit operation band and the process trend chart associated by time.Type: GrantFiled: June 17, 2020Date of Patent: April 19, 2022Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Ayako Akimoto, Yuichi Sakuraba
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Patent number: 11275357Abstract: An event analyzing device includes an event data collector configured to collect event data which represents an event including an alarm which has occurred in a plurality of devices in a plant and an operation performed to the devices, a process data collector configured to collect process data of the devices in the plant, a trend change detector configured to detect a trend change of the process data collected by the process data collector, an event data converter configured to convert the trend change detected by the trend change detector into a process change event represented in the same format as the event, and a cause-effect relationship analyzer configured to integrate the event data collected by the event data collector and process change event data which represents the trend change in the process change event converted by the event data converter to analyze a cause-effect relationship between the event and the process change event.Type: GrantFiled: January 30, 2018Date of Patent: March 15, 2022Assignee: Yokogawa Electric CorporationInventors: Zhuo Liu, Yuichi Sakuraba
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Publication number: 20200402276Abstract: An event process data integration and analysis apparatus of the present disclosure includes an integrated display output interface. The integrated display output interface generates, based on unit operation data, a unit operation band for each device among a plurality of devices, the unit operation band representing an operation intention of an operator and being arranged in a time series. The integrated display output interface generates, based on process data, a process trend chart for each device, the process trend chart representing a change over time in a process value. The integrated display output interface generates an integrated display that displays the unit operation band and the process trend chart associated by time.Type: ApplicationFiled: June 17, 2020Publication date: December 24, 2020Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Ayako Akimoto, Yuichi Sakuraba
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Publication number: 20200341757Abstract: Provided is an operation flow generation apparatus including a manual operation acquiring section that acquires a log of at least one manual operation performed on at least one apparatus, in relation to performance of an automated operation procedure including at least one automated operation of the at least one apparatus; a correspondence determining section that determines a correspondence between each of the at least one manual operation and each of the at least one automated operation; and an operation flow generating section that generates an operation flow including an automated operation step expressing at least one automated operation performed by the automated operation procedure and a manual operation step expressing the at least one manual operation, based on the correspondence.Type: ApplicationFiled: July 10, 2020Publication date: October 29, 2020Inventors: Ayako AKIMOTO, Yuichi SAKURABA
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Patent number: 10664374Abstract: An event analysis device having an event collector for collecting event log data representing an operation history by a DCS operator; an event analyzer for analyzing the event log data, and extracting basic unit operations or unit operations representing an operation method based on operations of the DCS operator or an operation intention based on operations of the DCS operator; an operation sequence extractor for extracting operation sequences which the basic unit operations or the unit operations are aligned in accordance with time order in every service time period; an operation clusterer for clustering the operation sequences based on similarity among the operation sequences extracted in every service time period; and an operation procedure generator for analyzing the operation sequences clustered in same type, and estimating a structure of the operation procedure based on the operation of the DCS operator.Type: GrantFiled: November 7, 2016Date of Patent: May 26, 2020Assignee: Yokogawa Electric CorporationInventors: Zhuo Liu, Yuichi Sakuraba
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Patent number: 10565512Abstract: An associated event group preparation unit calculates a degree of association between the events on the basis of an event matrix, and prepares an associated event group for each event. A cause-and-effect relationship model establishment unit establishes a probabilistic cause-and-effect relationship model by a Bayesian network on the basis of the event matrix, for each associated event group. An improvement candidate pattern receiving unit receives a setting of an improvement candidate pattern in which a condition of an event to be set as an improvement candidate is determined by attributes of the base point event and the associated event and a conditional probability between the base point event and the associated event. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model conforming to any one of the set improvement candidate patterns, from the established probabilistic cause-and-effect relationship models for each event.Type: GrantFiled: November 20, 2015Date of Patent: February 18, 2020Assignee: Yokogawa Electric CorporationInventors: Yuuji Miyata, Yuichi Sakuraba
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Patent number: 10515083Abstract: An event analysis device includes an event collector configured to collect event log data which represents operation history of a DCS operator; an event analyzer configured to analyze event log data collected by the event collector to extract analysis result data representing operation method based on the operation of the DCS operator or analysis result data representing operation intention based on the operation of the DCS operator; an operation sequence extractor configured to extract analysis result data respectively in every period in specified multiple periods and extract operation sequence sorting analysis result data based on operation time; and an operation sequence clusterer configured to cluster the operation sequence based on the degree of the similarity between the operation sequences which are different from each other.Type: GrantFiled: November 2, 2016Date of Patent: December 24, 2019Assignee: Yokogawa Electric CorporationInventors: Zhuo Liu, Yuichi Sakuraba
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Patent number: 10496051Abstract: An event analyzing device includes an event collector configured to collect log data of a manual operation event performed by an operator of a plant, an event analyzer configured to analyze a manual operation method or a manual operation intention of the manual operation event based on the log data, a manual operation sequence extractor configured to extract the manual operation method or the manual operation intention for each predetermined period as manual operation sequences in order of time, a manual operation sequence classifier configured to classify the manual operation sequences in which manual operations are in a similar order from among the manual operation sequences, a manual operation procedure constructor configured to construct a manual operation procedure of the operator based on the manual operation sequences, a process data collector configured to collect process data of the plant, and a manual operation condition estimator configured to estimate an execution condition under which manual operType: GrantFiled: February 1, 2018Date of Patent: December 3, 2019Assignee: Yokogawa Electric CorporationInventors: Zhuo Liu, Yuichi Sakuraba
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Event analysis apparatus, event analysis systems, event analysis methods, and event analysis program
Patent number: 10496655Abstract: An event analyzer includes: an event collector configured to collect event log data representing operation history which an DCS operator performed; a basic unit operation analyzer configured to analyze event log data, and extract basic unit operation data representing operation method based on the operation by the DCS operator; and an unit operation analyzer configured to analyze basic unit operation data, and extract unit operation data representing intention of the operation by the DCS operator.Type: GrantFiled: November 2, 2016Date of Patent: December 3, 2019Assignee: Yokogawa Electric CorporationInventors: Zhuo Liu, Yuichi Sakuraba -
Publication number: 20180224831Abstract: An event analyzing device includes an event data collector configured to collect event data which represents an event including an alarm which has occurred in a plurality of devices in a plant and an operation performed to the devices, a process data collector configured to collect process data of the devices in the plant, a trend change detector configured to detect a trend change of the process data collected by the process data collector, an event data converter configured to convert the trend change detected by the trend change detector into a process change event represented in the same format as the event, and a cause-effect relationship analyzer configured to integrate the event data collected by the event data collector and process change event data which represents the trend change in the process change event converted by the event data converter to analyze a cause-effect relationship between the event and the process change event.Type: ApplicationFiled: January 30, 2018Publication date: August 9, 2018Applicant: Yokogawa Electric CorporationInventors: Zhuo LIU, Yuichi SAKURABA
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Publication number: 20180224809Abstract: An event analyzing device includes an event collector configured to collect log data of a manual operation event performed by an operator of a plant, an event analyzer configured to analyze a manual operation method or a manual operation intention of the manual operation event based on the log data, a manual operation sequence extractor configured to extract the manual operation method or the manual operation intention for each predetermined period as manual operation sequences in order of time, a manual operation sequence classifier configured to classify the manual operation sequences in which manual operations are in a similar order from among the manual operation sequences, a manual operation procedure constructor configured to construct a manual operation procedure of the operator based on the manual operation sequences, a process data collector configured to collect process data of the plant, and a manual operation condition estimator configured to estimate an execution condition under which manual operType: ApplicationFiled: February 1, 2018Publication date: August 9, 2018Applicant: Yokogawa Electric CorporationInventors: Zhuo LIU, Yuichi SAKURABA
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Publication number: 20170132104Abstract: An event analysis device having an event collector for collecting event log data representing an operation history by a DCS operator; an event analyzer for analyzing the event log data, and extracting basic unit operations or unit operations representing an operation method based on operations of the DCS operator or an operation intention based on operations of the DCS operator; an operation sequence extractor for extracting operation sequences which the basic unit operations or the unit operations are aligned in accordance with time order in every service time period; an operation clusterer for clustering the operation sequences based on similarity among the operation sequences extracted in every service time period; and an operation procedure generator for analyzing the operation sequences clustered in same type, and estimating a structure of the operation procedure based on the operation of the DCS operator.Type: ApplicationFiled: November 7, 2016Publication date: May 11, 2017Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Zhuo LIU, Yuichi SAKURABA
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Publication number: 20170132291Abstract: An event analysis device includes an event collector configured to collect event log data which represents operation history of a DCS operator; an event analyzer configured to analyze event log data collected by the event collector to extract analysis result data representing operation method based on the operation of the DCS operator or analysis result data representing operation intention based on the operation of the DCS operator; an operation sequence extractor configured to extract analysis result data respectively in every period in specified multiple periods and extract operation sequence sorting analysis result data based on operation time; and an operation sequence clusterer configured to cluster the operation sequence based on the degree of the similarity between the operation sequences which are different from each other.Type: ApplicationFiled: November 2, 2016Publication date: May 11, 2017Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Zhuo LIU, Yuichi SAKURABA
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EVENT ANALYSIS APPARATUS, EVENT ANALYSIS SYSTEMS, EVENT ANALYSIS METHODS, AND EVENT ANALYSIS PROGRAM
Publication number: 20170132292Abstract: An event analyzer includes: an event collector configured to collect event log data representing operation history which an DCS operator performed; a basic unit operation analyzer configured to analyze event log data, and extract basic unit operation data representing operation method based on the operation by the DCS operator; and an unit operation analyzer configured to analyze basic unit operation data, and extract unit operation data representing intention of the operation by the DCS operator.Type: ApplicationFiled: November 2, 2016Publication date: May 11, 2017Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Zhuo LIU, Yuichi SAKURABA -
Patent number: 9626600Abstract: An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrence-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.Type: GrantFiled: April 21, 2014Date of Patent: April 18, 2017Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Zhuo Liu, Yuichi Sakuraba
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Publication number: 20160148111Abstract: An associated event group preparation unit calculates a degree of association between the events on the basis of an event matrix, and prepares an associated event group for each event. A cause-and-effect relationship model establishment unit establishes a probabilistic cause-and-effect relationship model by a Bayesian network on the basis of the event matrix, for each associated event group. An improvement candidate pattern receiving unit receives a setting of an improvement candidate pattern in which a condition of an event to be set as an improvement candidate is determined by attributes of the base point event and the associated event and a conditional probability between the base point event and the associated event. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model conforming to any one of the set improvement candidate patterns, from the established probabilistic cause-and-effect relationship models for each event.Type: ApplicationFiled: November 20, 2015Publication date: May 26, 2016Applicant: Yokogawa Electric CorporationInventors: Yuuji MIYATA, Yuichi SAKURABA
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Patent number: 9235810Abstract: An event analysis apparatus configured to analyze events including alarms generated in a plurality of devices and operations targeting the devices is provided.Type: GrantFiled: December 16, 2013Date of Patent: January 12, 2016Assignee: YOKOGAWA ELECTRIC CORPORATIONInventor: Yuichi Sakuraba
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Publication number: 20140317040Abstract: An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrence-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.Type: ApplicationFiled: April 21, 2014Publication date: October 23, 2014Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Zhuo Liu, Yuichi Sakuraba
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Publication number: 20140188779Abstract: An event analysis apparatus configured to analyze events including alarms generated in a plurality of devices and operations targeting the devices is provided.Type: ApplicationFiled: December 16, 2013Publication date: July 3, 2014Applicant: YOKOGAWA ELECTRIC CORPORATIONInventor: Yuichi Sakuraba
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Patent number: 7712065Abstract: An automatic layout method for performing an automatic layout of components on a diagram, the automatic layout method includes: generating a layout engine control object based on an operation of an application program; selecting at least one layout engine object from a plurality of layout engine objects for calculating coordinates of the components by different algorithms, at least one layout engine object being selected based on an instruction of the application program by the layout engine control object; and creating the diagram by the application program based on the coordinates calculated by the selected layout engine object.Type: GrantFiled: October 13, 2006Date of Patent: May 4, 2010Assignee: Yokogawa Electric CorporationInventor: Yuichi Sakuraba