Patents by Inventor Yuichi Sakuraba

Yuichi Sakuraba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11308666
    Abstract: An event process data integration and analysis apparatus of the present disclosure includes an integrated display output interface. The integrated display output interface generates, based on unit operation data, a unit operation band for each device among a plurality of devices, the unit operation band representing an operation intention of an operator and being arranged in a time series. The integrated display output interface generates, based on process data, a process trend chart for each device, the process trend chart representing a change over time in a process value. The integrated display output interface generates an integrated display that displays the unit operation band and the process trend chart associated by time.
    Type: Grant
    Filed: June 17, 2020
    Date of Patent: April 19, 2022
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Ayako Akimoto, Yuichi Sakuraba
  • Patent number: 11275357
    Abstract: An event analyzing device includes an event data collector configured to collect event data which represents an event including an alarm which has occurred in a plurality of devices in a plant and an operation performed to the devices, a process data collector configured to collect process data of the devices in the plant, a trend change detector configured to detect a trend change of the process data collected by the process data collector, an event data converter configured to convert the trend change detected by the trend change detector into a process change event represented in the same format as the event, and a cause-effect relationship analyzer configured to integrate the event data collected by the event data collector and process change event data which represents the trend change in the process change event converted by the event data converter to analyze a cause-effect relationship between the event and the process change event.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: March 15, 2022
    Assignee: Yokogawa Electric Corporation
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Publication number: 20200402276
    Abstract: An event process data integration and analysis apparatus of the present disclosure includes an integrated display output interface. The integrated display output interface generates, based on unit operation data, a unit operation band for each device among a plurality of devices, the unit operation band representing an operation intention of an operator and being arranged in a time series. The integrated display output interface generates, based on process data, a process trend chart for each device, the process trend chart representing a change over time in a process value. The integrated display output interface generates an integrated display that displays the unit operation band and the process trend chart associated by time.
    Type: Application
    Filed: June 17, 2020
    Publication date: December 24, 2020
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Ayako Akimoto, Yuichi Sakuraba
  • Publication number: 20200341757
    Abstract: Provided is an operation flow generation apparatus including a manual operation acquiring section that acquires a log of at least one manual operation performed on at least one apparatus, in relation to performance of an automated operation procedure including at least one automated operation of the at least one apparatus; a correspondence determining section that determines a correspondence between each of the at least one manual operation and each of the at least one automated operation; and an operation flow generating section that generates an operation flow including an automated operation step expressing at least one automated operation performed by the automated operation procedure and a manual operation step expressing the at least one manual operation, based on the correspondence.
    Type: Application
    Filed: July 10, 2020
    Publication date: October 29, 2020
    Inventors: Ayako AKIMOTO, Yuichi SAKURABA
  • Patent number: 10664374
    Abstract: An event analysis device having an event collector for collecting event log data representing an operation history by a DCS operator; an event analyzer for analyzing the event log data, and extracting basic unit operations or unit operations representing an operation method based on operations of the DCS operator or an operation intention based on operations of the DCS operator; an operation sequence extractor for extracting operation sequences which the basic unit operations or the unit operations are aligned in accordance with time order in every service time period; an operation clusterer for clustering the operation sequences based on similarity among the operation sequences extracted in every service time period; and an operation procedure generator for analyzing the operation sequences clustered in same type, and estimating a structure of the operation procedure based on the operation of the DCS operator.
    Type: Grant
    Filed: November 7, 2016
    Date of Patent: May 26, 2020
    Assignee: Yokogawa Electric Corporation
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Patent number: 10565512
    Abstract: An associated event group preparation unit calculates a degree of association between the events on the basis of an event matrix, and prepares an associated event group for each event. A cause-and-effect relationship model establishment unit establishes a probabilistic cause-and-effect relationship model by a Bayesian network on the basis of the event matrix, for each associated event group. An improvement candidate pattern receiving unit receives a setting of an improvement candidate pattern in which a condition of an event to be set as an improvement candidate is determined by attributes of the base point event and the associated event and a conditional probability between the base point event and the associated event. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model conforming to any one of the set improvement candidate patterns, from the established probabilistic cause-and-effect relationship models for each event.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: February 18, 2020
    Assignee: Yokogawa Electric Corporation
    Inventors: Yuuji Miyata, Yuichi Sakuraba
  • Patent number: 10515083
    Abstract: An event analysis device includes an event collector configured to collect event log data which represents operation history of a DCS operator; an event analyzer configured to analyze event log data collected by the event collector to extract analysis result data representing operation method based on the operation of the DCS operator or analysis result data representing operation intention based on the operation of the DCS operator; an operation sequence extractor configured to extract analysis result data respectively in every period in specified multiple periods and extract operation sequence sorting analysis result data based on operation time; and an operation sequence clusterer configured to cluster the operation sequence based on the degree of the similarity between the operation sequences which are different from each other.
    Type: Grant
    Filed: November 2, 2016
    Date of Patent: December 24, 2019
    Assignee: Yokogawa Electric Corporation
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Patent number: 10496051
    Abstract: An event analyzing device includes an event collector configured to collect log data of a manual operation event performed by an operator of a plant, an event analyzer configured to analyze a manual operation method or a manual operation intention of the manual operation event based on the log data, a manual operation sequence extractor configured to extract the manual operation method or the manual operation intention for each predetermined period as manual operation sequences in order of time, a manual operation sequence classifier configured to classify the manual operation sequences in which manual operations are in a similar order from among the manual operation sequences, a manual operation procedure constructor configured to construct a manual operation procedure of the operator based on the manual operation sequences, a process data collector configured to collect process data of the plant, and a manual operation condition estimator configured to estimate an execution condition under which manual oper
    Type: Grant
    Filed: February 1, 2018
    Date of Patent: December 3, 2019
    Assignee: Yokogawa Electric Corporation
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Patent number: 10496655
    Abstract: An event analyzer includes: an event collector configured to collect event log data representing operation history which an DCS operator performed; a basic unit operation analyzer configured to analyze event log data, and extract basic unit operation data representing operation method based on the operation by the DCS operator; and an unit operation analyzer configured to analyze basic unit operation data, and extract unit operation data representing intention of the operation by the DCS operator.
    Type: Grant
    Filed: November 2, 2016
    Date of Patent: December 3, 2019
    Assignee: Yokogawa Electric Corporation
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Publication number: 20180224831
    Abstract: An event analyzing device includes an event data collector configured to collect event data which represents an event including an alarm which has occurred in a plurality of devices in a plant and an operation performed to the devices, a process data collector configured to collect process data of the devices in the plant, a trend change detector configured to detect a trend change of the process data collected by the process data collector, an event data converter configured to convert the trend change detected by the trend change detector into a process change event represented in the same format as the event, and a cause-effect relationship analyzer configured to integrate the event data collected by the event data collector and process change event data which represents the trend change in the process change event converted by the event data converter to analyze a cause-effect relationship between the event and the process change event.
    Type: Application
    Filed: January 30, 2018
    Publication date: August 9, 2018
    Applicant: Yokogawa Electric Corporation
    Inventors: Zhuo LIU, Yuichi SAKURABA
  • Publication number: 20180224809
    Abstract: An event analyzing device includes an event collector configured to collect log data of a manual operation event performed by an operator of a plant, an event analyzer configured to analyze a manual operation method or a manual operation intention of the manual operation event based on the log data, a manual operation sequence extractor configured to extract the manual operation method or the manual operation intention for each predetermined period as manual operation sequences in order of time, a manual operation sequence classifier configured to classify the manual operation sequences in which manual operations are in a similar order from among the manual operation sequences, a manual operation procedure constructor configured to construct a manual operation procedure of the operator based on the manual operation sequences, a process data collector configured to collect process data of the plant, and a manual operation condition estimator configured to estimate an execution condition under which manual oper
    Type: Application
    Filed: February 1, 2018
    Publication date: August 9, 2018
    Applicant: Yokogawa Electric Corporation
    Inventors: Zhuo LIU, Yuichi SAKURABA
  • Publication number: 20170132104
    Abstract: An event analysis device having an event collector for collecting event log data representing an operation history by a DCS operator; an event analyzer for analyzing the event log data, and extracting basic unit operations or unit operations representing an operation method based on operations of the DCS operator or an operation intention based on operations of the DCS operator; an operation sequence extractor for extracting operation sequences which the basic unit operations or the unit operations are aligned in accordance with time order in every service time period; an operation clusterer for clustering the operation sequences based on similarity among the operation sequences extracted in every service time period; and an operation procedure generator for analyzing the operation sequences clustered in same type, and estimating a structure of the operation procedure based on the operation of the DCS operator.
    Type: Application
    Filed: November 7, 2016
    Publication date: May 11, 2017
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Zhuo LIU, Yuichi SAKURABA
  • Publication number: 20170132291
    Abstract: An event analysis device includes an event collector configured to collect event log data which represents operation history of a DCS operator; an event analyzer configured to analyze event log data collected by the event collector to extract analysis result data representing operation method based on the operation of the DCS operator or analysis result data representing operation intention based on the operation of the DCS operator; an operation sequence extractor configured to extract analysis result data respectively in every period in specified multiple periods and extract operation sequence sorting analysis result data based on operation time; and an operation sequence clusterer configured to cluster the operation sequence based on the degree of the similarity between the operation sequences which are different from each other.
    Type: Application
    Filed: November 2, 2016
    Publication date: May 11, 2017
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Zhuo LIU, Yuichi SAKURABA
  • Publication number: 20170132292
    Abstract: An event analyzer includes: an event collector configured to collect event log data representing operation history which an DCS operator performed; a basic unit operation analyzer configured to analyze event log data, and extract basic unit operation data representing operation method based on the operation by the DCS operator; and an unit operation analyzer configured to analyze basic unit operation data, and extract unit operation data representing intention of the operation by the DCS operator.
    Type: Application
    Filed: November 2, 2016
    Publication date: May 11, 2017
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Zhuo LIU, Yuichi SAKURABA
  • Patent number: 9626600
    Abstract: An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrence-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: April 18, 2017
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Publication number: 20160148111
    Abstract: An associated event group preparation unit calculates a degree of association between the events on the basis of an event matrix, and prepares an associated event group for each event. A cause-and-effect relationship model establishment unit establishes a probabilistic cause-and-effect relationship model by a Bayesian network on the basis of the event matrix, for each associated event group. An improvement candidate pattern receiving unit receives a setting of an improvement candidate pattern in which a condition of an event to be set as an improvement candidate is determined by attributes of the base point event and the associated event and a conditional probability between the base point event and the associated event. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model conforming to any one of the set improvement candidate patterns, from the established probabilistic cause-and-effect relationship models for each event.
    Type: Application
    Filed: November 20, 2015
    Publication date: May 26, 2016
    Applicant: Yokogawa Electric Corporation
    Inventors: Yuuji MIYATA, Yuichi SAKURABA
  • Patent number: 9235810
    Abstract: An event analysis apparatus configured to analyze events including alarms generated in a plurality of devices and operations targeting the devices is provided.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: January 12, 2016
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventor: Yuichi Sakuraba
  • Publication number: 20140317040
    Abstract: An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrence-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.
    Type: Application
    Filed: April 21, 2014
    Publication date: October 23, 2014
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Zhuo Liu, Yuichi Sakuraba
  • Publication number: 20140188779
    Abstract: An event analysis apparatus configured to analyze events including alarms generated in a plurality of devices and operations targeting the devices is provided.
    Type: Application
    Filed: December 16, 2013
    Publication date: July 3, 2014
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventor: Yuichi Sakuraba
  • Patent number: 7712065
    Abstract: An automatic layout method for performing an automatic layout of components on a diagram, the automatic layout method includes: generating a layout engine control object based on an operation of an application program; selecting at least one layout engine object from a plurality of layout engine objects for calculating coordinates of the components by different algorithms, at least one layout engine object being selected based on an instruction of the application program by the layout engine control object; and creating the diagram by the application program based on the coordinates calculated by the selected layout engine object.
    Type: Grant
    Filed: October 13, 2006
    Date of Patent: May 4, 2010
    Assignee: Yokogawa Electric Corporation
    Inventor: Yuichi Sakuraba