Abstract: A machine tool includes a lower tool post for holding a cutting tool, a tool main spindle for holding a cutting tool, a storage unit capable of storing the cutting tool, an exchange mechanism for exchanging the cutting tools between the tool main spindle and the storage unit, an inside robot for exchanging the cutting tools between the lower tool post and the tool main spindle, and a controller. The controller performs control such that the cutting tools are exchanged between the lower tool post and the storage unit via the inside robot, the tool main spindle, and the exchange mechanism.

Abstract: A machine tool includes a lower tool post for holding a cutting tool, a tool main spindle for holding a cutting tool, a storage unit capable of storing the cutting tool, an exchange mechanism for exchanging the cutting tools between the tool main spindle and the storage unit, an inside robot for exchanging the cutting tools between the lower tool post and the tool main spindle, and a controller. The controller performs control such that the cutting tools are exchanged between the lower tool post and the storage unit via the inside robot, the tool main spindle, and the exchange mechanism.

Abstract: A machine tool stores numerous end effectors without a need to newly provide an end effector storage internally or externally to the machine tool. A temporary base for the end effector is disposed inside the machine tool. The end effector is passed from an internally-mounted robot to a tool post via the temporary base. A tool of the machine tool can be exchanged by attaching the end effector to the tool post.

Abstract: In a method of measuring an exchange force between a specimen and a probe, the specimen and probe are faced to each other with a distance within a close proximity or RKKY-type exchange interaction region from a distance at which conduction electron clouds begin to be overlapped with each other to a distance at which localized electron clouds are not substantially overlapped with each other, a relative displacement of the specimen and probe is detected to measure a first force under such a condition that directions of magnetic moments of said specimen surface and probe are in parallel with each other to derive a first force and under such a condition that directions of magnetic moments of said specimen surface and probe are in anti-parallel with each other to derive a second force. An exchange force is derived as a difference between said first and second forces. Magnetic property of the specimen can be evaluated on the basis of the thus measured exchange force.

Abstract: In an apparatus for measuring an exchange force between a specimen and a probe, the specimen and probe are faced to each other with a distance within a close proximity or RKKY-type exchange interaction region from a distance at which conduction electron clouds begin to be overlapped with each other to a distance at which localized electron clouds are not substantially overlapped with each other. In order to prevent the probe from being attracted to the specimen by a force between the specimen and the force, a piezoelectric element is provided on a cantilever and a control signal supplied to the piezoelectric element is produced in accordance with a displacement of the cantilever to control a spring constant of the cantilever. The exchange force between the specimen and the probe is calculated from the control signal supplied to the piezoelectric element.