Abstract: A first virtual axis orthogonally intersects with a second virtual axis, and a third axis (axis passing a support center point) vertical to the first and second virtual axes is permitted to be a reference axis. A magnetic drive mechanism is provided with first magnetic drive sections for applying a drive power to a movable axis, which is supporting an object to be controlled, in a rotating direction of the first virtual axis or in a rotating direction parallel to the first virtual axis, and second magnetic drive sections for applying a drive power to the movable axis, in a rotating direction of the second virtual axis or in a rotating direction parallel to the second virtual axis.

Abstract: A hologram information reproducing device is described which can reproduce information from a recording medium on which hologram information is recorded, and which can be downsized. In one aspect, when light from a light source is emitted, the light is converted into parallel reference light, by a lens of an optical system. A mirror changes the orientation of the reference light so that it is oriented obliquely downward towards a recording medium. More specifically, as viewed from the top, the mirror changes a path of the light from the light source unit by approximately 90 degrees. In addition, as viewed from the side, the mirror changes the path of the light from the light source unit downward by approximately 45 degrees. Since an interference pattern recorded on the recording medium is a Bragg grating, when the reference light illuminates a recording area of the recording medium, a reproduction light is obtained by Bragg diffraction.

Abstract: A first virtual axis orthogonally intersects with a second virtual axis, and a third axis (axis passing a support center point) vertical to the first and second virtual axes is permitted to be a reference axis. A magnetic drive mechanism is provided with first magnetic drive sections for applying a drive power to a movable axis, which is supporting an object to be controlled, in a rotating direction of the first virtual axis or in a rotating direction parallel to the first virtual axis, and second magnetic drive sections for applying a drive power to the movable axis, in a rotating direction of the second virtual axis or in a rotating direction parallel to the second virtual axis.

Abstract: A hologram information reproducing device is described which can reproduce information from a recording medium on which hologram information is recorded, and which can be downsized. In one aspect, when light from a light source is emitted, the light is converted into parallel reference light, by a lens of an optical system. A mirror changes the orientation of the reference light so that it is oriented obliquely downward towards a recording medium. More specifically, as viewed from the top, the mirror changes a path of the light from the light source unit by approximately 90 degrees. In addition, as viewed from the side, the mirror changes the path of the light from the light source unit downward by approximately 45 degrees. Since an interference pattern recorded on the recording medium is a Bragg grating, when the reference light illuminates a recording area of the recording medium, a reproduction light is obtained by Bragg diffraction.

Abstract: A holographic reproducing apparatus capable of regulating aberration to a low level and suitable for reducing the size of the entire optical system is provided. When a forward meniscus lens is used for a converting lens 12 that collimates a reference beam L2, the converting lens 12 can be disposed between a light source 11 and the principal point Q of the converting lens 12 since the principal point Q of the lens is located at a position adjacent to a light-emitting surface 12a. With this, the distance between the light source 11 and a reflecting mirror 13 can be reduced, and thereby a reduction in the size of the optical system of a holographic reproducing apparatus 10 can be achieved.

Abstract: A capacitance detecting circuit detects, in terms of voltage, change in capacitance at intersections of a plurality of column lines and a plurality of row lines crossing each other. The capacitance detecting circuit includes a column-line driving unit for driving a column line; a row-line selector for selecting a specific row line from the plurality of row lines; and a capacitance calculator for calculating a capacitance at an intersection of the specific row line and the driven column line based on a reference current that flows in relation to a reference capacitance and a current that flows in relation to the capacitance at the intersection.

Abstract: A capacitance detecting circuit includes a code generator for generating code having orthogonality in chronological order. A column-line driver drives the plurality of column lines based on the code by dividing the column lines into a first column line group and a second column line group. A capacitance detector, which is connected to the row line, converts the total of currents generated in capacitances at the intersections with the driven column lines into a voltage signal and outputs the converted voltage signal. A decoding computation unit determines the voltages corresponding to the capacitances at the intersections for each of the column line groups by performing product sum computation between the measured voltages and the code. The column-line driver drives the first column line group and the second column line group by complementary voltages according to the code or information indicating the inversion of the code.

Abstract: In a capacitance detecting circuit, changes in capacitances at intersections between a plurality of column lines and a row line are detected as voltages. The capacitance detecting circuit includes a code generator for generating code having orthogonality in chronological order. A column-line driver drives the plurality of column lines based on the code by dividing the column lines into a first column line group and a second column line group. A capacitance detector, which is connected to the row line, converts the total of currents generated in capacitances at the intersections with the driven column lines into a voltage signal and outputs the converted voltage signal. A decoding computation unit determines the voltages corresponding to the capacitances at the intersections for each of the column line groups by performing product sum computation between the measured voltages and the code.

Abstract: In a capacitance detecting circuit, changes in capacitances at intersections between a plurality of row lines and a column line are detected as voltages. The capacitance detecting circuit includes a column-line driver for driving the column line. A code generator generates code having orthogonality in chronological order. A selection synthesizer selects a certain number of row lines from the plurality of row lines by using the code and synthesizes measured voltages at the intersections between the selected row lines and the driven column line so as to output the synthesized measured voltage. A decoding computation unit separates the measured voltages corresponding to the capacitances at the intersections by performing product sum computation between the synthesized measured voltage and the code.

Abstract: A capacitance detecting circuit of a capacitive sensor having a plurality of column lines and a row line intersecting the column lines detects a change in capacitance at an intersection of a column line and a row line. The circuit includes a PN code generating unit for generating a code having orthogonality in time sequence to output the generated code as a column drive signal, a column line drive unit for driving a predetermined one of the column lines which are selected in response to the code, a capacitance detecting unit, connected to the row line, for detecting a voltage by converting a total sum of changes in capacitance at intersections of the selected column lines into the voltage to output the detected voltage, and a decode processing unit for performing a predetermined calculation on the detected voltage output from the capacitance detecting unit and the code to determine a voltage value responsive to the capacitance change at the intersection.

Abstract: A capacitance detection circuit in which detection wirings are arranged in such a manner as to intersect a plurality of driving wirings, and detection electrodes forming capacitances between the driving wirings and the detection wiring that intersect each other are formed within a sensor plane includes a column wiring driving device for driving the driving wirings; a detection wiring selection device for selecting predetermined detection wiring from among a plurality of detection wirings; a reference electrode arranged in the vicinity of the detection electrode, the reference electrode detecting the electrical potential of the piece to be detected as a reference potential; and a capacitance computation section for determining a voltage value corresponding to the capacitance change on the basis of the reference potential and the detection potential determined from the electrical current corresponding to the capacitance of the detection electrode.

Abstract: The fingerprint sensor of the present invention is a two-dimensional area type fingerprint sensor where a plurality of rows and a plurality of columns cross each other, which includes a signal detecting means for outputting a detection signal in a two-dimensional detection surface; an X axis balance calculating means having an output difference of the X axis direction as numerator and having a sum of the total outputs of the X axis direction as denominator to obtain a balance output of the X axis direction with a center of the detection surface being a reference and the X axis direction being in line-symmetrical with the Y axis passing through the center; a Y axis balance calculating means having an output difference of the Y axis direction in line-symmetrical with the X axis passing through the center as numerator and having a sum of the total outputs of the Y axis direction as denominator to obtain a balance output of the Y axis direction; and a pointer movement control means for controlling speed and movem

Abstract: In a capacitance detecting circuit, changes in capacitances at intersections between a plurality of row lines and a column line are detected as voltages. The capacitance detecting circuit includes a column-line driver for driving the column line. A code generator generates code having orthogonality in chronological order. A selection synthesizer selects a certain number of row lines from the plurality of row lines by using the code and synthesizes measured voltages at the intersections between the selected row lines and the driven column line so as to output the synthesized measured voltage. A decoding computation unit separates the measured voltages corresponding to the capacitances at the intersections by performing product sum computation between the synthesized measured voltage and the code.

Abstract: A capacitance detecting circuit detects, in terms of voltage, change in capacitance at intersections of a plurality of column lines and a plurality of row lines crossing each other. The capacitance detecting circuit includes a column-line driving unit for driving a column line; a row-line selector for selecting a specific row line from the plurality of row lines; and a capacitance calculator for calculating a capacitance at an intersection of the specific row line and the driven column line based on a reference current that flows in relation to a reference capacitance and a current that flows in relation to the capacitance at the intersection.

Abstract: A capacitance detecting circuit of a capacitive sensor having a plurality of column lines and a row line intersecting the column lines detects a change in capacitance at an intersection of a column line and a row line. The circuit includes a PN code generating unit for generating a code having orthogonality in time sequence to output the generated code as a column drive signal, a column line drive unit for driving a predetermined one of the column lines which are selected in response to the code, a capacitance detecting unit, connected to the row line, for detecting a voltage by converting a total sum of changes in capacitance at intersections of the selected column lines into the voltage to output the detected voltage, and a decode processing unit for performing a predetermined calculation on the detected voltage output from the capacitance detecting unit and the code to determine a voltage value responsive to the capacitance change at the intersection.

Abstract: A capacitance detector, used in an area sensor having a matrix of detection lines, detects minute capacitances near intersections of a plurality of column lines and a plurality of row lines. The capacitance detector includes a column-line driver for outputting to the column lines a signal that rises in response to a first voltage and then falls in response to a second voltage; a row-voltage outputter for outputting a third voltage corresponding to a current for charging the capacitance at each of the intersections when the column lines are driven by the first voltage and for outputting a fourth voltage corresponding to a current for discharging the capacitance at each of the intersections when the column lines are driven by the second voltage; and a calculator for calculating the difference between the third voltage and the fourth voltage. The difference is calculated at each of the intersections.

Abstract: A pressure-sensitive capacitive sensor includes a sensing unit in which a plurality of column wires and a plurality of row wires are formed in a matrix, a detecting signal generator, and filters. Capacitances at intersections between the column wires and the row wires change in accordance with externally applied pressure. The detecting signal generator sequentially outputs pulse signals of a predetermined frequency to the column wires of the sensing unit. The filters are connected to the respective row wires of the sensing unit and extract amplitudes of signals of the predetermined frequency. The amplitude is proportional to the capacitance at the intersection.

Abstract: A multilayer film optical filter includes a multilayer film including a plurality of dielectric material thin films repeatedly laminated on a substrate and having different refractive indexes. The multilayer film optical filter further includes a relaxation layer composed of a single material, having a thickness in the range of 1 to 10 &mgr;m, and provided below the multilayer film near the substrate, for relaxing the influence of an error in thickness measurement due to a temperature rise of the substrate in an initial stage of deposition.

Abstract: An apparatus for depositing an optical thin film at a high accuracy has a vacuum chamber in which a thin film is formed on a substrate by vapor deposition of a material at a target using ion beams from an ion gun, an optical monitor for optically measuring the thickness of the thin film and outputting transmittance data DT, a crystal monitor for measuring a frequency which changes as the deposition proceeds and for outputting frequency data DF, and a determination circuit 12. The determination circuit select between the optical monitor and the crystal monitor to control the thickness of the thin film to be formed on the substrate.

Abstract: A film deposition apparatus includes an optical monitor for measuring the light intensities of a plurality of measuring light beams having different wavelengths that are transmitted or reflected by a film during deposition, a phase estimating section for calculating the phase of a point corresponding to a desired film thickness for each of the measuring wavelengths based on the relationship between the expected periodic change in the light intensity of the corresponding measuring light beam until the desired thickness is reached, and the phase corresponding to the periodic change, and calculating the degree of phase advance by comparing the periodic change and the change in the intensity monitored by the optical monitor, and a deposition control unit for comprehensively determining a deposition end point based on all the degrees of phase advance and for completing the film deposition at the deposition end point.